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App. No. 10/772,777 · Confirmation No. 2367

In-situ liner formation during reactive ion etch

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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 Code Description Pages PDF
2006-05-03 ABN Abandonment 3 View
2005-10-17 CTFR Final Rejection 15 View
2005-10-17 1449 List of References cited by applicant and considered by examiner 1 View
2005-10-17 892 List of references cited by examiner 1 View
2005-10-17 SRFW Search information including classification, databases and other search related notes 1 View
2005-09-02 WFEE Fee Worksheet (SB06) 1 View
2005-08-17 WFEE Fee Worksheet (SB06) 1 View
2005-08-15 CTMS Miscellaneous Action with shortened statutory period (SSP) 2 View
2005-08-08 A... Amendment/Request for Reconsideration-After Non-Final Rejection 1 View
2005-08-08 CLM Claims 6 View
2005-08-08 REM Applicant Arguments/Remarks Made in an Amendment 4 View
2005-08-08 PA.. Power of Attorney 1 View
2005-08-08 LET. Miscellaneous Incoming Letter 1 View
2005-05-09 IDS Information Disclosure Statement (IDS) Form (SB08) 4 View
2005-05-09 WFEE Fee Worksheet (SB06) 1 View
2005-05-04 CTNF Non-Final Rejection 10 View
2005-05-04 892 List of references cited by examiner 1 View
2005-05-04 SRFW Search information including classification, databases and other search related notes 1 View
2004-09-14 WCLM Claims Worksheet (PTO-2022) 1 View
2004-07-07 OATH Oath or Declaration filed 5 View
2004-05-05 PEFN Pre-Exam Formalities Notice 2 View
2004-02-05 TRNA Transmittal of New Application 1 View
2004-02-05 SPEC Specification 9 View
2004-02-05 CLM Claims 6 View
2004-02-05 ABST Abstract 1 View
2004-02-05 DRW Drawings-only black and white line drawings 5 View
2004-02-05 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
10/772,777
Filed
2004-02-05
Pub. No.
US20050176237A1
Art Unit
2822