Modified vortex for an ion mobility spectrometer
View Patent ↗The presence of trace molecules in air is often determined using a well-known device called an ion mobility spectrometer. Such devices are commonly utilized in the fields of explosives detection, identification of narcotics, and in applications characterized by the presence of very low airborne concentrations of organic molecules of special interest. The sensitivity of such instruments is dependent on the method of gas sampling utilized. The vortex sampling nozzle consists of an intake gas flow and a separate coaxial heated, emitted gas flow that is deflected to move with a circular motion. A heated vortex sampling nozzle can greatly improve the sampling efficiency for low volatility target molecules, particularly when the sampling needs to be performed at a distance from the air intake and the vapor pressure of the target molecules is very low. Additionally, the vortex air may contain one or more additional substances that promote vaporization, combine with the target molecule, or provide a known marker in the ion mobility time-of-flight spectrum.
1. A gas sampling system comprising:
a first gas pump that provides a first gas flow at a partial gas vacuum compared to ambient gas pressure;
a second gas pump that provides a second gas flow at a partial gas pressure compared to the ambient gas pressure;
a first orifice that provides said first gas flow;
a plurality of second orifices that provide a plurality of flow members of said second gas flow in a substantially rotational direction that is substantially concentric and both radially and axially external to said first orifice; and
a heater that heats at least one flow member of said second gas flow, wherein the gas sampling system provides the first gas flow for analysis within an ion mobility spectrometer.
2. A gas sampling system as in claim 1 wherein said partial gas vacuum is within 50 millimeters of mercury (50 Torr) of the ambient gas pressure.
3. A gas sampling system as in claim 1 wherein said partial gas pressure is within 50 atmospheres of the ambient gas pressure.
4. A gas sampling system as in claim 1 , further comprising:
vanes that cause said second gas flow to flow in a substantially rotational direction.
5. A gas sampling system as in claim 1 , further comprising:
a hollow member wherein an inside surface thereof causes said second gas flow to flow in a substantially rotational direction.
6. A gas sampling system, according to claim 5 , wherein said heater is disposed within said hollow member.
7. A gas sampling system as in claim 1 , wherein the said plurality of second orifices directs the said second gas flow in a substantially perpendicular direction with respect to the axis of the said first orifice.
8. A gas sampling system as in claim 7 , further comprising:
a solid surface disposed with its normal axis substantially perpendicular to the axis of the said first orifice, wherein said second gas flow flows in a substantially rotational direction due to the deflection of the flow of at least one flow member by said solid surface.
9. A gas sampling system as in claim 7 , wherein said second gas flow flows in a substantially rotational direction due to interaction between the flow members.
10. A gas sampling system as in claim 1 , further comprising:
a rotating impeller that causes said second gas flow to flow in a substantially rotational direction.
11. A gas sampling system as in claim 1 wherein said rotational direction of all the flow members is mutually clockwise or mutually counter-clockwise relative to the axis of said first orifice.
12. A gas sampling system as in claim 1 wherein the heat for said heater is provided by at least one of electric current resistance or impedance, photon radiation, fluid compression, Peltier effect, and chemical flame or reaction.
13. A gas sampling system as in claim 1 wherein said heater uses waste heat generated by other components of said ion mobility spectrometer.
14. A gas sampling system as in claim 1 wherein said heater increases temperature of said second gas flow from said plurality of second orifices by at least 10 degrees Centigrade from ambient temperature.
15. A gas sampling system, according to claim 1 , wherein said heater is a radiative heater.
16. A gas sampling system, according to claim 1 , further comprising:
tubulation that couples said second gas pump with said second orifaces.
17. A gas sampling system, according to claim 16 , wherein said heater is disposed outside said tubulation.
18. A gas sampling system, according to claim 16 , wherein said heater is disposed inside said tubulation.
19. A gas sampling system, according to claim 16 , wherein said heater is disposed in series with said tubulation.
20. A gas sampling system, according to claim 1 , wherein said heater is disposed within said second orifices.
21. A gas sampling system comprising:
a first gas pump that provides a first gas flow at a partial gas vacuum compared to ambient gas pressure;
a second gas pump that provides a second gas flow at a partial gas pressure compared to the ambient gas pressure;
a first orifice that provides said first gas flow;
a plurality of second orifices that provide a plurality of flow members of said second gas flow in a substantially rotational direction that is substantially concentric and both radially and axially external to said first orifice; and at least one chemical addition into at least one flow member, wherein the gas sampling system provides the first gas flow for analysis within an ion mobility spectrometer.
22. A gas sampling system as in claim 21 wherein said partial gas vacuum is within 50 millimeters of mercury (50 Torr) of the ambient gas pressure.
23. A gas sampling system as in claim 21 wherein said partial gas pressure is within 50 atmospheres of the ambient gas pressure.
24. A gas sampling system as in claim 21 , further comprising:
vanes that cause said second gas flow to flow in a substantially rotational direction.
25. A gas sampling system as in claim 21 , further comprising:
a hollow member wherein an inside surface thereof cause said second gas flow to flow in a substantially rotational direction.
26. A gas sampling system as in claim 21 , wherein the said plurality of second orifices directs the said second gas flow in a substantially perpendicular direction with respect to an axis of the said first orifice.
27. A gas sampling system as in claim 26 , further comprising:
a solid surface disposed with its normal axis substantially perpendicular to the axis of the said first orifice, wherein said second gas flow flows in a substantially rotational direction due to the deflection of the flow of at least one flow member by said solid surface.
28. A gas sampling system as in claim 26 , wherein said second gas flow flows in a substantially rotational direction due to interaction between the flow members.
29. A gas sampling system as in claim 21 , further comprising:
a rotating impeller that causes said second gas flow to flow in a substantially rotational direction.
30. A gas sampling system as in claim 21 wherein said rotational direction of all the flow members is mutually clockwise or mutually counter-clockwise relative to the axis of said first orifice.
31. A gas sampling system as in claim 21 wherein said chemical addition is water in liquid or vapor form.
32. A gas sampling system as in claim 21 wherein said chemical addition is at least one of acetone, alcohol, ethylene glycol, and propylene glycol.