IP Library Granted Patent US 7,057,807
Granted Patent B2
US 7,057,807 · App. 10/860,517 · Granted Jun 6, 2006

Microscope

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Quick Facts
Patent No.
US 7,057,807
App. No.
10/860,517
Granted
Jun 6, 2006
Kind
B2
Abstract

Microscope, particularly a stereomicroscope, for simultaneous observation of an object by a first and a second observer, comprising a main objective ( 2 ) having an optical axis ( 2 a ); an optical viewing path; a plurality of deflector elements ( 5, 6, 7 ) for deflecting the optical viewing path into a first plane I extending at an angle to the optical axis of the main objective and subsequently into a second plane II substantially parallel to and above the first plane I; an uncoupling device ( 7 ) in the optical viewing path for uncoupling an optical viewing path of the second observer from an optical viewing path of the first observer; and a deflector element ( 20 ) for deflecting the optical viewing path of the second observer into a third plane III which extends substantially parallel to the first and second planes I, II, wherein the second plane II is located between the first plane I and the third plane III.

Claims (16)

1. A microscope for simultaneous observation of an object by a first and a second observer, the microscope comprising:

a main objective having an optical axis;

an optical viewing path;

a plurality of deflector elements for deflecting the optical viewing path into a first plane (I) extending at an angle to the optical axis of the main objective and subsequently into a second plane (II) substantially parallel to and above the first plane (I);

an uncoupling device in the optical viewing path for uncoupling an optical viewing path of the second observer from an optical viewing path of the first observer;

a deflector element for deflecting the optical viewing path of the second observer into a third plane (III) which extends substantially parallel to the first and second planes (I, II), the second plane (II) being located between the first plane (I) and the third plane (III); and

a magnification system in the second plane (II) for the first observer, and another magnification system in the third plane (III) for the second observer.

2. The microscope according to claim 1 , wherein the first plane (I) extends substantially perpendicularly to the optical axis of the main objective.

3. The microscope according to claim 1 , wherein at least one of the magnification systems comprises a zoom system.

4. The microscope according claim 1 , wherein the optical viewing path of the first observer is rotatable in the second plane (II) by rotation of one of the plurality of deflector elements.

5. The microscope according claim 1 , wherein the optical viewing path of the second observer is rotatable in the third plane (III) by rotation of the deflector element for deflecting the optical viewing path of the second observer into third plane (III).

6. The microscope according claim 1 , wherein at least one of the plurality of deflector elements is semi-transparent.

7. The microscope according claim 1 , wherein the deflector element for deflecting the optical viewing path of the second observer into third plane (III) is semi-transparent.

8. The microscope according to claim 1 , wherein the optical viewing path of the first observer, after passing through the main objective, is split into two stereoscopic optical viewing paths in the magnification system in the second plane (II).

9. The microscope according to claim 1 , wherein the optical viewing path of the second observer, after passing through the main objective, is split into two stereoscopic optical viewing paths in the magnification system in the third plane (III).

10. The microscope according claim 1 , further comprising means for coupling the magnification system in the second plane (II) with the magnification system in the third plane (III).

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2010
From: LEICA MICROSYSTEMS (SCHWEIZ) AG
To: LEICA INSTRUMENTS (SINGAPORE) PTE. LTD.
Reel/Frame 024128/0669 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2010
From: LEICA MICROSYSTEMS (SCHWEIZ) AG
To: LEICA INSTRUMENTS PTE. LTD.
Reel/Frame 023741/0870 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2004
From: SANDER, ULRICH
To: LEICA MICROSYSTEMS (SCHWEIZ) AG
Reel/Frame 015436/0168 →