IP Library Granted Patent US 7,106,635
Granted Patent B1
US 7,106,635 · App. 10/769,130 · Granted Sep 12, 2006

Bitline booster circuit and method

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Quick Facts
Patent No.
US 7,106,635
App. No.
10/769,130
Granted
Sep 12, 2006
Kind
B1
Abstract

A circuit and method for boosting bitline performance uses a bitline booster circuit to allow long bitlines, with large numbers of memory cells attached, to discharge to a digital zero in a faster time. One bitline booster circuit requires only two additional NOR gates, two additional transistors, and one additional control signal. Consequently, the bitline booster circuit does not require a significant number of added components, does not require multiple control signals and takes up minimal additional silicon area.

Claims (70)

1. The A boosted memory array comprising:

at least one bitline;

at least one memory cell coupled to said bitline;

a bitline booster circuit coupled to said bitline;

a bitline booster circuit bitline boost enable signal input terminal coupled to said bitline booster circuit;

a bitline boost enable signal coupled to said bitline booster circuit bitline boost enable signal input terminal, wherein;

when said bitline boost enable signal is active and a signal on said at least one bitline starts going low, said bitline booster circuit discharges said at least one bitline, further wherein;

said boosted memory array includes at least two bitlines, a first bitline and a second bitline, further wherein;

said bitline booster circuit comprises:

a first NOR gate, a first input of said first NOR gate being coupled to said first bitline and a second input of said first NOR gate being coupled to said bitline boost enable signal;

a first transistor, an output of said first NOR gate being coupled to a control electrode of said first transistor, a first flow electrode of said first transistor being coupled said first bitline, a second flow electrode of said first transistor being coupled to a supply voltage;

a second NOR gate, a second input of said second NOR gate being coupled to said second bitline and a second input of said second NOR gate being coupled to said bitline boost enable signal; and

a second transistor, an output of said second NOR gate being coupled to a control electrode of said second transistor, a first flow electrode of said second transistor being coupled said second bitline, a second flow electrode of said second transistor being coupled to said supply voltage.

2. The boosted memory array of claim 1 , wherein;

said first and second transistors are NFETS and said supply voltage is ground.

3. The boosted memory array of claim 1 , wherein;

said boosted memory array is on the same silicon chip as a microprocessor.

4. A microprocessor chip, said microprocessor chip comprising:

one or more functional blocks; and

a boosted memory array, said boosted memory array comprising:

at least one bitline;

at least one memory cell coupled to said bitline;

a bitline booster circuit coupled to said bitline;

a bitline booster circuit bitline boost enable signal input terminal coupled to said bitline booster circuit;

a bitline boost enable signal coupled to said bitline booster circuit bitline boost enable signal input terminal, wherein;

when said bitline boost enable signal is active and a signal on said at least one bitline starts going low, said bitline booster circuit discharges said at least one bitline, further wherein:

said boosted memory array includes at least two bitlines, a first bitline and a second bitline, further wherein;

said bitline boost enable signal is active only during write operation, further wherein;

said bitline booster circuit comprises:

a first NOR gate, a first input of said first NOR gate being coupled to said first bitline and a second input of said first NOR gate being coupled to said bitline boost enable signal;

a first transistor, an output of said first NOR gate being coupled to a control electrode of said first transistor, a first flow electrode of said first transistor being coupled said first bitline, a second flow electrode of said first transistor being coupled to a supply voltage;

a second NOR gate, a first input of said second NOR gate being coupled to said second bitline and a second input of said second NOR gate being coupled to said bitline boost enable signal; and

a second transistor, an output of said second NOR gate being coupled to a control electrode of said second transistor, a first flow electrode of said second transistor being coupled said second bitline, a second flow electrode of said second transistor being coupled to said supply voltage.

5. The microprocessor chip of claim 4 , wherein;

said first and second transistors are NFETS and said supply voltage is ground.

6. A method for boosting the performance of a memory array comprising:

providing at least one bitline;

coupling at least one memory cell to said at least one bitline;

coupling a bitline booster circuit to said at least one bitline;

coupling a bitline booster circuit bitline boost enable signal input terminal to said bitline booster circuit;

coupling a bitline boost enable signal to said bitline booster circuit bitline boost enable signal input terminal, such that;

when said bitline boost enable signal is active and a signal on said at least one bitline starts going low, said bitline booster circuit discharges said at least one bitline, wherein;

said boosted memory array includes at least two bitlines, a first bitline and a second bitline, further wherein;

said bitline boost enable signal is active only during write operation, further wherein;

said bitline booster circuit comprises:

a first NOR gate, a first input of said first NOR gate being coupled to said first bitline and a second input of said first NOR gate being coupled to said bitline boost enable signal;

a first transistor, an output of said first NOR gate being coupled to a control electrode of said first transistor, a first flow electrode of said first transistor being coupled said first bitline, a second flow electrode of said first transistor being coupled to a supply voltage;

a second NOR gate, a first input of said second NOR gate being coupled to said second bitline and a second input of said second NOR gate being coupled to said bitline boost enable signal; and

a second transistor, an output of said second NOR gate being coupled to a control electrode of said second transistor, a first flow electrode of said second transistor being coupled said second bitline, a second flow electrode of said second transistor being coupled to said supply voltage.

7. The method for boosting the performance of a memory array of claim 6 , wherein;

said first and second transistors are NFETS and said supply voltage is ground.

8. The method for boosting the performance of a memory array of claim 6 , wherein;

said boosted memory array is on the same silicon chip as a microprocessor.

9. A method for improving the performance of a microprocessor chip, said method comprising:

providing one or more functional blocks on said microprocessor chip;

providing a boosted memory array, said boosted memory array comprising:

at least one bitline;

at least one memory cell coupled to said bitline;

a bitline booster circuit coupled to said bitline;

a bitline booster circuit bitline boost enable signal input terminal coupled to said bitline booster circuit;

a bitline boost enable signal coupled to said bitline booster circuit bitline boost enable signal input terminal, wherein;

when said bitline boost enable signal is active and a signal on said at least one bitline starts going low, said bitline booster circuit discharges said at least one bitline, further wherein;

said bitline boost enable signal is active only during write operation, further wherein;

said bitline booster circuit comprises:

a first NOR gate, a first input of said first NOR gate being coupled to said first bitline and a second input of said first NOR gate being coupled to said bitline boost enable signal;

a first transistor, an output of said first NOR gate being coupled to a control electrode of said first transistor, a first flow electrode of said first transistor being coupled said first bitline, a second flow electrode of said first transistor being coupled to a supply voltage;

a second NOR gate, a first input of said second NOR gate being coupled to said second bitline and a second input of said second NOR gate being coupled to said bitline boost enable signal; and

a second transistor, an output of said second NOR gate being coupled to a control electrode of said second transistor, a first flow electrode of said second transistor being coupled said second bitline, a second flow electrode of said second transistor being coupled to said supply voltage.

10. The method for improving the performance of a microprocessor chip of claim 9 , wherein;

said first and second transistors are NFETS and said supply voltage is ground.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Dec 16, 2015
From: ORACLE USA, INC.; SUN MICROSYSTEMS, INC.; ORACLE AMERICA, INC.
To: ORACLE AMERICA, INC.
Reel/Frame 037302/0616 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 29, 2004
From: MANDAL, GURUPADA
To: SUN MICROSYSTEMS, INC.
Reel/Frame 014951/0847 →