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App. No. 10/772,522 · Confirmation No. 5415

High throughput mechanical property testing of materials libraries using capacitance

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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 Code Description Pages PDF
2005-09-09 ABN Abandonment 2 View
2005-09-09 IMIS Miscellaneous Internal Document 1 View
2005-03-14 LET. Miscellaneous Incoming Letter 2 View
2005-02-28 CTNF Non-Final Rejection 12 View
2005-02-28 892 List of references cited by examiner 1 View
2005-02-28 BIB Bibliographic Data Sheet 1 View
2005-02-28 FWCLM Index of Claims 1 View
2005-02-28 SRFW Search information including classification, databases and other search related notes 1 View
2005-02-23 SRNT Examiner's search strategy and results 28 View
2004-07-06 IDS Information Disclosure Statement (IDS) Form (SB08) 13 View
2004-02-05 TRNA Transmittal of New Application 4 View
2004-02-05 SPEC Specification 50 View
2004-02-05 CLM Claims 4 View
2004-02-05 ABST Abstract 1 View
2004-02-05 DRW Drawings-only black and white line drawings 7 View
2004-02-05 ADS Application Data Sheet 2 View
2004-02-05 WFEE Fee Worksheet (SB06) 1 View
2004-02-05 WFEE Fee Worksheet (SB06) 1 View
2004-02-05 OATH Oath or Declaration filed 9 View
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Quick Facts
App. No.
10/772,522
Filed
2004-02-05
Pub. No.
US20040155668A1
Examiner
DEB, ANJAN K
Art Unit
2858