Custom logic BIST for memory controller
View Patent ↗A method and system for testing a memory controller are provided herein. A test sequence may be generated within the memory controller. A test output may also be generated within the memory controller, where the test output is associated with the test sequence. The test output may then be verified. The test sequence may comprise one or more of a control command, a memory address, and/or a DQM signal. The test output may be generated by a sequencer. The test output may be verified by a cyclic redundancy check (CRC) module. The test sequence may also comprise random write data. The random write data may be communicated to a memory controller write data output via a write data bus.
1. A method for testing a memory controller, the method comprising:
generating a test sequence within the memory controller;
generating a test output within the memory controller, the test output representing an output for the test sequence; and
verifying the test output;
wherein the test sequence comprises at least one of a control command, a memory address, and a DQM signal.
2. The method of claim 1 , wherein the test output is generated by a sequencer.
3. The method of claim 1 , wherein the test output is verified by a cyclic redundancy check (CRC) module.
4. The method of claim 1 , wherein the test sequence comprises random write data.
5. The method of claim 4 , further comprising communicating the random write data to a memory controller write data output via a write data bus.
6. The method of claim 5 , further comprising:
communicating the random write data to a read data bus from the memory controller write data output; and
verifying the random write data sampled from the read data bus.
7. The method of claim 1 , wherein the test sequence comprises random read data.
8. The method of claim 7 , further comprising:
communicating the random read data to a sequencer via a read data bus; and
generating a test output by the sequencer, the sequencer utilizing the random read data.
9. A system for testing a memory controller, the system comprising:
a first circuit for generating a test sequence within the memory controller;
a second circuit for inputting the test sequence and capturing a test output, the test output being generated responsive to the test sequence; and
a third circuit for verifying the test output; and
wherein the test sequence comprises at least one of a control command, a memory address and a DQM signal.
10. The system of claim 9 , wherein the memory logic circuit comprises a sequencer.
11. The system of claim 9 , wherein the third circuit comprises a cyclic redundancy check (CRC) module.
12. The system of claim 9 , wherein the test sequence comprises random write data.
13. The system of claim 12 , further comprising:
a write data bus for communicating the random write data to a memory controller write data output; and
a read data bus communicatively coupled to the write data bus and the testing circuit.
14. The system of claim 13 , further comprising a cyclic redundancy check module for verifying the random write data sampled from the read data bus.
15. The system of claim 9 , wherein the test sequence comprises random read data.
16. The system of claim 15 , further comprising a read data bus for communicating the random read data to the memory logic circuit.