IP Library Granted Patent US 6,979,847
Granted Patent B2
US 6,979,847 · App. 10/766,483 · Granted Dec 27, 2005

Ferroelectric element and method for manufacturing the same

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Quick Facts
Patent No.
US 6,979,847
App. No.
10/766,483
Granted
Dec 27, 2005
Kind
B2
Abstract

In a ferroelectric element, the ferroelectric film is prevented from deteriorating and the interconnect film from lowering in reliability. A ferroelectric element comprises a first electrode, a ferroelectric film formed on the first electrode, a second electrode formed on the ferroelectric film, a first hydrogen blocking film formed directly on a surface of the second electrode, a first insulation film formed on the first hydrogen blocking film, a first opening formed in the first hydrogen blocking film exposing a part of the second electrode, a second opening formed in the first insulation film and having a greater diameter than the diameter of the first opening, and an interconnect film connected to the second electrode through the first and second openings.

Claims (17)

1. A ferroelectric element comprising:

a first electrode;

a ferroelectric film formed on the first electrode;

a second electrode formed on the ferroelectric film;

a first hydrogen blocking film formed directly on a surface of the second electrode;

a first insulation film formed on the first hydrogen blocking film;

a first opening formed in the first hydrogen blocking film and exposing a part of the second electrode;

a second opening formed having a greater diameter than a diameter of the first opening, in the first insulation film; and

an interconnect film connected to the second electrode through the first and second openings.

2. A ferroelectric element according to claim 1 , wherein the first and second openings each have a diameter substantially constant with respect to the axial direction thereof.

3. A ferroelectric element according to claim 2 , wherein the first and second openings are formed by different processes from each other.

4. A ferroelectric element according to claim 3 , wherein the first opening is formed in the hydrogen blocking film prior to forming the first insulation film.

5. A ferroelectric element according to claim 2 , wherein the first opening has an aspect ratio of 1 or smaller.

6. A ferroelectric element according to claim 1 , wherein the first and second openings are formed to have a diameter increasing with distance from the second electrode.

7. A ferroelectric element according to claim 6 , wherein the first and second openings are formed in one process.

8. A ferroelectric element according to claim 6 , wherein the first insulation film has a second hydrogen blocking film formed at the second opening and a second insulation film formed around the second hydrogen blocking film.

9. A ferroelectric element according to claim 8 , wherein the first and second openings are formed in a self-aligned fashion by etching back.

Assignments (2)
CHANGE OF NAME Recorded Dec 24, 2008
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 022052/0797 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 29, 2004
From: MITSUHASHI, TOSHIHIRO
To: OKI ELECTRIC INDUSTRY CO., LTD.
Reel/Frame 014945/0126 →