Method and apparatus for at-speed diagnostics of embedded memories
View Patent ↗A method of testing an embedded memory which includes providing a programmable memory built-in self-test module and using the programmable memory built-in self-test module to extract contents of the embedded memory upon detection of an error. The programmable memory built-in self-test module includes a pseudo binary search and stop on error function.
1. A method of testing an embedded memory comprising:
providing a programmable memory built in self test module;
beginning a memory built in self test of the embedded memory;
halting the self test on a selected cycle;
determining whether an error was detecting in the embedded memory; and
upon detection of the error, iteratively running the self test to isolate a particular cycle associated with the error; and
using the programmable memory built in self test module to extract contents of the embedded memory upon detection of the error.
2. The method of claim 1 wherein the programmable memory built in self test module includes a sequence module and an engine module, the engine module including a halt and resume capability.
3. The method of claim 2 wherein the engine module includes a compare module, the compare module including shadow registers, the shadow registers holding an actual data element of the embedded memory.
4. The method of claim 2 wherein the engine module includes a cycle counter, the cycle counter identifying the selected cycle of the memory built in self test.
5. The method of claim 1 further comprising:
generating an error signal upon detection of the error, the error signal being persistent.
6. A memory built in self test apparatus comprising:
a programmable memory built in self test module, the programmable memory built in self test module configured to perform the operations of:
beginning a memory built in self test of the embedded memory;
halting the self test on a selected cycle;
determining whether an error was detected in the embedded memory; and
upon detection of the error, iteratively running the self test to isolate a particular cycle associated with the error; and
the programmable memory built in self test module extracting contents of the embedded memory upon detection of the error.
7. The memory built in self test apparatus of claim 6 wherein the programmable memory built in self test module includes a sequence module and an engine module, the engine module including a halt and resume capability.
8. The memory built in self test apparatus of claim 7 wherein the engine module includes a compare module, the compare module including shadow registers, the shadow registers holding an actual data element of the embedded memory.
9. The memory built in self test apparatus of claim 7 wherein the engine module includes a cycle counter, the cycle counter identifying the cycle of the memory built in self test.
10. The memory built in self test apparatus of claim 6 wherein:
the engine module generates an error signal upon detection of the error, the error signal being persistent.
11. A processor comprising:
a functional unit, the functional unit including an embedded memory,
a programmable memory built in self test module, the programmable memory built in self test module configured to perform the operations of:
beginning a memory built in self test of the embedded memory;
halting the self test on a selected cycle;
determining whether an error was detected in the embedded memory; and
upon detection of the error, iteratively running the self test to isolate a particular cycle associated with the error; and
the programmable memory built in self test module extracting contents of the embedded memory upon detection of the error.
12. The processor of claim 11 wherein the programmable memory built in self test module includes a sequence module and an engine module, the engine module including a halt and resume capability.
13. The processor of claim 12 wherein the engine module includes a compare module, the compare module including shadow registers, the shadow registers holding an actual data element of the embedded memory.
14. The processor of claim 12 wherein the engine module includes a cycle counter, the cycle counter identifying the selected cycle of the memory built in self test.
15. The processor of claim 11 wherein:
the engine module generates an error signal upon detection of the error, the error signal being persistent.