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App. No. 10/868,838 · Confirmation No. 6800

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

Abandoned -- Failure to Pay Issue Fee View Publication ↗
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 Code Description Pages PDF
2005-03-23 ABN Abandonment 2 View
2005-01-14 CTMS Miscellaneous Action with shortened statutory period (SSP) 1 View
2004-11-19 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2004-11-19 NOA Notice of Allowance and Fees Due (PTOL-85) 4 View
2004-11-19 892 List of references cited by examiner 1 View
2004-11-19 1449 List of References cited by applicant and considered by examiner 2 View
2004-11-19 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2004-11-19 SRFW Search information including classification, databases and other search related notes 1 View
2004-11-19 FWCLM Index of Claims 1 View
2004-11-19 SPEC Specification 1 View
2004-11-19 BIB Bibliographic Data Sheet 1 View
2004-08-06 A.PE Preliminary Amendment 1 View
2004-08-06 CLM Claims 11 View
2004-08-06 REM Applicant Arguments/Remarks Made in an Amendment 3 View
2004-08-06 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2004-08-06 FOR Foreign Reference 41 View
2004-08-06 FOR Foreign Reference 73 View
2004-06-17 TRNA Transmittal of New Application 2 View
2004-06-17 SPEC Specification 51 View
2004-06-17 CLM Claims 7 View
2004-06-17 ABST Abstract 1 View
2004-06-17 DRW Drawings-only black and white line drawings 34 View
2004-06-17 OATH Oath or Declaration filed 4 View
2004-06-17 A.PE Preliminary Amendment 1 View
2004-06-17 SPEC Specification 1 View
2004-06-17 REM Applicant Arguments/Remarks Made in an Amendment 1 View
2004-06-17 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2004-06-17 FRPR Certified Copy of Foreign Priority Application 1 View
2004-06-17 WFEE Fee Worksheet (SB06) 1 View
2004-06-17 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
10/868,838
Filed
2004-06-17
Pub. No.
US20040235248A1
Examiner
LE, THAO P
Art Unit
2818