Sensor design and process
View Patent ↗An accelerometer ( 305 ) for measuring seismic data. The accelerometer ( 305 ) includes an integrated vent hole for use during a vacuum sealing process and a balanced metal pattern for reducing cap wafer bowing. The accelerometer ( 305 ) also includes a top cap press frame recess ( 405 ) and a bottom cap press frame recess ( 420 ) for isolating bonding pressures to specified regions of the accelerometer ( 305 ). The accelerometer ( 305 ) is vacuum-sealed and includes a balanced metal pattern ( 730 ) to prevent degradation of the performance of the accelerometer ( 305 ). A dicing process is performed on the accelerometer ( 305 ) to isolate the electrical leads of the accelerometer ( 305 ). The accelerometer ( 305 ) further includes overshock protection bumpers ( 720 ) and patterned metal electrodes to reduce stiction during the operation of the accelerometer ( 305 ).
1. A method of fabricating a sensor element, comprising:
using a first process to fabricate a measurement mass wafer for detecting acceleration, the measurement mass wafer including a mass housing having a cavity, and a spring mass assembly positioned within the cavity;
fabricating a top cap wafer using the first process;
fabricating a bottom cap wafer using the first process;
bonding the top cap wafer to a side of the measurement mass wafer using a bonding process;
bonding the bottom cap wafer to another side of the measurement mass wafer using the bonding process; and
making one or more dicing cuts at predetermined locations on the sensor element.
2. The method of claim 1 further comprising etching a surface of the measurement mass wafer, applying a metal layer on the etched surface, and molding the metal layer to form a stiction-reducing electrode pattern.
3. The method of claim 1 , wherein fabricating the measurement mass wafer further includes fabricating a passage for venting air from the cavity.
4. The method of claim 3 , wherein the passage comprises a V-shaped groove.
5. The method of claim 3 , wherein the dicing cuts are made through the top cap wafer and the bottom cap wafer and into the measurement mass wafer, stopping at a predetermined distance from the passage within the measurement mass wafer.
6. The method of claim 5 further comprising opening the passage after the dicing cuts are made to open an air vent to the passage.
7. The method of claim 6 further comprising a second process to expose the passage within the measurement mass wafer, wherein air is removed from the cavity through the passage to create a low pressure environment in the cavity, and wherein the passage is sealed to maintain the low pressure environment within the cavity.
8. The method of claim 6 , further comprising packaging the sensor element in a sensor housing and using a vacuum process to remove substantially all air from the sensor housing during packaging to create a low pressure environment within the sensor housing; wherein air is removed from the accelerometer though the passage during the vacuum process; and wherein the sensor housing is sealed to maintain the low pressure environment.
9. The method of claim 1 , wherein fabricating the top cap wafer further comprises forming a press frame recess in the top cap wafer.
10. The method of claim 1 , wherein fabricating the bottom cap wafer further comprises forming a press frame recess in the bottom cap wafer.
11. The method of claim 1 , wherein the dicing cuts penetrate through the top cap wafer, the bottom cap wafer, and at least partially through the measurement mass wafer.
12. The method of claim 1 , wherein the top cap wafer includes a balanced metal pattern on an upper surface of the top cap wafer.
13. The method of claim 1 , wherein the bottom cap wafer includes a balanced metal pattern on a lower surface of the bottom cap wafer.
14. The method of claim 1 , wherein the spring-mass assembly comprises springs.
15. The method of claim 14 , wherein the springs include an etch-stop layer on one or more surfaces of the springs.
16. The method of claim 1 , wherein the measurement mass wafer includes one or more mass contact pads; and wherein the dicing cuts are made through the top cap wafer to expose the mass contact pads on the measurement mass wafer.
17. The method of claim 1 , wherein the measurement mass wafer includes one or more mass contact pads; and wherein the dicing cuts are made through the bottom cap wafer to expose the mass contact pad on the measurement mass wafer.
18. The method of claim 1 , wherein the measurement mass includes one or more mass contact pads and the dicing cuts are made:
through the top cap wafer to expose the mass contact pads on the measurement mass wafer; and
through the bottom cap wafer to expose the mass contact pads on the measurement mass wafer.