Method of manufacturing semiconductor device, integrated circuit, electro-optical device, and electronic apparatus
View Patent ↗The invention provides a technique of allowing fine and high-performance thin film semiconductor elements to be easily formed on a large-sized substrate. A method of manufacturing a semiconductor device includes: forming a peeling layer on a first substrate; forming an insulating film on the peeling layer; forming a plurality of fine holes in the insulating film; forming a semiconductor film on the insulating film and in the fine holes; melting and crystallizing the semiconductor film by a heat treatment to form a crystalline semiconductor film including substantially single-crystalline grains centered substantially on the respective fine holes; forming a semiconductor element T by using the crystalline semiconductor film; and causing peeling at the inside and/or the boundary surface of the peeling layer to separate the semiconductor element T from the first substrate and transferring the semiconductor element to a second substrate.
1. A method of manufacturing a semiconductor device, comprising:
forming a peeling layer on a first substrate;
forming an insulating film on the peeling layer;
forming a plurality of fine holes in the insulating film;
forming a semiconductor film on the insulating film and in the fine holes;
melting and crystallizing the semiconductor film by a heat treatment to form a crystalline semiconductor film including substantially single-crystalline grains substantially centered on the respective fine holes;
forming a semiconductor element by using the crystalline semiconductor film; and
causing peeling at an inside and/or a boundary surface of the peeling layer to separate the semiconductor element from the first substrate and transferring the semiconductor element to a second substrate.
2. The method of manufacturing a semiconductor device according to claim 1 , the causing peeling comprises:
bonding the semiconductor element on the first substrate to the second substrate;
applying energy to the peeling layer to cause the peeling at the inside and/or the boundary surface of the peeling layer; and
separating the first substrate from the second substrate.
3. The method of manufacturing a semiconductor device according to claim 1 , the causing peeling comprises:
bonding the semiconductor element on the first substrate to a temporary transfer substrate;
causing the peeling at the inside and/or the boundary surface of the peeling layer;
separating the first substrate from the temporary transfer substrate;
bonding the semiconductor element on the temporary transfer substrate to the second substrate; and
separating the temporary transfer substrate from the second substrate.
4. The method of manufacturing a semiconductor device according to claim 2 , the application of energy to the peeling layer carried out by laser irradiation.
5. The method of manufacturing a semiconductor device according to claim 1 , the first substrate having at least one of size, shape and thermal resistance suitable for a semiconductor process capable of processing at least a semiconductor wafer.
6. The method of manufacturing a semiconductor device according to claim 5 , the semiconductor process being an LSI manufacturing process.
7. The method of manufacturing a semiconductor device according to claim 5 , the first substrate having a wafer size.
8. The method of manufacturing a semiconductor device according to claim 1 , a surface roughness of the first substrate ranging from 10 μm to 30 μm.
9. The method of manufacturing a semiconductor device according to claim 1 , in forming the semiconductor element, a plurality of the semiconductor elements formed using one crystalline semiconductor film.
10. The method of manufacturing a semiconductor device according to claim 9 , the plurality of semiconductor elements constitute a unit circuit.
11. The method of manufacturing a semiconductor device according to claim 1 , in the causing peeling, only semiconductor elements that are transfer targets among a plurality of semiconductor elements formed on the first substrate being selectively transferred from the first substrate to the second substrate.
12. The method of manufacturing a semiconductor device according to claim 11 , in the causing peeling, the semiconductor elements that are the transfer targets are selected correspondingly to a plurality of crystalline semiconductor films, respectively.
13. The method of manufacturing a semiconductor device according to claim 12 , the method further comprising:
dividing the semiconductor elements and the peeling layer formed on the first substrate every crystalline semiconductor film.
14. An electro-optical device, comprising:
the semiconductor device manufactured by using the method of manufacturing a semiconductor device according to claim 1 .
15. An integrated circuit, comprising:
the semiconductor device manufactured by using the method of manufacturing a semiconductor device according to claim 1 .
16. A circuit board, comprising:
the semiconductor device manufactured by using the method of manufacturing a semiconductor device according to claim 1 .
17. An electronic apparatus, comprising:
the semiconductor device manufactured by using the method of manufacturing a semiconductor device according to claim 1 .