Method for manufacturing SOI LOCOS MOSFET with metal oxide film or impurity-implanted field oxide
View Patent ↗This invention provides a semiconductor device with an element isolation implemented by a method of manufacturing a semiconductor device comprising the steps of: forming a pad oxide film 140 and a nitride film 150 sequentially on a silicon layer 130 in an element region S; forming a metal oxide film 180 for generating a fixed electric charge on the nitride film 150 and on the silicon layer 130 in an element isolation region A; forming a field oxide film 160 in the element isolation region A by implementing an oxidation treatment; and removing the metal oxide film 180 on the nitride film 150, the nitride film 150 and the pad oxide film 140. In the semiconductor device, the threshold voltage of a parasitic transistor is made high and prevented from turning on, and the influence of leak current is reduced and the hump characteristic of element is restrained.
1. A method of manufacturing a semiconductor device using a LOCOS method for element isolation comprising the steps of:
forming a pad oxide film and a nitride film sequentially on a silicon layer in an element region;
forming a metal oxide film for generating a fixed electric charge on the nitride film and on the silicon layer at least in an edge region of an element isolation region;
forming a field oxide film in the element isolation region by implementing an oxidation treatment; and
removing the metal oxide film on the nitride film, the nitride film and the pad oxide film;
whereby a threshold voltage of a parasitic transistor formed between the silicon layer and the field oxide film is raised and an influence of leakage current is reduced.
2. The method of manufacturing a semiconductor device according to claim 1 wherein the silicon layer is a silicon layer of an SOI structure formed on an insulating oxide layer.
3. The method of manufacturing a semiconductor device according to claim 1 , wherein the step of forming a field oxide film in the element isolation region by implementing an oxidation treatment comprises:
forming an inclined edge of the silicon layer; and
covering the inclined edge with a metal oxide film.
4. The method of manufacturing a semiconductor device according to claim 1 wherein the element is an N-channel MOSFET and the fixed electric charge is a negative fixed electric charge.
5. The method of manufacturing a semiconductor device according to claim 4 wherein the metal oxide film is aluminum oxide.
6. A method of manufacturing a semiconductor device using a LOCOS method for element isolation comprising the steps of:
forming a pad oxide film and a nitride film sequentially on a silicon layer in an element region;
forming a field oxide film in an element isolation region by implementing an oxidation treatment;
implanting an impurity into the field oxide film at least in an edge region of the element isolation region to generate a fixed electric charge on the field oxide film; and
removing the nitride film and the pad oxide fi 1 m;
whereby a threshold voltage of a parasitic transistor formed between the silicon layer and the field oxide film is raised and an influence of leakage current is reduced.
7. The method of manufacturing a semiconductor device according to claim 6 wherein the silicon layer is a silicon layer of an SOI structure formed on an insulating oxide layer.
8. The method of manufacturing a semiconductor device according to claim 6 wherein the impurity is implanted by a diagonal ion implantation.
9. The method of manufacturing a semiconductor device according to claim 8 , wherein
the step of forming a field oxide film in the element isolation region by implementing an oxidation treatment comprises forming an inclined edge of the silicon layer; and
the step of implanting an impurity into the field oxide film comprises directing the diagonal ion implantation generally perpendicular to the inclined edge.
10. The method of manufacturing a semiconductor device according to claim 6 wherein the element is an N-channel MOSFET and the fixed electric charge is a negative fixed electric charge.
11. The method of manufacturing a semiconductor device according to claim 10 wherein the impurity is a fluorine ion.