Magnetoresistive sensor with decoupled hard bias multilayers
View Patent ↗A magnetic sensor is provided, having two bias layers separated by a decoupling layer to eliminate exchange coupling between the bias layers. The two bias layers may have differing coercivities, such that the biases provided by the bias layers to the free layer are independently adjustable. The grain structures of the two bias layers may be substantially decorrelated by the decoupling layer.
1. A magnetoresistive sensor comprising:
a magnetoresistive free layer;
a first ferromagnetic bias layer providing a first bias to the free layer;
a second ferromagnetic bias layer providing a second bias to the free layer; and
a decoupling layer disposed between the first and second bias layers to substantially eliminate exchange coupling between the first and second bias layers; and
the first bias layer includes a first plurality of crystal grains and the second bias layer includes a second plurality of crystal grains substantially uncorrelated with the first plurality.
2. The sensor of claim 1 , wherein said first bias layer has a coercivity Hc 1 and said second bias layer has a coercivity Hc 2 greater than Hc 1 .
3. The sensor of claim 2 , wherein said first and second bias layers comprise first and second materials respectively, and wherein said first and second materials differ.
4. The sensor of claim 2 , wherein said first and second bias layers comprise first and second materials respectively, and wherein said first and second materials are the same.
5. The sensor of claim 2 , wherein said first and second biases are independently adjustable by application of an external magnetic field.
6. The sensor of claim 1 , wherein said second bias layer is deposited on top of said decoupling layer, and wherein an easy magnetization direction of said second bias layer is constrained, by said decoupling layer, to be parallel to an interface between said decoupling layer and said second bias layer.
7. The sensor of claim 1 , wherein said decoupling layer comprises a bcc metal.
8. The sensor of claim 1 , wherein said decoupling layer comprises of fcc metal.
9. The sensor of claim 1 , wherein said decoupling layer comprises a CrX alloy, where X is Mo, Mn, Co, Ti, Ta, V, Zr, or Nb.
10. The sensor of claim 1 , wherein said first bias layer comprises a first binary, ternary or quaternary alloy of Co, and wherein said second bias layer comprises a second binary, ternary or quaternary alloy of Co.
11. The sensor of claim 10 , wherein said first alloy comprises Co x Pt 1-x where 0.5<x<1, and wherein said second alloy comprises Co y Pt 1-y where 0.5<y<1.
12. A magnetoresistive sensor comprising:
a magnetoresistive free layer;
a first ferromagnetic bias layer providing a first bias to the free layer;
a second ferromagnetic bias layer providing a second bias to the free layer; and
a decoupling layer disposed between the first and second bias layers to substantially eliminate exchange coupling between the first and second bias layers; and
the second bias layer is deposited on top of the decoupling layer, and an easy magnetization direction of the second bias layer is constrained, by the decoupling layer, to be parallel to an interface between the decoupling layer and the second bias layer.
13. The sensor of claim 12 , wherein the first bias layer has a coercivity Hc 1 and the second bias layer has a coercivity Hc 2 greater than Hc 1 .
14. The sensor of claim 13 , wherein the first and second bias layers comprise first and second materials respectively, and wherein the first and second materials differ.
15. The sensor of claim 13 , wherein the first and second bias layers comprise first and second materials respectively, and wherein the first and second materials are the same.
16. The sensor of claim 13 , wherein the first and second biases are independently adjustable by application of an external magnetic field.
17. The sensor of claim 12 , wherein the decoupling layer comprises one of a bcc metal and an fcc metal.
18. The sensor of claim 12 , wherein the decoupling layer comprises a CrX alloy, where X is Mo, Mn, Co, Ti, Ta, V, Zr, or Nb.
19. The sensor of claim 12 , wherein the first bias layer comprises a first binary, ternary or quaternary alloy of Co, and wherein the second bias layer comprises a second binary, ternary or quaternary alloy of Co.
20. The sensor of claim 19 , wherein the first alloy comprises Co x Pt 1-x where 0.5<x<1, and wherein the second alloy comprises Co y Pt 1-y where 0.5<y<1.