IP Library Granted Patent US 7,389,452
Granted Patent B2
US 7,389,452 · App. 10/880,630 · Granted Jun 17, 2008

Methods and apparatus for monitoring internal signals in an integrated circuit

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Quick Facts
Patent No.
US 7,389,452
App. No.
10/880,630
Granted
Jun 17, 2008
Kind
B2
Abstract

Apparatus and methods are provided for debugging an integrated circuit. Local multiplexer circuits are provided near first and second circuit blocks in the integrated circuit. Each multiplexer circuit includes input nodes, a control node, and an output node. A first input node of the first multiplexer circuit is coupled to an internal node of the first circuit block, a first input node of the second multiplexer circuit is coupled to an internal node of the second circuit block, second input nodes of the first and second multiplexer circuits are coupled to logical 0, and the control signal nodes of the first and second multiplexer circuits are coupled to a control signal. An OR gate is provided that includes an input node coupled to the output node of the first multiplexer circuit, another input node coupled to the output node of the second multiplexer circuit, and an output node. The control signal is used to select the internal nodes of the first or second circuit blocks for monitoring at the output node of the OR gate.

Claims (42)

1. An integrated circuit comprising:

first and second circuit blocks each comprising a first internal node;

first and second multiplexer circuits each comprising first and second input nodes, a control node, and an output node, the first input node of the first multiplexer circuit coupled to the first internal node of the first circuit block, the first input node of the second multiplexer circuit coupled to the first internal node of the second circuit block, the second input nodes of the first and second multiplexer circuits coupled to logical 0, the control signal nodes of the first and second multiplexer circuits coupled to a control signal; and

an OR gate comprising a first input node coupled to the output node of the first multiplexer circuit, a second input node coupled to the output node of the second multiplexer circuit, and an output node;

wherein the control signal may be used to select the first internal node of the first circuit block or the first internal node of the second circuit block for monitoring at the output node of the OR gate.

2. The integrated circuit of claim 1 , wherein the first multiplexer circuit is located on an outside periphery of the first circuit block.

3. The integrated circuit of claim 1 , wherein the first multiplexer circuit is embedded within the first circuit block.

4. The integrated circuit of claim 1 , wherein the first multiplexer circuit is located on an outside periphery of the first circuit block, and the second multiplexer circuit is located on an outside periphery of the second circuit block.

5. The integrated circuit of claim 1 , wherein the first multiplexer circuit is embedded within the first circuit block, and the second multiplexer circuit is embedded within the second circuit block.

6. The integrated circuit of claim 1 , wherein the first input node of the first multiplexer circuit comprises a multi-bit input node.

7. The integrated circuit of claim 1 , wherein the first input node of the first multiplexer circuit comprises a single-bit input node.

8. The integrated circuit of claim 1 , wherein the control signal comprises a multi-bit signal.

9. The integrated circuit of claim 1 , wherein the control signal comprises an address.

10. The integrated circuit of claim 1 , further comprising an address bus coupled to the control nodes of the first and second multiplexer circuits.

11. The integrated circuit of claim 10 , further comprising a latch coupled between the address bus and the control nodes of the first and second multiplexer circuits.

12. The integrated circuit of claim 1 , wherein the output node of the OR gate comprises a first number of bits.

13. The integrated circuit of claim 12 , wherein the output node of the OR gate is coupled to a first number of external pins.

14. The integrated circuit of claim 12 , wherein the output node of the OR gate is coupled to a second number of external pins less than the first number of bits.

15. A method for debugging an integrated circuit, the method comprising:

providing first and second circuit blocks each comprising a first internal node;

providing first and second multiplexer circuits each comprising first and second input nodes, a control node, and an output node;

coupling the first input node of the first multiplexer circuit to the first internal node of the first circuit block;

coupling the first input node of the second multiplexer circuit to the first internal node of the second circuit block;

coupling the second input nodes of the first and second multiplexer circuits to logical 0;

coupling the control signal nodes of the first and second multiplexer circuits coupled to a control signal;

providing an OR gate comprising a first input node, a second input node and an output node;

coupling the first input node of the OR gate to the output node of the first multiplexer circuit;

coupling the second input node of the OR gate to the output node of the second multiplexer circuit; and

using the control signal to select the first internal node of the first circuit block or the first internal node of the second circuit block for monitoring at the output node of the OR gate.

16. The method of claim 15 , further comprising providing the first multiplexer circuit is located on an outside periphery of the first circuit block.

17. The method of claim 15 , further comprising embedding the first multiplexer circuit within the first circuit block.

18. The method of claim 15 , further comprising providing the first multiplexer circuit on an outside periphery of the first circuit block, and providing the second multiplexer circuit on an outside periphery of the second circuit block.

19. The method of claim 15 , further comprising embedding the first multiplexer circuit within the first circuit block, and embedding the second multiplexer circuit within the second circuit block.

20. The method of claim 15 , wherein the first input node of the first multiplexer circuit comprises a multi-bit input node.

21. The method of claim 15 , wherein the first input node of the first multiplexer circuit comprises a single-bit input node.

22. The method of claim 15 , wherein the control signal comprises a multi-bit signal.

23. The method of claim 15 , wherein the control signal comprises an address.

24. The method of claim 15 , further comprising providing an address bus coupled to the control nodes of the first and second multiplexer circuits.

25. The method of claim 24 , further comprising providing a latch coupled between the address bus and the control nodes of the first and second multiplexer circuits.

26. The method of claim 15 , wherein the output node of the OR gate comprises a first number of bits.

27. The method of claim 26 , wherein the output node of the OR gate is coupled to a first number of external pins.

28. The method of claim 26 , wherein the output node of the OR gate is coupled to a second number of external pins less than the first number of bits.

Assignments (12)
ASSIGNMENT OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2025
From: ROYAL BANK OF CANADA [RESIGNING COLLATERAL AGENT]
To: GLAS USA LLC [SUCCESSOR COLLATERAL AGENT]
Reel/Frame 070097/0810 →
RELEASE OF SECURITY INTEREST Recorded Dec 9, 2024
From: ROYAL BANK OF CANADA, AS COLLATERAL AGENT
To: FIERY, LLC
Reel/Frame 069546/0649 →
RELEASE OF PATENT SECURITY INTEREST Recorded Dec 3, 2024
From: CERBERUS BUSINESS FINANCE AGENCY, LLC
To: ELECTRONICS FOR IMAGING, INC.; FIERY, LLC
Reel/Frame 069477/0479 →
SECURITY INTEREST Recorded Mar 14, 2024
From: FIERY, LLC
To: ROYAL BANK OF CANADA
Reel/Frame 066797/0464 →
SECURITY INTEREST Recorded Mar 12, 2024
From: ELECTRONICS FOR IMAGING, INC.; FIERY, LLC
To: CERBERUS BUSINESS FINANCE AGENCY, LLC
Reel/Frame 066794/0315 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2024
From: DEUTSCHE BANK TRUST COMPANY AMERICAS, AS AGENT
To: ELECTRONICS FOR IMAGING, INC.
Reel/Frame 066793/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 9, 2022
From: ELECTRONICS FOR IMAGING, INC.
To: FIERY, LLC
Reel/Frame 061132/0471 →
RELEASE OF SECURITY INTEREST IN PATENTS Recorded Jul 23, 2019
From: CITIBANK, N.A., AS ADMINISTRATIVE AGENT
To: ELECTRONICS FOR IMAGING, INC.
Reel/Frame 049840/0316 →
SECURITY INTEREST Recorded Jul 23, 2019
From: ELECTRONICS FOR IMAGING, INC.
To: ROYAL BANK OF CANADA
Reel/Frame 049840/0799 →
SECOND LIEN SECURITY INTEREST IN PATENT RIGHTS Recorded Jul 23, 2019
From: ELECTRONICS FOR IMAGING, INC.
To: DEUTSCHE BANK TRUST COMPANY AMERICAS
Reel/Frame 049841/0115 →
GRANT OF SECURITY INTEREST IN PATENTS Recorded Jan 3, 2019
From: ELECTRONICS FOR IMAGING, INC.
To: CITIBANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 048002/0135 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2004
From: AGARWAL, MANOJ KUMAR
To: ELECTRONICS FOR IMAGING, INC.
Reel/Frame 015538/0595 →