Spectroscope and confocal scanning microscope comprising thereof
The invention provides a spectroscope that provides variable masks 24 a and 24 b that limits the light path of separated light beams in the spectrum direction and composite masks 24 c and 24 d that limit the same in the perpendicular direction. In addition, the invention provides a confocal scanning microscope that equipped with this spectroscope.
1. A spectroscope that resolves a light beam into separated light beams having various wavelengths, and selects and extracts a separated light beam having an arbitrary wavelength from among these separated light beams, comprising:
a first mask disposed such that a transmission area of each of the separated light beams in a spectrum direction is limited; and
a second mask disposed such that the transmission area of each of the separated light beams in a direction perpendicular to said spectrum direction is limited, where said spectrum direction denotes a direction of the arrangement of these separated light beams when viewed against the line of the resolved separated light beams, wherein:
said first mask includes a pair of first mask members which are independently movable closer to or further away from each other so as to adjust a first length of said transmission area in said spectrum direction and a first position of said transmission area in said spectrum direction; and
said second mask includes a pair of second mask members which are independently movable closer to or further away from each other so as to adjust a second length of said transmission area in said direction perpendicular to said spectrum direction and a second position of said transmission area in said direction perpendicular to said spectrum direction.
2. The spectroscope according to claim 1 , comprising a square small aperture that focuses said light beam before resolution, wherein a direction of one of diagonals of said small aperture is parallel to said spectrum direction.
3. The spectroscope according to claim 1 , comprising an adjustment device that adjusts the relative positions of the pairs of mask members in each of said first and second masks to establish the first and second lengths of said transmission area and the absolute position of said transmission area with respect to the separated light beams that propagate towards these first and second masks to thereby select and extract a separated light beam having an arbitrary wavelength from among these separated light beams.
4. The spectroscope according to claim 1 , comprising a reflection preventing means provided on a shielding surface on one or both of said first and second masks on which said separated light beams are impinged.
5. The spectroscope according to claim 1 , wherein a shielding surface on one or both of said first and second masks that are impinged by said separated light beams is slanted so as to avoid facing an optical device adjacent to said shielding surface.
6. The spectroscope according to claim 1 , wherein:
lenses disposed in opposition are adjacent to said first and second masks; and
surfaces of said lenses that are adjacent to said masks have a convex shape that is convex towards these masks.
7. A confocal scanning microscope that resolves a light beam from an observation object into separated light beams of various wavelengths, selects a separated light beam having an arbitrary wavelength from among these separated light beams, and receives the selected separated light beam at a photodetector, comprising:
the spectroscope according to any one of claim 1 through claim 6 being provided between the light paths from said observation object towards said photodetector.