Detecting micro-organisms in an electrocoating process
View Patent ↗Use of a micro-organism detection device to rapidly evaluate the presence of microorganisms in an electrocoating process.
1. A method, comprising:
providing a continuous electrocoating operation, wherein the electrocoating operation comprises a plurality of process areas comprising an electrocoat material, wherein the process areas comprise a first process area and at least one other process area, and wherein the at least one process areas is adjacently situated to the first process area;
taking a first sample of electrocoat material from the first process area and determining with a luminometer a level of microorganisms in the first process area, wherein the luminometer measures illumination emitted from ATP in a population of microorganisms in the first sample, and wherein the level of microorganisms in the first sample is determined in less than 1 hour;
taking at least one second sample of electrocoat material from the at least one other process area and determining with a luminometer a level of microorganisms in the at least one other process area, wherein the luminometer measures illumination emitted from ATP in a population of microorganisms in the second sample, and wherein the level of microorganisms in the second sample is determined in less than 1 hour;
comparing the level of microorganisms in the first sample to the level of microorganisms in the second sample(s) until a source of microorganism growth in the electrocoating operation is identified; and
treating the source of microorganism growth,
2. The method according to claim 1 , wherein the level of microorganisms in the sample is determined in less than 5 minutes.
3. The method according to claim 1 , wherein the samples are obtained from at least one of a liquid stream source within the process area and a surface in the process area.
4. The method according to claim 1 , wherein the samples comprise solid matter having an average density of about 1 g/cm 3 to about 4 g/cm 3 .
5. The method according to claim 1 , wherein the sample comprises less than about 10 wt % solids.
6. The method according to claim 1 , wherein the sample comprises less than about 4 wt % solids.
7. The method according to claim 1 , wherein the sample comprises less than about 2 wt % solids.
8. The method according to claim 1 , wherein the luminometer is integrated with a computer-based monitoring system to communicate at least one output therefrom.