Method for non-destructive testing
View Patent ↗Non-destructive testing method may include providing a source material that emits positrons in response to bombardment of the source material with photons. The source material is exposed to photons. The source material is positioned adjacent the specimen, the specimen being exposed to at least some of the positrons emitted by the source material. Annihilation gamma rays emitted by the specimen are detected.
1. A non-destructive testing method, comprising:
providing a source material, the source material comprising matter in a solid state;
bombarding the source material with photons so that the source material emits positrons;
placing the source material adjacent a specimen to be tested;
detecting annihilation gamma rays emitted by the specimen; and
moving the source material away from the specimen before detecting annihilation gamma rays.
2. The method of claim 1 , wherein placing the source material adjacent a specimen to be tested comprises placing the source material in contact with the specimen.
3. The method of claim 1 , wherein placing the source material adjacent a specimen to be tested comprises conforming at least a portion of the source material to at least a portion of the specimen.
4. The method of claim 1 , wherein bombarding the source material with photons comprises bombarding the source material with photons having energies in a range of about 9 MeV to about 21 MeV.
5. The method of claim 1 , wherein positrons emitted by the source material have energies in a range of about 0.5 MeV to about 5 MeV.