IP Library Granted Patent US 7,010,864
Granted Patent B2
US 7,010,864 · App. 10/852,417 · Granted Mar 14, 2006

Terminal examination jig

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Quick Facts
Patent No.
US 7,010,864
App. No.
10/852,417
Granted
Mar 14, 2006
Kind
B2
Abstract

A terminal examination jig 10 includes a jig body 12 having a gauge receiving portion 13 and a terminal holding portion 20 , and a limit gauge 28 releasably supported pivotally on a support pin 14 extending through the gauge receiving portion 13 in a bridging manner. The terminal receiving portion 20 has a fixing surface 23 a against which a bottom surface of a terminal (an object to be examined) is adapted to abut, and a fixing screw 25 for pressing the terminal against the fixing surface 23 a to hold the terminal is provided at the terminal receiving portion 20 . The limit gauge 28 has an opening portion 30 which is formed into a shape corresponding to the shape of an electrical contact portion of the terminal. Whether or not the bending of the terminal is within a tolerance is judged by checking whether or not the electrical contact portion can pass through the opening portion 30 without interference when the limit gauge 28 is pivotally moved about the support pin 14.

Claims (14)

1. A terminal examination jig comprising:

a jig body including a gauge receiving portion and a terminal holding portion; and

a limit gauge received in said gauge receiving portion, said limit gauge having an opening portion corresponding in shape to an electrical contact portion of said terminal;

wherein the limit gauge moves in a direction orthogonal to a terminal deformation and to the axial direction of the electrical contact portion being inspected.

2. A terminal examination jig as claimed in claim 1 , wherein whether or not the bending of said terminal is within a predetermined tolerance is judged by checking whether or not said electrical contact portion of said terminal, projecting toward said limit gauge, can pass through said opening portion without interference.

3. A terminal examination jig according to claim 1 , wherein said terminal holding portion has a fixing surface against which a base surface of said terminal is adapted to abut and a fixing member for pressing said terminal against said fixing surface to fix the terminal.

4. A terminal examination jig according to claim 1 , wherein said gauge receiving portion has a guide surface for an outer surface of said limit gauge.

5. A terminal examination jig according to claim 1 , wherein said limit gauge is pivotally supported on said jig body.

6. A terminal examination jig according to claim 1 , wherein said gauge receiving portion has a support pin, and said limit gauge is pivotally supported by said support pin.

7. A terminal examination jig according to claim 1 , wherein a width of said opening portion is substantially equal to an allowable amount of bending of said terminal.

8. A terminal examination jig comprising:

a jig body including a gauge receiving portion and a terminal holding portion; and

a limit gauge received in said gauge receiving portion, said limit gauge having an opening portion corresponding in shape to an electrical contact portion of said terminal;

wherein the limit gauge is rotatable with respect to the electric contact portion.

Assignments (2)
CHANGE OF ADDRESS Recorded Jun 5, 2023
From: YAZAKI CORPORATION
To: YAZAKI CORPORATION
Reel/Frame 063845/0802 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2004
From: MURAKAMI, TAKAO
To: YAZAKI CORPORATION
Reel/Frame 015384/0929 →