Semiconductor circuit array substrate with a photo-electric sensor portion
View Patent ↗A circuit array substrate is provided with thin-film transistors 4 and 5 and PIN diode 6 formed on insulation substrate 3 . Active layer 11 and photo-electric sensor portion 21 are made of poly-silicon films. Impurities are doped into active layer 11 and photo-electric sensor portion 21 in the same process chamber, if necessary, to make their impurity concentrations different from each other. Thin-film transistors 4 and 5 with prescribed characteristics and PIN diode 6 with improved photosensitivity can be simultaneously, easily manufactured on insulation substrate 3 with a lesser number of processes.
1. A circuit array substrate, comprising:
an insulation substrate;
switching elements having an active layer of a poly-crystalline semiconductor formed on said insulation substrate; and
a photo-electric semiconductor device having a photo-electric sensor portion of a poly-crystalline semiconductor formed on said insulation substrate,
wherein an impurity is doped into said active layer of said poly-crystalline semiconductor with an impurity concentration in a process chamber and
said impurity is also doped into said photo-electric sensor portion of said poly-crystalline semiconductor with a different impurity concentration from that of said active layer of said poly-crystalline semiconductor in the same process chamber as said active layer of said poly-crystalline semiconductor.
2. A circuit array substrate according to claim 1 , wherein said switching elements are thin-film transistors, and
said photo-electric semiconductor device is a PIN diode.
3. A circuit array substrate, comprising:
an insulation substrate; and
a plurality of switching elements having active layers of a poly-crystalline semiconductor formed on said insulation substrate,
wherein an impurity is doped into said active layer of said poly-crystalline semiconductor with an impurity concentration in a process chamber and
said impurity is also doped into a photo-electric sensor portion of said poly-crystalline semiconductor with a different impurity concentration from that of said active layer of said poly-crystalline semiconductor in the same process chamber as said active layer of said poly-crystalline semiconductor.
4. A circuit array substrate according to claim 3 , wherein said switching elements are thin-film transistors having different channel lengths, and
said different impurity concentrations of said active layers of said thin-film transistors are different from each other with respect to said different channel lengths of said thin-film transistors.