IP Library Granted Patent US 6,969,996
Granted Patent B2
US 6,969,996 · App. 10/839,545 · Granted Nov 29, 2005

Methods for affirming switched status of MEMS-based devices

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 6,969,996
App. No.
10/839,545
Granted
Nov 29, 2005
Kind
B2
Abstract

A configuration is provided by which it may be determined whether a MEMS device is in a select state. The select state is defined by a position of a moveable element, which is moved with electrostatic forces upon activation of an electrode. The select state is detected with a sensing configuration that has first and second regions. The regions are generally separated such that they are electrically uncoupled unless the moveable element is in the position that defines the select state. A detector may be provided to indicate whether the first and second regions are coupled electrically.

Claims (14)

1. A method for determining whether a MEMS device is in a select state defined by a position of a moveable element comprised by the MEMS device and formed over a substrate comprised by the MEMS device, the method comprising:

changing a voltage of a first sensing element formed over the substrate; and

measuring a second sensing element formed over the substrate,

wherein the first and second sensing elements are fixed relative to the substrate and are electrically coupled when the MEMS device is in the select state and electrically uncoupled when the MEMS device is not in the select state.

2. The method recited in claim 1 wherein the first and second sensing elements comprise first and second sensing electrodes.

3. The method recited in claim 1 wherein:

the first and second sensing elements comprise first and second waveguide ports; and

measuring the second sensing element comprises measuring an electrical impedance between the first and second waveguide ports.

4. A MEMS device comprising:

a moveable element formed over a substrate and configured to move to a position defining a select state of the MEMS device upon activation of an electrode;

a sensing configuration having first and second sensing elements formed over the substrate, wherein the first and second sensing elements are fixed relative to the substrate and are electrically coupled when the moveable element is in the position and electrically uncoupled when the moveable element is not in the position; and

a detector configured to indicate when the first and second sensing elements of the sensing configuration are electrically coupled.

5. The MEMS device recited in claim 4 wherein the first and second sensing elements comprise first and second sensing electrodes.

6. The MEMS device recited in claim 4 wherein the first and second sensing elements comprise first and second waveguide ports.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 2, 2006
From: PTS CORPORATION
To: ALTERA CORPORATION
Reel/Frame 018720/0569 →