Differential numerical aperture methods
View Patent ↗Methods for differential numerical aperture analysis of samples, utilizing angle-of-incidence measurements resulting from variable illumination or observation numerical apertures, or both. Metrology applications are provided, and more particularly including scatterometer, ellipsometer and similar analysis methods, including bi-directional reflectance or transmission distribution function measurement.
1. A method for determining parameters of a structure disposed on a wafer comprising the steps of:
generating a beam of light focused on a structure disposed on a wafer;
providing an illumination and observation numerical aperture, the illumination numerical aperture being disposed along the incident path of the beam of light and the observation numerical aperture being disposed along the reflected path of the beam of light;
differentially changing the aperture of at least one of the illumination and observation numerical apertures;
detecting and characterizing the scattered light along the reflected path; and
determining parameters of the structure.
2. The method of claim 1 , wherein the apertures of both the illumination and observation numerical aperture are differentially changed.
3. The method of claim 1 , wherein the illumination numerical aperture is varied over a numerical range from 0 to about 1.
4. The method of claim 1 , wherein the observation numerical aperture is varied over a numerical range from 0 to about 1.
5. The method of claim 1 , wherein the illumination and observation numerical aperture each have a value less than 1.0.
6. The method of claim 5 , wherein the illumination numerical aperture is less than the observation numerical aperture.
7. The method of claim 5 , wherein the observation numerical aperture is less than the illumination numerical aperture.
8. The method of claim 1 , wherein detecting and characterizing the scattered light comprises angle-resolved scatterometry.
9. The method of claim 1 , wherein detecting and characterizing the scattered light comprises ellipsometry.
10. The method of claim 1 , wherein detecting and characterizing the scattered light comprises a bi-directional reflectance distribution function measurement.
11. The method of claim 10 , wherein the bi-directional reflectance distribution function measure is at a single wavelength.
12. The method of claim 10 , wherein the bi-directional reflectance distribution function measure is spectroscopic.
13. The method of claim 1 , further comprising the steps of:
polarizing the light striking the structure; and
polarizing the light scattered from the structure.
14. The method of claim 1 , wherein at least one of the illumination and observation numerical aperture comprises a member selected from the group consisting of an aperture with an iris, a zoom lens assembly, a variable beam expander, a variable aperture stop magnification imaging assembly, a spatial Fourier transform of the aperture stop assembly and a combination of the foregoing.
15. The method of claim 1 , wherein detecting and characterizing comprises use of a device selected from the group consisting of a photodetector and a spectrometer.
16. The method of claim 1 , wherein detecting and characterizing comprises a computer-compatible output for recording data relating to receipt and characterization of light.
17. The method of claim 1 , wherein the beam of light is coherent.
18. The method of claim 1 , wherein the beam of light is incoherent.
19. The method of claim 1 , wherein the beam of light is monochromatic.