Architecture of an efficient at-speed programmable memory built-in self test
View Patent ↗A method of testing an embedded memory at speed within an integrated circuit which includes providing a memory built in self test sequencer module, providing a satellite engine module coupled to the memory built in self test sequencer module and applying a march test to the embedded memory via the satellite engine module based upon information stored within the instruction buffer. The satellite engine module includes an instruction buffer and a sequence generation engine.
1. A method of testing an embedded memory at speed within an
integrated circuit comprising:
providing a memory built in self test sequencer module;
providing a satellite engine module coupled to the memory built in self test sequencer module, the satellite engine module including an instruction buffer and a sequence generation engine, the sequence generation engine includes a look ahead module, the look ahead module determining a mode of operation of a next instruction while a present instruction is executing by the sequence generation engine;
applying a march test to the embedded memory via the satellite engine module based upon information stored within the instruction buffer.
2. The method of claim 1 wherein the sequence generation engine includes a state machine, the state machine executing components of the march test.
3. The method of claim 1 wherein the sequence generation engine includes a rewind module, the rewind module rewinding the instruction buffer to an initial state.
4. The method of claim 1 wherein the instruction buffer initializes the sequence generation engine to an initial march test.
5. A programmable memory built in self test apparatus for testing an embedded memory at speed within an integrated circuit comprising:
a memory built in self test sequencer module;
a satellite engine module coupled to the memory built in self test sequencer module, the satellite engine module including an instruction buffer and a sequence generation engine, the sequence generation engine includes a look ahead module, the look ahead module determining a mode of operation of a next instruction while a present instruction is executing by the sequence generation engine, the satellite engine module applying a march test to the embedded memory based upon information stored within the instruction buffer.
6. The programmable memory built in self test apparatus of claim 5 wherein the sequence generation engine includes a state machine, the state machine executing components of the march test.
7. The programmable memory built in self test apparatus of claim 5 wherein the sequence generation engine includes a rewind module, the rewind module rewinding the instruction buffer to an initial state.
8. The programmable memory built in self test apparatus of claim 5 wherein the instruction buffer initializes the sequence generation engine to an initial march test.
9. A programmable memory built in self test apparatus for testing a plurality of embedded memories at speed within an integrated circuit comprising:
a memory built in self test sequencer module;
a plurality of satellite engine modules coupled to the memory built in self test sequencer module and to the plurality of embedded memories, each of the plurality of satellite engine modules including an instruction buffer and a sequence generation engine, the sequence generation engine includes a look ahead module, the look ahead module determining a mode of operation of a next instruction while a present instruction is executing by the sequence generation engine each of the plurality of satellite engine modules applying a march test to a respective embedded memory based upon information stored within the respective instruction buffer.
10. The programmable memory built in self test apparatus of claim 9 wherein the sequence generation engine includes a state machine, the state machine executing components of the march test.
11. The programmable memory built in self test apparatus of claim 9 wherein the sequence generation engine includes a rewind module, the rewind module rewinding the instruction buffer to an initial state.
12. The programmable memory built in self test apparatus of claim 9 wherein the instruction buffer initializes the sequence generation engine to an initial march test.
13. A processor comprising:
a plurality of functional units, each of the functional units including a respective embedded memory;
a programmable memory built in self test module for testing the respective embedded memory, the programmable built in self test module including a memory built in self test sequencer module;
a plurality of satellite engine modules coupled to the memory built in self test sequencer module and to a respective embedded memory, each of the plurality of satellite engine modules including an instruction buffer and a sequence generation engine, the sequence generation engine includes a look ahead module, the look ahead module determining a mode of operation of a next instruction while a present instruction is executing by the sequence generation engine, each of the plurality of satellite engine modules applying a march test to the respective embedded memory based upon information stored within the instruction buffer.
14. The processor of claim 13 wherein the sequence generation engine includes a state machine, the state machine executing components of the march test.
15. The processor of claim 13 wherein the sequence generation engine includes a rewind module, the rewind module rewinding the instruction buffer to an initial state.
16. The processor of claim 13 wherein the instruction buffer initializes the sequence generation engine to an initial march test.