IP Library Granted Patent US 7,587,175
Granted Patent B2
US 7,587,175 · App. 10/854,884 · Granted Sep 8, 2009

Radio frequency unit analog level detector and feedback control system

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,587,175
App. No.
10/854,884
Granted
Sep 8, 2009
Kind
B2
Abstract

A Radio Frequency (RF) transceiver includes a baseband processor, a receiver section, and a transmitter section. The receiver section communicatively couples to the baseband processor and includes a plurality of tuned RF circuits. The transmitter section communicatively couples to the baseband processor and includes a plurality of tuned RF circuits. In a calibration operation, the transmitter section applies a RF test signal to its plurality of tuned RF circuits. The baseband processor applies a plurality of tuning control settings to each the tuned RF circuit. The baseband processor, for each of the plurality of tuning control settings, measures an output of the tuned RF circuit. The baseband processor selects a tuning control setting for the tuned RF circuit based upon at least one measured output of the tuned RF circuit. Finally, the baseband processor is operable to apply a selected tuning control setting to the tuned RF circuit.

Claims (84)

1. A method for calibrating a Radio Frequency (RF) transceiver comprising:

producing a RF test signal;

applying the RF test signal to a plurality of tuned RF circuits of the RF transceiver such that each one of the plurality of tuned RF circuits has a respective power detector coupled thereto;

for each of the plurality of tuned RF circuits:

applying each of a plurality of tuning control settings to the tuned RF circuit;

for each of the plurality of tuning control settings, measuring an output of the respective power detector coupled to the tuned RF circuit that is representative of an output of the tuned RF circuit; and

selecting a tuning control setting for the tuned RF circuit based upon at least one measured output of the tuned RF circuit; and

applying a plurality of selected tuning control settings to the plurality of tuned RF circuits.

2. The method of claim 1 , wherein each of the plurality of tuning control settings corresponds to a switched capacitor setting of the tuned RF circuit.

3. The method of claim 1 , wherein each of the plurality of tuning control settings corresponds to a switched inductor setting of the tuned RF circuit.

4. The method of claim 1 , wherein each of the plurality of tuning control settings corresponds to:

a switched capacitor setting of the tuned RF circuit; and

a switched inductor setting of the tuned RF circuit.

5. The method of claim 1 , wherein selecting a tuning control setting for the tuned RF circuit based upon at least one measured output of the tuned RF circuit comprises selecting a tuning control setting that produces a maximum measured signal level output of the tuned RF circuit for the RF test signal.

6. The method of claim 1 , wherein the RF test signal emulates a RF signal operated upon by the RF transceiver.

7. The method of claim 1 , wherein producing the RF test signal comprises:

applying a baseband test signal to a transmitter section of the RF transceiver; and

the transmitter section of the RF transceiver up converting the baseband test signal to produce the RF test signal.

8. The method of claim 1 , wherein applying the RF test signal to a plurality of tuned RF circuits of the RF transceiver comprises:

operating upon the RF test signal by a transmitter section of the RF transceiver;

coupling back at least a portion of the RF test signal from an output of the transmitter section of the RF transceiver to an input of a receiver section of the RF transceiver; and

operating upon the RF test signal by a receiver section of the RF transceiver.

9. The method of claim 1 , wherein:

producing the RF test signal comprises:

applying a baseband test signal to a transmitter section of the RF transceiver; and

the transmitter section up converting the baseband test signal to produce the RF test signal; and

applying the RF test signal to a plurality of tuned RF circuits of the RF transceiver comprises:

operating upon the RF test signal by a transmitter section of the RF transceiver;

coupling back at least a portion of the RF test signal from an output of the transmitter section of the RF transceiver to an input of a receiver section of the RF transceiver; and

operating upon the RF test signal by a receiver section of the RF transceiver.

10. The method of claim 1 , wherein the tuning control settings are determined during at least one of start up, reset, and idle periods of the RF transceiver.

11. A Radio Frequency (RF) transceiver comprising:

a baseband processor;

a receiver section communicatively coupled to the baseband processor; and

a transmitter section communicatively coupled to the baseband processor that includes a plurality of tuned RF circuits and a plurality of power detectors, each of which communicatively couples to an output of a respective tuned RF circuit, and each of which is operable to produce an output representative of an output produced by the respective tuned RF circuit; and

wherein in a calibration operation:

the transmitter section is operable to apply a RF test signal to its plurality of tuned RF circuits; and

for each of the plurality of tuned RF circuits of the transmitter section, the baseband processor is operable to:

apply a plurality of tuning control settings to the tuned RF circuit;

for each of the plurality of tuning control settings, measure an output of the power detector coupled to the respective tuned RF circuit that is representative of the output of the tuned RF circuit;

select a tuning control setting for the tuned RF circuit based upon at least one measured output of the tuned RF circuit; and

apply the selected tuning control setting to the tuned RF circuit.

12. The RF transceiver of claim 11 , wherein in the calibration operation:

the baseband processor is operable to produce a baseband test signal to the transmitter section; and

the transmitter section of the RF transceiver is operable to up convert the baseband test signal to produce the RF test signal.

13. The RF transceiver of claim 11 , wherein each of the plurality of tuning control settings corresponds to a switched capacitor setting of the tuned RF circuit.

14. The RF transceiver of claim 11 , wherein each of the plurality of tuning control settings corresponds to a switched inductor setting of the tuned RF circuit.

15. The RF transceiver of claim 11 , wherein each of the plurality of tuning control settings corresponds to:

a switched capacitor setting of the tuned RF circuit; and

a switched inductor setting of the tuned RF circuit.

16. The RF transceiver of claim 11 , wherein in selecting a tuning control setting for the tuned RF circuit based upon at least one measured output of the tuned RF circuit, the baseband processor is operable to select a tuning control setting that produces a maximum measured signal level output of the tuned RF circuit for the RF test signal.

17. The RF transceiver of claim 11 , wherein the RF test signal emulates a RF signal operated upon by the RF transceiver.

18. The RF transceiver of claim 11 , wherein the baseband processor is operable to determine the tuning control settings during at least one of start up, reset, and idle periods of the RF transceiver.

19. The RF transceiver of claim 11 , wherein:

the RF transceiver is implemented within a laptop host computer, a personal digital assistant host, a personal computer host, or a cellular telephone host.

20. The RF transceiver of claim 11 , further comprising a multiplexer having a plurality of inputs coupled to a plurality of outputs of the plurality of power detectors, an output coupled to the baseband processor, and a selection input coupled to receive a selection signal from the baseband processor.

21. A Radio Frequency (RF) transceiver comprising:

a baseband processor;

a receiver section communicatively coupled to the baseband processor that includes a plurality of tuned RF circuits and a plurality of power detectors, each of which communicatively couples to an output of a respective tuned RF circuit, and each of which is operable to produce an output representative of an output produced by the respective tuned RF circuit; and

a transmitter section communicatively coupled to the baseband processor; and

wherein in a calibration operation:

the receiver section is operable to apply a RF test signal to its plurality of tuned RF circuits; and

for each of the plurality of tuned RF circuits of the receiver section, the baseband processor is operable to:

apply a plurality of tuning control settings to the tuned RF circuit;

for each of the plurality of tuning control settings, measure an output of the power detector coupled to the respective tuned RF circuit that is representative of the output of the tuned RF circuit;

select a tuning control setting for the tuned RF circuit based upon at least one measured output of the tuned RF circuit; and

apply the selected tuning control setting to the tuned RF circuit.

22. The RF transceiver of claim 21 :

further comprising coupling between an output of the transmitter section and an input of the receiver section; and

wherein in the calibration operation:

the baseband processor is operable to produce a baseband test signal to the transmitter section;

the transmitter section of the RF transceiver is operable to up convert the baseband test signal to produce the RF test signal at its output; and

the coupling is operable to couple the RF test signal to the input of the receiver section.

23. The RF transceiver of claim 21 , wherein each of the plurality of tuning control settings corresponds to a switched capacitor setting of the tuned RF circuit.

24. The RF transceiver of claim 21 , wherein each of the plurality of tuning control settings corresponds to a switched inductor setting of the tuned RF circuit.

25. The RF transceiver of claim 21 , wherein each of the plurality of tuning control settings corresponds to:

a switched capacitor setting of the tuned RF circuit; and

a switched inductor setting of the tuned RF circuit.

26. The RF transceiver of claim 21 , wherein in selecting a tuning control setting for the tuned RF circuit based upon at least one measured output of the tuned RF circuit, the baseband processor is operable to select a tuning control setting that produces a maximum measured signal level output of the tuned RF circuit for the RF test signal.

27. The RF transceiver of claim 21 , wherein the RF test signal emulates a RF signal operated upon by the RF transceiver.

28. The RF transceiver of claim 21 , wherein the baseband processor is operable to determine the tuning control settings during at least one of start up, reset, and idle periods of the RF transceiver.

29. The RF transceiver of claim 21 , wherein:

the RF transceiver is implemented within a laptop host computer, a personal digital assistant host, a personal computer host, or a cellular telephone host.

30. The RF transceiver of claim 21 , further comprising a multiplexer having a plurality of inputs coupled to a plurality of outputs of the plurality of power detectors, an output coupled to the baseband processor, and a selection input coupled to receive a selection signal from the baseband processor.

Assignments (5)
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER PREVIOUSLY RECORDED AT REEL: 047195 FRAME: 0827. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Nov 5, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047924/0571 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047195/0827 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: BROADCOM CORPORATION
Reel/Frame 041712/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2017
From: BROADCOM CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041706/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: BROADCOM CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037806/0001 →