IP Library Granted Patent US 7,202,955
Granted Patent B2
US 7,202,955 · App. 10/879,519 · Granted Apr 10, 2007

Spectrally diverse spectrometer and associated methods

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Quick Facts
Patent No.
US 7,202,955
App. No.
10/879,519
Granted
Apr 10, 2007
Kind
B2
Abstract

A spectrometer for use with a desired wavelength range includes an array of filters. Each filter outputs at least two non-contiguous wavelength peaks within the desired wavelength range. The array of filters is spectrally diverse over the desired wavelength range, and each filter in the array of filters outputs a spectrum of a first resolution. An array of detectors has a detector for receiving an output of a corresponding filter. A processor receives signals from each detector, and outputs a reconstructed spectrum having a second resolution, the second resolution being higher than any of the first resolution of each filter.

Claims (29)

1. A spectrometer for use with a desired wavelength range, comprising:

an array of filters, each filter outputting at least two non-contiguous wavelength peaks within the desired wavelength range, the array of filters being spectrally diverse over the desired wavelength range, wherein each filter in the array of filters outputs a spectrum of a first resolution;

an array of detectors, each detector receiving an output of a corresponding filter; and

a processor receiving signals from each detector, the processor outputting a reconstructed spectrum having a second resolution, the second resolution being higher than any of the first resolution of each filter.

2. The spectrometer as claimed in claim 1 , wherein each filter comprises:

a substrate; and

a pattern on the substrate, the pattern being in a material having a higher refractive index than that of the substrate.

3. The spectrometer as claimed in claim 2 , wherein the pattern has features on the order of or smaller than a wavelength of the desired wavelength range.

4. The spectrometer as claimed in claim 2 , wherein the pattern varies in at least one of depth and period across the array of filters.

5. The spectrometer as claimed in claim 2 , wherein input light is transmitted through the substrate and the pattern.

6. The spectrometer as claimed in claim 2 , wherein input light is reflected from the pattern.

7. The spectrometer as claimed in claim 2 , wherein a period of the pattern across the array of filters is on the order of or smaller than a wavelength of the desired wavelength range.

8. The spectrometer as claimed in claim 1 , wherein each filter includes an etalon.

9. The spectrometer as claimed in claim 8 , wherein etalons in the array of filters have varying cavity lengths.

10. The spectrometer as claimed in claim 9 , wherein the varying cavity length is realized by providing steps of varying height for each etalon.

11. The spectrometer as claimed in claim 9 , wherein the etalon is an air gap etalon and the varying cavity length is realized by providing air gaps of varying height for each etalon.

12. The spectrometer as claimed in claim 8 , wherein the etalon has a cavity length on an order of magnitude of a wavelength in the desired wavelength range.

13. The spectrometer as claimed in claim 8 , wherein the etalon is an air gap etalon.

14. The spectrometer as claimed in claim 8 , wherein the etalon is a solid etalon.

15. The spectrometer as claimed in claim 1 , wherein the processor outputs a reconstructed spectrum of input light by applying the inverse filter function to the signals output by the detectors.

16. The spectrometer as claimed in claim 1 , wherein outputs of the array of filters are substantially constant with respect to an angle of light incident thereon.

17. The spectrometer as claimed in claim 1 , wherein the array of filters is provided directly on the array of detectors.

18. The spectrometer as claimed in claim 1 , wherein any two filters in the array of filters have transmittance vectors that are linearly independent of one another and are not orthogonal.

19. The spectrometer as claimed in claim 1 , wherein multiple filters of the array of filters pass overlapping wavelength ranges.

20. The spectrometer as claimed in claim 1 , wherein each detector includes a plurality of sensing portions.

21. The spectrometer as claimed in claim 1 , wherein the array of filters is continuous.

22. A method of making a spectrometer for determining a wavelength of an input light signal within a desired wavelength range, comprising:

forming an array of filters, each filter outputting at least two non-contiguous wavelength peaks within the desired wavelength range, the array of filters being spectrally diverse over the desired wavelength range, wherein each filter in the array of filters outputs a spectrum of a first resolution and is varied across the array; and

providing an array of detectors, each detector receiving an output of a corresponding filter, wherein the wavelength of the input light signal is determined with a second resolution the second resolution being higher than the first resolution.

Assignments (6)
CORRECTIVE ASSIGNMENT TO CORRECT THE PATENT NO. 7817833 PREVIOUSLY RECORDED AT REEL: 027768 FRAME: 0541. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Oct 1, 2015
From: TESSERA NORTH AMERICA, INC.
To: DIGITALOPTICS CORPORATION EAST
Reel/Frame 036733/0896 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2015
From: DIGITALOPTICS CORPORATION; DIGITALOPTICS CORPORATION MEMS; FOTONATION LIMITED
To: NAN CHANG O-FILM OPTOELECTRONICS TECHNOLOGY LTD
Reel/Frame 034883/0237 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 14, 2014
From: DIGITALOPTICS CORPORATION EAST
To: DIGITALOPTICS CORPORATION
Reel/Frame 031965/0905 →
CHANGE OF NAME Recorded Feb 27, 2012
From: TESSERA NORTH AMERICA, INC.
To: DIGITALOPTICS CORPORATION EAST
Reel/Frame 027768/0541 →
CHANGE OF NAME Recorded Jul 15, 2010
From: DIGITAL OPTICS CORPORATION
To: TESSERA NORTH AMERICA, INC.
Reel/Frame 024697/0727 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 23, 2004
From: TEKOLSTE, ROBERT D.; KATHMAN, ALAN D.
To: DIGITAL OPTICS CORPORATION
Reel/Frame 016099/0666 →