IP Library Granted Patent US 7,184,276
Granted Patent B2
US 7,184,276 · App. 10/895,386 · Granted Feb 27, 2007

Semiconductor device and method of manufacture thereof, circuit board, and electronic instrument

Assignee: Seiko Epson Corporation
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Quick Facts
Patent No.
US 7,184,276
App. No.
10/895,386
Granted
Feb 27, 2007
Kind
B2
Abstract

A semiconductor device includes a plurality of semiconductor chips; and a plurality of substrates, each of the substrates having one of the semiconductor chips mounted thereon. The substrates are stacked each other. The upper and lower ones of the semiconductor chips mounted on a pair of the stacked substrates are electrically connected through first terminals provided in a region outside the region in which one of the semiconductor chips is mounted in each of the substrates. The lowest one of the substrates has second terminals provided in its region closer to its center than its region in which the first terminals are provided, the second terminals electrically connected to one of the semiconductor chips. A pitch of adjacent two of the second terminals is wider than a pitch of adjacent two of the first terminals.

Claims (61)

1. A semiconductor device comprising:

a plurality of semiconductor chips; and

a plurality of substrates, each of the substrates including one of the semiconductor chips mounted thereon in a first region thereof,

wherein:

the substrates are stacked over top of each other;

a first semiconductor chip mounted on a first stacked substrate is electrically connected to a second semiconductor chip mounted on a second stacked substrate through first terminals provided in a second region of each of the first and second stacked substrates outside the first region;

a lowest substrate of the stacked substrates includes second terminals electrically connected to one of the semiconductor chips, the second terminals include external terminals on the lowest substrate of the stacked substrates, the external terminals projecting from a surface of the lowest substrate of the stacked substrates, the surface being opposite to that opposing another of the stacked substrates; and

all of the second terminals are provided in a the first region of the lowest substrate to entirely overlap the semiconductor chip mounted on the lowest substrate of the stacked substrates.

2. The semiconductor device of claim 1 , wherein:

the first terminals are arranged along an edge of one of the semiconductor chips.

3. The semiconductor device of claim 1 , wherein:

the first terminal have projections formed to project from a surface of one of the substrates; and

by means of the projections of the first terminals, the first semiconductor chip is electrically connected to the second semiconductor chip.

4. The semiconductor device of claim 1 , wherein:

in the lowest substrate of the stacked substrates, a plurality of second through holes are formed; and

the external terminals of the second terminals project through the second through holes from the surface opposite to that opposing of the stacked substrates.

5. The semiconductor device of claim 1 , wherein:

the external terminals of the second terminals include bumps that are electrically connected to the interconnecting pattern.

6. The semiconductor device of claim 1 , wherein:

the second terminals constitute a part of the interconnecting pattern.

7. The semiconductor device of claim 3 , wherein:

each of the substrates define a plurality of first through holes; and

the projections of the first terminals project from the surface of one of the substrates through the first through holes.

8. The semiconductor device of claim 3 , wherein:

an interconnecting pattern is formed on each of the substrates;

the first terminals are a part of the interconnecting pattern; and

the projections of the first terminals are formed by a part of the interconnecting pattern that is bent in the direction away from the surface of one of the substrates.

9. The semiconductor device of claim 3 , wherein:

an interconnecting pattern is formed on each of the substrates; and

the projections of the first terminals are bumps provided so as to be electrically connected to the interconnecting pattern.

10. The semiconductor device of claim 4 , wherein:

the second terminals constitute a part of the interconnecting pattern.

11. The semiconductor device of claim 6 , wherein:

the external terminals of the second terminals are formed by bending a part of the interconnecting pattern in the direction away from the surface opposite to the surface opposing another of the substrates.

12. The semiconductor device of claim 8 , wherein:

the second terminals constitute a part of the interconnecting pattern.

13. The semiconductor device of claim 9 , wherein:

the second terminals constitute a part of the interconnecting pattern.

14. The semiconductor device of claim 10 , wherein:

the external terminals of the second terminals are formed by bending a part of the interconnecting pattern in the direction away from the surface opposite to the surface opposing another of the substrates.

15. A circuit board on which a semiconductor device is mounted, the semiconductor device comprising:

a plurality of semiconductor chips; and

a plurality of substrates, each of the substrates including one of the semiconductor chips mounted thereon in a first region thereof, each of the substrates having an outline larger than each of the semiconductor chips,

wherein:

the substrates are stacked over top of each other;

a first semiconductor chip mounted on a first stacked substrate is electrically connected to a second semiconductor chip mounted on a second stacked substrate through first terminals provided in a second region of each of the first and second stacked substrates outside the first region;

a lowest substrate of the stacked substrates includes second terminals electrically connected to one of the semiconductor chips, the second terminals include external terminals on the lowest substrate of the stacked substrates, the external terminals projecting from a surface of the lowest substrate of the stacked substrates, the surface being opposite to that opposing another of the stacked substrates;

all of the second terminals are provided in the first region of the lowest substrate to entirely overlap the semiconductor chip mounted on the lowest substrate of the stacked substrates; and

wherein the semiconductor device is electrically connected to the circuit board through the second terminals.

16. An electronic instrument comprising a semiconductor device, the semiconductor device comprising:

a plurality of semiconductor chips; and

a plurality of substrates, each of the substrates including one of the semiconductor chips mounted thereon in a first region thereof, each of the substrates having an outline larger than each of the semiconductor chips,

wherein:

the substrates are stacked over top of each other;

a first semiconductor chip mounted on a first stacked substrate is electrically connected to a second semiconductor chip mounted on a second stacked substrate through first terminals provided in a second region of each of the first and second stacked substrates outside the first region;

a lowest substrate of the stacked substrates includes second terminals electrically connected to one of the semiconductor chips, the second terminals include external terminals on the lowest substrate of the stacked substrates, the external terminals projecting from a surface of the lowest substrate of the stacked substrates, the surface being opposite to that opposing another of the stacked substrates; and

all of the second terminals are provided in the first region of the lowest substrate to entirely overlap the semiconductor chip mounted on the lowest substrate of the stacked substrates.

17. A method of manufacture of a semiconductor device comprising the steps of:

stacking a plurality of substrates, each of the substrates including one of semiconductor chips mounted thereon in a first region thereof, each of the substrates having an outline larger than each of the semiconductor chips; and

electrically connecting a first semiconductor chip mounted on a first stacked substrate to a second semiconductor chip mounted on a second stacked substrate through first terminals provided in a second region of each of the first and second stacked substrates outside the first region,

wherein a lowest substrate of the stacked substrates includes second terminals electrically connected to one of the semiconductor chips, the second terminals include external terminals on the lowest substrate of the stacked substrates, the external terminals projecting from a surface of the lowest substrate of the stacked substrates, the surface being opposite to that opposing another of the stacked substrates, and all of the second terminals are provided in the first region of the lowest substrate to entirely overlap the semiconductor chip mounted on the lowest substrate of the stacked substrates.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2018
From: SEIKO EPSON CORPORATION
To: ADVANCED INTERCONNECT SYSTEMS LIMITED
Reel/Frame 046464/0045 →
Priority Claims (1)
JP 2000-269101 · Sep 5, 2000 · national
Continuity (3)
Continuation 1024773700 · Sep 20, 2002
Continuation 0993458700 · Aug 23, 2001
Related Publication 20040256709A1 · Dec 23, 2004