Method and a test setup for measuring large-signal S-parameters that include the coefficients relating to the conjugate of the incident waves
View Patent ↗The values of the 6 complex parameters of a large-signal S-parameter model of a high frequency device-under-test are determined by using a frequency-offset probe-tone method. A relatively large one tone signal is applied to the input port of the device and a relatively small one tone signal having a frequency offset relative to the frequency of this large one tone signal is applied to the output port of the device. The 6 large-signal S-parameters are found by measuring and processing the spectral components of the incident and the scattered voltage waves at the device signal ports. These spectral components appear at 3 frequencies: at the frequency of the large one tone signal, at the frequency of the small one tone signal and at the frequency of the large one tone signal minus the frequency offset of the small one tone signal.
1. A method for characterizing a device under test (DUT) comprising the steps of:
providing a first sinusoidal signal having a first frequency to a first signal port of said DUT as a power tone signal;
providing a second signal having a second frequency to a second signal port of said DUT as a probe tone signal, whereby the difference between said second frequency and said first frequency is equal to a third frequency and whereby the amplitude of said second signal is such that there exists a non-analytic substantially linear relationship between the spectral components of the traveling voltage waves that are incident to said DUT signal ports and that have said second frequency and the spectral components of the traveling voltage waves that are scattered by said DUT signal ports and that have a frequency equal to said first frequency minus said third frequency; and
determining the spectral components of the traveling voltage waves that are incident to said DUT signal ports and the spectral components of the traveling voltage waves that are scattered by said DUT signal ports, whereby said spectral components are determined for a frequency equal to said first frequency, equal to said second frequency and equal to said first frequency minus said third frequency.
2. The method of claim 1 , further including the step of using said spectral components for calculating “large-signal S-parameters” of said DUT, whereby said “large-signal S-parameters” include coefficients that relate scattered voltage waves with a complex conjugate of a voltage wave that is incident on said second signal port of said DUT.
3. The method of claim 2 , whereby said first signal and said second signal are provided to said DUT in a circuit simulator and whereby said determination of said spectral components is provided by performing a circuit simulation.