IP Library Granted Patent US 7,008,480
Granted Patent B2
US 7,008,480 · App. 10/888,451 · Granted Mar 7, 2006

Apparatus for coating photoresist

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Quick Facts
Patent No.
US 7,008,480
App. No.
10/888,451
Granted
Mar 7, 2006
Kind
B2
Abstract

Disclosed is a photoresist coating apparatus capable of preventing a substrate from being contaminated and preventing a pattern bridge phenomenon from being created in the substrate during an exposure process by shielding backflow of photoresist through forcibly exhausting photoresist to an exterior. The photoresist coating apparatus includes a vacuum chuck for holding a substrate by using vacuum, a driving motor connected to the vacuum chuck through an arm, a first nozzle for coating photoresist onto the substrate, a second nozzle for performing a rinse process, a bath surrounding the vacuum chuck to prevent photoresist from being discharged to an exterior, a first drain pipe connected to both lower ends of the bath in order to discharge photoresist contained in the bath, and a photoresist discharge section for forcibly discharging photoresist contained in the bath to the exterior.

Claims (14)

1. An apparatus for coating photoresist on a surface of a substrate during a semiconductor device manufacturing process, the apparatus comprising:

a vacuum chuck capable of holding a substrate thereon by using vacuum;

a driving motor connected to the vacuum chuck through an arm in order to supply rotational driving force to the substrate;

a first nozzle installed above the vacuum chuck in order to coat photoresist onto the substrate;

a second nozzle installed below the vacuum chuck in order to perform a rinse process with respect to a rear surface of the substrate;

a bath surrounding the vacuum chick including the substrate in order to prevent photoresist from being discharged to an exterior;

a first drain pipe connected to both lower ends of the bath in order to discharge photoresist contained in the bath;

a vane, coupled to said arm, forcing air in said bath toward said first drain pipe; and

a photoresist discharge section coupled to said first drain pipe to temporarily store photoresist introduced into the bath.

2. The apparatus as claimed in claim 1 , wherein the photoresist discharge section includes a storage tank connected to the first drain pipe in order to temporarily store photoresist introduced into the bath, a second drain pipe connected to a lower end of the storage tank, and first and second shut-off valves for opening/closing the first and second drain pipe.

3. The apparatus as claimed in claim 2 , wherein an opening/closing operation of the first shut-off valve is controlled by means of a synchronized signal created according to a rotation of the vacuum chuck.

4. The apparatus as claimed in claim 1 , wherein the vane coupled to said arm, is simultaneously rotated as the arm rotates, said vane having wings thereof at a predetermined angle so that photoresist contained in the bath is forcibly discharged to the drain pipe.

5. The apparatus as claimed in claim 4 , wherein the wings of the rotating member are developed at an angle of about 15 to 60°.

6. The apparatus as claimed in claim 1 , wherein the second nozzle includes a spray-type nozzle.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 23, 2013
From: SK HYNIX INC.
To: INTELLECTUAL DISCOVERY CO. LTD.
Reel/Frame 030471/0480 →
CHANGE OF NAME AND ADDRESS Recorded May 23, 2013
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 030490/0258 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 9, 2004
From: EOM, JAE DOO
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015567/0310 →