Method and apparatus for monitoring phase-shift keyed optical signals
View Patent ↗A method and apparatus for monitoring PSK optical signals by measuring the RF spectrum of the signal and determining the power spectral density of noise on the optical signal within a predetermined frequency range to determine a measure of the degradation of the optical signal.
1. A method for monitoring an optical PSK signal comprising:
measuring the RF spectrum of the PSK signal; and
determining the power spectral density of noise on the PSK signal within one or more frequency ranges excluding the clock frequency and harmonics of the frequency,
wherein measuring the RF spectrum is performed using a measurement of the temporal intensity of a source under test followed by a numerical Fourier transform and squaring.
2. The method of claim 1 further comprising determining a measure of the degradation of the PSK signal due to the noise.
3. The method of claim 1 wherein measuring the RF spectrum is performed using an RF spectrum analyzer.
4. The method of claim 1 wherein measuring the RF spectrum is performed using second order intensity autocorrelation of a source.
5. The method of claim 1 wherein the optical PSK signal is a signal selected from the group consisting of DPSK, DQPSK, □/2-DPSK, and M-ary PSK.
6. A method for monitoring ASE noise on an optical PSK signal comprising:
measuring the RF spectrum of the PSK signal; and
determining the power spectral density of ASE noise on the PSK signal within a predetermined frequency range,
wherein measuring the RF spectrum is performed using a measurement of the temporal intensity of a source under test followed by a numerical Fourier transform and squaring.
7. The method of claim 6 further comprising determining a measure of the degradation of the PSK signal due to the ASE noise.
8. The method of claim 6 wherein the predetermined frequency range is a low frequency range.
9. The method of claim 6 wherein measuring the RF spectrum is performed using an RF spectrum analyzer.
10. The method of claim 6 wherein measuring the RF spectrum is performed using second order intensity autocorrelation of a source.
11. The method of claim 6 wherein the optical PSK signal is a signal selected from the group consisting of DPSK, DQPSK, □/2-DPSK and M-ary PSK.
12. A method for monitoring the bias drift of a PSK data modulator comprising:
measuring the RF spectrum of a PSK signal generated by the PSK data modulator;
determining the power spectral density of the PSK signal within a predetermined frequency range; and
determining the degradation of the PSK signal due to the bias drift of the PSK data modulator based on the spectral density within the predetermined frequency range.
13. The method of claim 12 wherein the predetermined frequency range excludes the clock frequency and harmonics of the clock frequency.
14. The method of claim 12 wherein the predetermined frequency range is a low frequency range.
15. The method of claim 12 wherein measuring the RF spectrum is performed using an RF spectrum analyzer.
16. The method of claim 12 wherein measuring the RF spectrum is performed using a measurement of the temporal intensity of a source under test followed by a numerical Fourier transform and squaring.
17. The method of claim 12 wherein measuring the RF spectrum is performed using second order intensity autocorrelation of a source.
18. The method of claim 12 wherein the optical PSK signal is a signal selected from the group consisting of DPSK, DQPSK, □/2-DPSK and M-ary PSK.
19. A method of controlling the bias of a PSK data modulator comprising:
measuring the RF spectrum of a PSK signal generated by the PSK data modulator;
determining the power spectral density of the PSK signal within a predetermined frequency range; and
adjusting the bias of the PSK data modulator to reduce amplitude fluctuation from the PSK data modulator.
20. The method of claim 19 wherein the predetermined frequency range excludes the clock frequency and harmonics of the clock frequency.
21. The method of claim 19 wherein the predetermined frequency range is a low frequency range.
22. The method of claim 19 wherein measuring the RF spectrum is performed using an RF spectrum analyzer.
23. The method of claim 19 wherein measuring the RF spectrum is performed using a measurement of the temporal intensity of a source under test followed by a numerical Fourier transform and squaring.
24. The method of claim 19 wherein measuring the RF spectrum is performed using second order intensity autocorrelation of a source.
25. The method of claim 19 wherein the optical PSK signal is a signal selected from the group consisting of DPSK, DQPSK, □/2-DPSK and M-ary PSK.
26. An apparatus for monitoring an optical PSK signal comprising:
means for measuring the RF spectrum of the PSK signal; and
means for determining the power spectral density of noise on the PSK signal within one or more frequency ranges excluding the clock frequency and harmonics of the clock frequency,
wherein said means for measuring the RF spectrum of the PSK signal measures the temporal intensity of a source undre test followed by a numerical Fourier transform and squaring.
27. An apparatus for monitoring ASE noise on an optical PSK signal comprising:
means for measuring the RF spectrum of the PSK signal; and
means for determining the power spectral density of ASE noise on the PSK signal within a predetermined frequency range,
wherein said means for measuring the RF spectrum of the PSK signal measures the temporal intensity of a source undre test followed by a numerical Fourier transform and squaring.
28. An apparatus for monitoring the bias drift of a PSK data modulator comprising:
means for determining the power spectral density of a PSK signal generated by the PSK data modulator within a predetermined frequency range; and
means for determining the degradation of the PSK signal due to the bias drift of the PSK data modulator based on the power spectral density within the predetermined frequency range.
29. An apparatus for controlling the bias of a PSK data modulator comprising:
means for determining the power spectral density of a PSK signal generated by the PSK data modulator within a predetermined frequency range; and
means for adjusting the bias of the PSK data modulator based on the power spectral density of the PSK signal within the predetermined frequency range.
30. The apparatus as in claim 26 wherein said means for measuring the RF spectrum of the PSK signal performs second order intensity autocorrelation of a source.
31. The apparatus as in claim 27 wherein said means for measuring the RF spectrum of the PSK signal performs second order intensity autocorrelation of a source.