Planar avalanche photodiode
View Patent ↗A planar avalanche photodiode includes a small localized contact layer on the top of the device produced by either a diffusion or etching process and a semiconductor layer defining a lower contact area. A semiconductor multiplication layer is positioned between the two contact areas and a semiconductor absorption layer is positioned between the multiplication layer and the upper contact layer. The photodiode has a low capacitance and a low field near the edges of the semiconductor multiplication and absorption layers.
1. A planar avalanche photodiode comprising:
a first semiconductor layer;
a first contact layer, the first contact layer being on the first semiconductor layer;
a second contact layer defining a small local contact;
a second semiconductor layer with a diffusion region, the second semiconductor layer being undoped or low doped;
the diffusion region having a smaller area than the second semiconductor layer and being positioned adjacent to the second contact layer, whereby the diffusion region creates a contact region between the diffusion region and the second semiconductor layer;
a semiconductor multiplication layer positioned between the first and second semiconductor layers, whereby the semiconductor multiplication layer multiplies a generated carrier;
a semiconductor absorption layer positioned between the semiconductor multiplication layer and the second semiconductor layer, the semiconductor absorption layer absorbs light, generating the carrier;
a charge control layer, the charge control layer being located between the semiconductor absorbtion layer and the semiconductor multiplication layer, the charge control layer having a substantially uniform thickness and an area larger than the diffusion region; and
at least one grading layer positioned adjacent to the semiconductor absorption layer.
2. The photodiode of claim 1 wherein the second semiconductor layer is an n-type and the diffusion region is a p-type.
3. The photodiode of claim 2 wherein the first semiconductor layer is an n-type, the second contact layer is a p contact and the first contact layer is an n contact.
4. The photodiode of claim 1 wherein the first semiconductor layer is a p-type, the second semiconductor layer is a p-type and the diffusion region is an n-type.
5. The photodiode of claim 4 wherein the second contact layer is an n contact and the first contact layer is a p contact.
6. The photodiode of claim 1 wherein both the second semiconductor layer and the diffusion region are p-types forming a p-p+ contact.
7. The photodiode of claim 1 wherein the second semiconductor layer is InAlAs.
8. The photodiode of claim 1 wherein the first semiconductor layer is InAlAs.
9. The photodiade of claim 1 wherein the semiconductor multiplication layer is InAlAs.
10. The photodiode of claim 1 wherein the semiconductor absorption layer is InGaAs.
11. The photodiode of claim 1 wherein the photodiode has a low capacitance and a low field near the sides of the absorption and multiplication layers.
12. The photodiode of claim 1 wherein the photodiode has a diffusion profile with a p-doped hole concentration extending into the semiconductor absorption layer in a decreasing manner to create a pseudo field, enhance electron transport, and decrease hole collection time.
13. The photodiode of claim 1 wherein the first semiconductor layer or the second semiconductor layer is an n-type of InP.
14. The photodiode of claim 1 wherein the photodiode has a dark current that is substantially constant relative to an initial value over a time period that exceeds 2000 hours at 150° C.
15. The photodiode of claim 1 wherein the photodiode has a lifetime that exceeds twenty years at 70° C.
16. The photodiode of claim 1 wherein the second semiconductor layer is InP.
17. The photodiode of claim 1 wherein the first semiconductor layer is InP.
18. The photodiode of claim 1 wherein the semiconductor multiplication layer is InP.
19. A planar avalanche photodiode comprising:
a first contact layer;
a first semiconductor layer, the first contact layer being on the first semiconductor layer;
a mini-mesa semiconductor layer;
a second contact layer, the second contact layer being on the mini mesa semiconductor layer;
a semiconductor absorption layer, the semiconductor absorption layer being positioned between the first semiconductor layer and the mini mesa semiconductor layer, the mini-mesa semiconductor layer having a substantially smaller area than the semiconductor absorption layer;
a semiconductor multiplication layer, the semiconductor multiplication layer being positioned between the first semiconductor layer and the semiconductor absorption layer; and
a charge control layer, the charge control layer being located between the semiconductor absorption layer and the semiconductor multiplication layer, the charge control layer being a single layer and having a substantially uniform thickness and an area larger than the mini-mesa semiconductor layer.
20. The photodiode of claim 19 futher comprising at least one grading layer positioned adjacent to the semiconductor absorption layer.
21. The photodiode of claim 19 wherein the first semiconductor layer is InAlAs.
22. The photodiode of claim 19 wherein the semiconductor multiplication layer is InAlAs.
23. The photodiode of claim 19 wherein the semiconductor absorption layer is InGaAs.
24. The photodiode of claim 19 wherein the mini-mesa semiconductor layer is an InAlAs semiconductor layer.
25. The photodiode of claim 19 wherein the first contact layer is a n contact.
26. The photodiode of claim 25 wherein the second contact layer is an p contact.
27. The photodiode of claim 19 wherein the first contact layer is an p contact.
28. The photodiode of claim 27 wherein the second contact layer is a n contact.
29. The photodiode of the claim 19 further comprising a low doped passivation region positioned between the mini-mesa semiconductor layer and the semiconductor absorption layer.
30. The photodiode of claim 29 , wherein the low doped passivation region is InAlAs or InP.
31. The photodiode of claim 19 wherein the photodiode has a low capacitance and a low field near the edges of the absorption and multiplication layers.
32. The photodiode of claim 19 wherein the photodiode has a diffusion profile with a p-doped hole concentration extending into the semiconductor absorption layer in a decreasing manner to create a pseudo field, enhance electron transport, and decrease hole collection time.
33. The photodiode of claim 19 wherein the first semiconductor layer is an n-type of InP.
34. The photodiode of claim 19 wherein the photodiode has a dark current that is substantially constant relative to an initial value over a time period that exceeds 2000 hours at 150° C.
35. The photodiode of claim 19 wherein the photodiode has a lifetime that exceeds twenty years at 70° C.
36. The photodiode of claim 19 , wherein the semiconductor absorption layer, the semiconductor multiplication layer and the semiconductor charge control layer each have a substantially similar diameter.
37. The photodiode of claim 19 wherein the first semiconductor layer is InP.
38. The photodiode of claim 19 wherein the semiconductor multiplication layer is InP.
39. The photodiode of claim 19 wherein the mini-mesa semiconductor layer is an InP semiconductor layer.
40. A planar avalanche photodiode comprising:
a first semiconductor layer;
a first contact layer, the first contact layer being on the first semiconductor layer contact;
a second contact layer;
a second semiconductor layer with an diffusion region, the diffusion region having a smaller area than the second semiconductor layer and being positioned adjacent to the second contact layer, whereby the diffusion region creates a junction between the diffusion region and the second semiconductor layer;
a semiconductor multiplication layer positioned between the first and second semiconductor layers, whereby the semiconductor multiplication layer multiplies a generated carrier;
a semiconductor absorption layer positioned between the semiconductor multiplication layer and the second semiconductor layer, whereby the semiconductor absorption layer absorbs light, generating the carrier; and
the photodiode has a diffusion profile with a p-doped hole concentration extending into the semiconductor absorption layer in a decreasing manner to create a pseudo field, enhance electron transport, and decrease hole collection time.
41. A planar avalanche photodiode comprising:
a first contact layer:
a first semiconductor layer, the first contact layer being on the first semiconductor layer;
a mini-mesa semiconductor layer;
a second contact layer, the second contact layer being on the mini mesa semiconductor layer;
a semiconductor absorption layer, the semiconductor absorption layer being positioned between the first semiconductor layer and the mini mesa semiconductor layer, the mini-mesa semiconductor layer having a substantially smaller area than the semiconductor absorption layer;
a semiconductor multiplication layer, the semiconductor multiplication layer being positioned between the first semiconductor layer and the semiconductor absorption layer; and
the photodiode has a diffusion profile with a p-doped hole concentration extending into the semiconductor absorption layer in a decreasing manner to create a pseudo field, enhance electron transport, and decrease hole collection time.