IP Library Granted Patent US 7,045,814
Granted Patent B2
US 7,045,814 · App. 10/875,478 · Granted May 16, 2006

OFET structures with both n- and p-type channels

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Quick Facts
Patent No.
US 7,045,814
App. No.
10/875,478
Granted
May 16, 2006
Kind
B2
Abstract

The present invention provides a dual organic field-effect transistor (OFET) structure and a method of fabricating the structure. The dual OFET structure includes an n-type organic semiconductor layer and a p-type organic semiconductor layer in contact with each other along an interface and forming a stack. The dual OFET structure also includes a source electrode and a drain electrode, the source and drain electrodes being in contact with one of the organic semiconductor layers. The dual OFET structure further includes first and second gate structures located on opposite sides of the stack. The first gate structure is configured to control a channel region of the n-type organic semiconductor layer, and the second gate structure is configured to control a channel region of the p-type organic semiconductor layer.

Claims (18)

1. A dual organic field effect transistor (OFET) structure, comprising:

an n-type organic semiconductor layer and a p-type organic semiconductor layer in contact with each other along an interface and forming a stack;

a source electrode and a drain electrode, said source and drain electrodes being in contact with one of said organic semiconductor layers; and

first and second gate structures, said first gate structure and said second gate structure being located on opposite sides of said stack,

wherein said first gate structure is configured to control a channel region of said n-type organic semiconductor layer, and said second gate structure is configured to control a channel region of said p-type organic semiconductor layer.

2. The dual OFET structure of claim 1 , wherein said source and drain electrodes contact only one of said organic semiconductor layers.

3. The dual OFET structure of claim 1 , wherein said n-type organic semiconductor layer and said p-type organic semiconductor layer have substantially a same footprint.

4. The dual OFET structure of claim 1 , wherein one of said source and drain electrodes is a source or drain electrode for a channel in said p-type semiconductor layer and for a channel in said n-type semiconductor layer.

5. The dual OFET structure of claim 1 , wherein said one organic semiconductor layers is between said another one of said organic semiconductor layers and said source and drain electrodes.

6. The dual OFET structure of claim 1 , wherein said interface has a surface roughness of less than about 50 nanometers.

7. The dual OFET structure of claim 1 , wherein at least one of said organic semiconductor layer has thickness of at least about 5 nanometers.

8. The dual OFET structure of claim 1 , wherein said n-type organic semiconductor layer comprises FCuPc and said p-type organic semiconductor layer comprises pentacene.

9. The dual OFET structure of claim 1 , where said first gate structure includes a first gate dielectric layer between a first gate electrode and said n-type organic semiconductor layer and said second gate structure includes a second gate dielectric layer between a second gate electrode said p-type organic semiconductor layer.

10. The dual OFET structure of claim 1 , wherein at least one of said first or second gate dielectric layer comprises paralyene.

11. The dual OFET structure of claim 1 , further comprising

a third electrode in contact with said one of said organic semiconductor layer,

wherein said first gate structure is configured to control a conductivity between said source and drain electrode, and said second gate structure is configured to control a conductivity between said third electrode and said drain electrode.

12. The dual OFET structure of claim 11 , wherein said fast gate structure is between said source electrode and said drain electrode, and said second gate structure is between said drain electrode and said third electrode.

Assignments (11)
PATENT SECURITY AGREEMENT Recorded Aug 6, 2024
From: RPX CORPORATION; RPX CLEARINGHOUSE LLC
To: BARINGS FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 068328/0674 →
RELEASE OF LIEN ON PATENTS Recorded Aug 5, 2024
From: BARINGS FINANCE LLC
To: RPX CORPORATION
Reel/Frame 068328/0278 →
PATENT SECURITY AGREEMENT Recorded Apr 22, 2023
From: RPX CORPORATION
To: BARINGS FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 063429/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2021
From: PROVENANCE ASSET GROUP LLC
To: RPX CORPORATION
Reel/Frame 059352/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 30, 2021
From: CORTLAND CAPITAL MARKETS SERVICES LLC
To: PROVENANCE ASSET GROUP HOLDINGS LLC; PROVENANCE ASSET GROUP LLC
Reel/Frame 058983/0104 →
RELEASE OF SECURITY INTEREST Recorded Nov 30, 2021
From: NOKIA US HOLDINGS INC.
To: PROVENANCE ASSET GROUP HOLDINGS LLC; PROVENANCE ASSET GROUP LLC
Reel/Frame 058363/0723 →
ASSIGNMENT AND ASSUMPTION AGREEMENT Recorded Feb 14, 2019
From: NOKIA USA INC.
To: NOKIA US HOLDINGS INC.
Reel/Frame 048370/0682 →
CHANGE OF NAME Recorded Feb 7, 2019
From: LUCENT TECHNOLOGIES INC.
To: ALCATEL-LUCENT USA INC.
Reel/Frame 049887/0613 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2017
From: NOKIA TECHNOLOGIES OY; NOKIA SOLUTIONS AND NETWORKS BV; ALCATEL LUCENT SAS
To: PROVENANCE ASSET GROUP LLC
Reel/Frame 043877/0001 →
SECURITY INTEREST Recorded Sep 13, 2017
From: PROVENANCE ASSET GROUP HOLDINGS, LLC; PROVENANCE ASSET GROUP LLC
To: NOKIA USA INC.
Reel/Frame 043879/0001 →
SECURITY INTEREST Recorded Sep 13, 2017
From: PROVENANCE ASSET GROUP HOLDINGS, LLC; PROVENANCE ASSET GROUP, LLC
To: CORTLAND CAPITAL MARKET SERVICES, LLC
Reel/Frame 043967/0001 →