IP Library Granted Patent US 6,958,474
Granted Patent B2
US 6,958,474 · App. 10/835,032 · Granted Oct 25, 2005

Detector for a bipolar time-of-flight mass spectrometer

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Quick Facts
Patent No.
US 6,958,474
App. No.
10/835,032
Granted
Oct 25, 2005
Kind
B2
Abstract

A replaceable, electronically-isolated, MCP-based spectrometer detector cartridge with enhanced sensitivity is disclosed. A mass detector is electro-optically isolated from a charge collector with an electron multiplier for converting a charged particle into a multiplicity of electrons and a scintillator for converting the multiplicity of electrons into a multiplicity of photons. A light sensor is provided to convert the multiplicity of photons back into electrons which are summed into a charge pulse. The light sensor is realized by any of a plurality of photo-responsive devices.

Claims (28)

1. A detector for a time-of-flight mass spectrometer comprising:

an electron multiplier, for converting a charged particle into a multiplicity of electrons;

a scintillator, for converting the multiplicity of electrons into a multiplicity of photons; and

a collector disposed for receiving the multiplicity of photons and adapted for reconverting said photons into a second multiplicity of electrons and integrating said second multiplicity of electrons into a charge pulse corresponding to the mass of the charged particle;

wherein said collector comprises a light sensor selected from the group consisting of an avalanche photodiode, an avalanche photodiode array, a charge coupled device, a photovoltaic device, a CdS photoconductive cell, a PN photodiode, a PIN photodiode, a phototransistor, a vacuum photodiode, an image intensifier tube having a metal anode in place of a luminescent screen, a microchannel plate type photomultiplier, and a photomultiplier tube incorporating stage skipping.

2. The detector set forth in claim 1 , wherein said electron multiplier comprises a coating formed on a surface thereof, said coating being formed of a material selected from the group consisting of aluminum oxide (Al 2 O 3 ), magnesium oxide (MgO), tin oxide (SnO 2 ), quartz (SiO 2 ), barium fluoride (BaF 2 ), rubidium tin (Rb 3 Sn), beryllium oxide (BeO), diamond and combinations thereof.

3. The detector set forth in claim 1 , wherein said electron multiplier comprises a microchannel plate.

4. The detector set forth in claim 1 comprising a cartridge configured to receive said microchannel plate, said cartridge being readily removable from and installable in said detector.

5. The detector set forth in claim 1 , wherein said scintillator is configured to provide a frequency bandwidth which accommodates arrival times of the multiplicity of electrons.

6. The detector set forth in claim 1 , wherein said scintillator is constructed from a plastic scintillator material.

7. The detector set forth in claim 1 , further comprising a conductive coating on said scintillator configured to internally reflect photons generated therein.

8. The detector set forth in claim 7 , wherein the conductive coating on said scintillator is selected from the group consisting of aluminum, chrome and combinations thereof.

9. The detector set forth in claim 1 wherein the light sensor is an avalanche photodiode.

10. The detector set forth in claim 1 wherein the light sensor is an avalanche photodiode array.

11. The detector set forth in claim 1 wherein the light sensor is a charge coupled device.

12. The detector set forth in claim 1 wherein the light sensor is a photovoltaic device.

13. The detector set forth in claim 1 wherein the light sensor is a CdS photoconductive cell.

14. The detector set forth in claim 1 wherein the light sensor is a PIN photodiode.

15. The detector set forth in claim 1 wherein the light sensor is a phototransistor.

16. The detector set forth in claim 1 wherein the light sensor is a vacuum photodiode.

17. The detector set forth in claim 1 wherein the light sensor is an image intensifier tube having a metal anode in place of a luminescent screen.

18. The detector set forth in claim 1 wherein the light sensor is a microchannel plate type photomultiplier.

19. The detector set forth in claim 1 wherein the light sensor is a photomultiplier tube incorporating stage skipping.

20. A detector for a time-of-flight mass spectrometer comprising:

a microchannel plate disposed for receiving a charged particle and formed for converting the charged particle into a multiplicity of electrons;

a scintillator disposed for receiving the multiplicity of electrons from said microchannel plate for converting the multiplicity of electrons into a multiplicity of photons; and

a collector disposed for receiving the multiplicity of photons and adapted for reconverting the multiplicity of photons into a second multiplicity of electrons and integrating said second multiplicity of electrons into a charge pulse corresponding to the mass of the charged particle;

wherein said collector comprises a light sensor selected from the group consisting of an avalanche photodiode, an avalanche photodiode array, a charge coupled device, a photovoltaic device, a CdS photoconductive cell, a PN photodiode, a PIN photodiode, a phototransistor, a vacuum photodiode, an image intensifier tube having a metal anode in place of a luminescent screen, a microchannel plate type photomultiplier, and a photomultiplier tube incorporating stage skipping.

Assignments (10)
RELEASE OF SECURITY INTEREST IN PATENTS AT R/F 058808/0959 Recorded Jun 14, 2024
From: AETHER FINANCIAL SERVICES SAS, AS SECURITY AGENT
To: PHOTONIS SCIENTIFIC, INC.
Reel/Frame 067735/0264 →
SECURITY INTEREST Recorded Jan 28, 2022
From: PHOTONIS SCIENTIFIC, INC.
To: AETHER FINANCIAL SERVICES SAS, AS SECURITY AGENT
Reel/Frame 058808/0959 →
RELEASE OF INTELLECTUAL PROPERTY SECURITY INTERESTS AT R/F 048357/0067 Recorded Jan 27, 2022
From: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH, AS COLLATERAL AGENT
To: BURLE TECHNOLOGIES, LLC; PHOTONIS DEFENSE, INC.; PHOTONIS SCIENTIFIC, INC.; PHOTONIS FRANCE SAS; PHOTONIS NETHERLANDS, B.V.
Reel/Frame 058887/0384 →
SECURITY INTEREST Recorded Feb 16, 2019
From: BURLE TECHNOLOGIES; PHOTONIS SCIENTIFIC, INC.; PHOTONIS NETHERLANDS B.V.; PHOTONIS FRANCE SAS
To: CREDIT SUISSE, AG, CAYMAN ISLANDS BRANCH, AS COLLATERAL AGENT
Reel/Frame 048357/0067 →
CHANGE OF NAME Recorded Nov 29, 2018
From: PHOTONIS USA, INC.
To: PHOTONIS SCIENTIFIC, INC.
Reel/Frame 047684/0477 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 10, 2018
From: BURLE TECHNOLOGIES, INC.
To: PHOTONIS USA, INC.
Reel/Frame 046305/0730 →
SECURITY AGREEMENT Recorded Sep 20, 2013
From: BURLE TECHNOLOGIES, LLC
To: CREDIT SUISSE AG AS COLLATERAL AGENT
Reel/Frame 031247/0396 →
RELEASE OF SECURITY INTEREST Recorded Sep 18, 2013
From: ING BANK N.V., LONDON BRANCH
To: BURLE TECHNOLOGIES, INC.
Reel/Frame 031235/0941 →
SECURITY AGREEMENT Recorded Mar 20, 2012
From: BURLE TECHNOLOGIES, INC.
To: ING BANK N.V., LONDON BRANCH
Reel/Frame 027891/0405 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2004
From: LAPRADE, BRUCE; STARCHER, RONALD
To: BURLE TECHNOLOGIES, INC.
Reel/Frame 015294/0386 →