IP Library Granted Patent US 7,964,789
Granted Patent B2
US 7,964,789 · App. 10/841,803 · Granted Jun 21, 2011

Germanium solar cell and method for the production thereof

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,964,789
App. No.
10/841,803
Granted
Jun 21, 2011
Kind
B2
Abstract

A method is disclosed for passivating and contacting a surface of a germanium substrate. A passivation layer of amorphous silicon material is formed on the germanium surface. A contact layer of metal is then formed on the passivation. The structure is heated so that the germanium surface makes contact with the contact layer. Thus, a passivated germanium surface is disclosed, as well as a solar cell comprising such a structure.

Claims (28)

1. A method of passivating and contacting a surface of a germanium substrate, comprising, in sequence:

(a) providing a germanium substrate having a first surface, wherein the first surface is a surface of an emitter;

(b) forming a passivation layer of amorphous silicon or hydrogenated amorphous silicon on said first surface to passivate the surface of the emitter;

(c) forming a contact layer of metal on said passivation layer; and thereafter

(d) heating the substrate and layers at a temperature of from about 150° C. to less than 300° C., whereby particles of metal from the contact layer diffuse through the passivation layer to form a conductive path between the contact layer and the germanium emitter.

2. The method according to claim 1 , wherein said contact resistivity is less than about 10 −4 Ωcm 2 .

3. The method according to claim 1 , further comprising cleaning said first surface before forming said passivation layer, said cleaning comprising applying a H 2 containing plasma to said first surface.

4. The method according to claim 1 , wherein said forming said passivation layer is performed by plasma enhanced chemical vapor deposition (PECVD).

5. The method according to claim 4 , wherein said PECVD is performed at a temperature of from about 150° C. to about 300° C.

6. The method according to claim 1 , wherein said passivation layer has a thickness of less than about 100 nm.

7. The method according to claim 6 , wherein said passivation layer has a thickness of less than about 40 nm.

8. The method according to claim 1 , wherein said passivation layer has a thickness of from about 10 nm to about 50 nm.

9. The method according to claim 1 , wherein said contact layer comprises Ag or Au.

10. The method according to claim 1 , further comprising patterning the contact layer to form a contact grid, wherein patterning is performed after forming the contact layer of metal on said passivation layer and before heating the substrate and layers at a temperature of from about 150° C. to less than 300° C.

11. The method according to claim 1 , wherein said heating is performed at a temperature of from about 160° C. to about 220° C.

12. The method according to claim 1 , further comprising, before forming a passivation layer:

forming an emitter area in said germanium substrate;

forming a back contact on a second surface of said germanium substrate and thereby realizing a back surface field; and

etching mesa structures so as to define photo voltaic cell regions.

13. The method according to claim 12 , further comprising forming an antireflective coating on exposed parts of the passivation layer and the contact layer, wherein said forming an antireflective coating is performed after the heating.

14. A photovoltaic device comprising:

a germanium substrate having a back surface, the germanium substrate further having therein an emitter, the emitter having a surface opposite the back surface of the germanium substrate;

a back contact on said back surface of said germanium substrate providing a back surface field;

a passivation layer of plasma enhanced chemical vapor deposition (PECVD) deposited amorphous silicon material formed on said emitter surface;

a contacting layer comprising a conductive material formed on said passivation layer, wherein a conductive path is formed between the contacting layer and the emitter by particles of said conductive material having diffused into said passivation layer;

photovoltaic cell regions; and

an antireflective coating on exposed parts of said passivation layer and said contact layer.

15. The method according to claim 12 , wherein a germanium solar cell, a thermophotovoltaic cell or a photodetector comprises the emitter.

Assignments (3)
"IMEC" IS AN ALTERNATIVE OFFICIAL NAME FOR "INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW" Recorded Apr 7, 2010
From: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW
To: IMEC
Reel/Frame 024200/0675 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 1, 2005
From: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
To: UMICORE N.V.
Reel/Frame 016333/0919 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 7, 2004
From: POSTHUMA, NIELS; FLAMAND, GIOVANNI; POORTMANS, JEF
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 015087/0405 →