Solid-state imaging apparatus and manufacturing method thereof
View Patent ↗The present invention aims to provide a solid-state apparatus and a manufacturing method thereof, the solid-state apparatus having both high transfer efficiency in a horizontal transfer CCD and efficient breakdown voltage in a vertical transfer CCD and including a semiconductor substrate 110 , first layer poly-silicon electrodes 120 and second layer poly-silicon electrodes 130 which form two layered overlap poly-silicon electrodes, an embedded channel region 140 which is formed in a surface unit of the semiconductor substrate 110 and becomes a transfer path for signal charge, and a photodiode region where photodiodes are aligned two-dimensionally, the photodiodes converting light into signal charge and accumulating the signal charge, wherein an inter-electrode distance c in the horizontal transfer CCD is shorter than an inter-electrode distance a in the vertical transfer CCD.
1. A manufacturing method of a solid-state imaging apparatus, comprising:
a step of forming first transfer electrodes of a vertical transfer CCD and a horizontal transfer CCD on a semiconductor substrate;
a step of forming first oxide films over each of the first transfer electrodes;
a step of opening a region that includes only the first transfer electrodes of the horizontal transfer CCD and forming a resist layer which covers all other regions;
a step of selectively removing the first oxide films formed over the first transfer electrodes of the horizontal transfer CCD;
a step of forming a potential barrier region by implanting ions between the first transfer electrodes of the horizontal transfer CCD;
a step of removing said resist layer;
a step of forming a second oxide film over each of the first transfer electrodes of the vertical transfer CCD and the horizontal transfer CCD; and
a step of forming second transfer electrodes between the first transfer electrodes of the vertical transfer CCD and the horizontal transfer CCD.
2. The manufacturing method of the solid-state imaging apparatus according to claim 1 ,
wherein the first oxide films are removed by wet etching.
3. A manufacturing method of a solid-state imaging apparatus, comprising:
a step of forming first transfer electrodes of a vertical transfer CCD and a horizontal transfer CCD on a semiconductor substrate;
a step of forming a first oxide film over each of the first transfer electrodes;
a step of opening a region that includes the first transfer electrodes of the horizontal transfer CCD and a part of the horizontal transfer CCD side at a final step of the first transfer electrodes of the vertical transfer CCD and forming a resist layer which covers all other regions;
a step of selectively removing the first oxide films formed over the first transfer electrodes of the horizontal transfer CCD and the part of the horizontal transfer CCD side at the final step of the first transfer electrodes of the vertical transfer CCD;
a step of forming a potential barrier region by implanting ions between the first transfer electrodes of the horizontal transfer CCD and between the final step of the first transfer electrodes of the vertical transfer CCD and the first transfer electrode of the horizontal transfer CCD;
a step of removing said resist layer;
a step of forming a second oxide film over each of the first transfer electrodes of the vertical transfer CCD and the horizontal transfer CCD; and
a step of forming second transfer electrodes between the first transfer electrodes of the vertical transfer CCD and the horizontal transfer CCD.