Conductive tube for use as a reflectron lens
View Patent ↗A reflectron lens and method are provided. The reflectron lens comprises a tube having a continuous conductive surface along the length of the tube for providing an electric field interior to the tube that varies in strength along the length of the tube. The tube may comprise glass, and in particular, a glass comprising metal ions, such as lead, which may be reduced to form the conductive surface. The method includes a step of introducing a beam of ions into a first end of a dielectric tube having a continuous conductive surface along the length of the tube. The method further includes a step of applying an electric potential across the tube to create an electric field gradient that varies in strength along the length of the tube so the electric field deflects the ions to cause the ions to exit the tube through the first end of the tube.
1. A reflectron analyzer comprising:
a reflectron lens comprising a glass tube comprising metal ions disposed therein and comprising a surface region of the tube comprising a reduced form of the metal ions to provide a continuous conductive surface along the length of the tube for providing an electric field interior to the tube that varies in strength along the length of the tube; and
a voltage supply electrically connected to opposing ends of the tube to apply a voltage potential across the tube to create the electric field.
2. The reflectron analyzer according to claim 1 , wherein the conductive surface comprises the interior surface of the tube.
3. The reflectron analyzer comprising:
a ceramic tube;
a glass coating disposed on the ceramic material, the glass coating comprising metal ions disposed therein and comprising a surface region comprising a reduced form of the metal ions to provide a continuous conductive surface along the length of the tube for providing an electric field interior to the tube that varies in strength along the length of the tube; and
a voltage supply electrically connected to opposing ends of the tube to apply a voltage potential across the tube to create the electric field.
4. The reflectron analyzer according to claim 1 , wherein the tube comprises a lead silicate glass.
5. The reflectron analyzer according to claim 1 , wherein the tube comprises at least one of a circular cross-sectional shape, an elliptical cross-sectional shape, a rectangular cross-sectional shape, and a square cross section.
6. The reflectron analyzer according to claim 1 , wherein the tube comprises a non-circular cross-sectional shape.
7. The reflectron analyzer according to claim 1 , wherein the tube comprises a cross-sectional shape is constant along the length of the tube.
8. The reflectron analyzer according to claim 1 , wherein the tube is monolithic.
9. The reflectron analyzer according to claim 1 , wherein the tube comprises stacked rings of conductive glass tubes.
10. A method for reflecting a beam of ions comprising:
providing a glass tube comprising metal ions disposed therein and comprising a surface region of the tube comprising a reduced form of the metal ions to provide a continuous conductive surface along the length of the tube for providing an electric field interior to the tube that varies in strength along the length of the tube;
introducing a beam of ions into a first end of the glass tube; and
applying an electric potential across the tube to create an electric field gradient that varies in strength along the length of the tube so that the electric field deflects the ions to cause the ions to exit the tube through the first end of the tube.
11. The method according to claim 10 , wherein the step of applying an electric potential comprises creating an electric field gradient that causes the ions to be deflected without the ions contacting the tube.
12. The reflectron analyzer according to claim 1 , wherein the tube comprises a single glass tube.