IP Library Granted Patent US 7,360,410
Granted Patent B2
US 7,360,410 · App. 10/899,415 · Granted Apr 22, 2008

Procedure and device for testing tires

Assignee: Steinbichler Optotechnik GmbH
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Quick Facts
Patent No.
US 7,360,410
App. No.
10/899,415
Granted
Apr 22, 2008
Kind
B2
Abstract

A procedure serves for the testing of tires by means of a testing system. The testing system includes a memory in which geometric data ( 1, 2, 3, 4, 5, 6 ) of the tire ( 7 ) are stored, and at least one probe ( 8 ) for testing the tire ( 7 ) surface. To improve on such a device, the probe or probes ( 8 ) are positioned with due consideration for the geometric data ( 1 - 6 ) of the tire ( 7 ) for the testing of the tire ( 7 ) surface (FIG. 1 ).

Claims (85)

1. Procedure for testing the surface of tires for defects, comprising the steps of

storing geometric data ( 1 , 2 , 3 , 4 , 5 , 6 ) of the tire ( 7 ) in a memory of a testing system,

positioning at least one probe ( 8 ) for testing the tire ( 7 ) surface for defects based upon the geometric data ( 1 - 6 ) of the tire ( 7 ) stored in the memory of the testing system,

testing the tire ( 7 ) surface for defects, and

maintaining an opening ( 5 ) of the tire ( 7 ) uncovered and accessible at all times, so that an internal surface of the tire ( 7 ) can be tested for defects.

2. Procedure according to claim 1 , wherein the geometric data of the tire ( 7 ) include the external diameter ( 1 ) and/or the internal diameter ( 2 ) and/or the width ( 3 ).

3. Procedure according to claim 1 , wherein the geometric data of the tire ( 7 ) include the internal diameter of the tire ( 7 ) tread.

4. Procedure according to claim 1 , wherein the geometric data of the tire ( 7 ) include the width of the tire ( 7 ) opening ( 5 ).

5. Procedure according to claim 1 , wherein the geometric data of the tire ( 7 ) include the contour ( 6 ) of the tire ( 7 ) sidewall.

6. Procedure according to claim 1 , comprising the additional step of

entering or scanning the geometric data ( 1 - 6 ) of the tire ( 7 ) into the memory.

7. Procedure according to claim 1 , comprising the additional step of

measuring the geometric data ( 1 - 6 ) of the tire ( 7 ).

8. Procedure according to claim 7 , comprising the additional step of

measuring the geometric data ( 1 - 6 ) of the tire with a sensor (H, V, 16 , 21 ).

9. Procedure according to claim 8 , comprising the additional step of

moving the sensor in relation to the tire.

10. Procedure according to claim 7 , comprising the additional step of

measuring a horizontal profile of the tire.

11. Procedure according to claim 7 , comprising the additional step of

measuring a vertical profile of the tire.

12. Procedure according to claim 1 , comprising the additional step of

testing the tire ( 7 ) surface interferometrically.

13. Procedure according to claim 1 , comprising the additional step of

testing the tire ( 7 ) surface by projecting structured light.

14. Procedure according to claim 8 , comprising the additional step of

testing the tire surface by the sensor used to measure the geometric data of the tire.

15. Tire-testing device, comprising

a testing system having a memory structured and arranged for storing geometric data ( 1 - 6 ) of the tire ( 7 ) therein,

at least one probe ( 8 ) structured and arranged to be positioned based upon the stored geometric data ( 1 - 6 ) and for testing the tire ( 7 ) surface for defects, and

means for maintaining an opening ( 5 ) of the tire ( 7 ) uncovered and accessible at all times, so that an internal surface of the tire ( 7 ) can be tested for defects.

16. Device according to claim 15 , additionally comprising a device structured and arranged for measuring the geometric data of the tire.

17. Device according to claim 16 , wherein the measuring device has a sensor.

18. Device according to claim 16 , wherein the measuring device is moveably mounted in relation to the tire.

19. Device according to claim 15 , wherein the testing system has an interferometric probe.

20. Device according to claim 15 , wherein the probe sensor is additionally used in the measuring device.

21. A procedure for testing tires by a testing system, comprising the steps of

storing geometric data ( 1 , 2 , 3 , 4 , 5 , 6 ) of the tire ( 7 ) in a memory, and

positioning at least one probe ( 8 ) for testing the tire ( 7 ) surface with consideration for the geometric data ( 1 - 6 ) of the tire ( 7 ) for the testing of the tire ( 7 ) surface,

wherein the tire ( 7 ) surface is tested by photogrammetry.

22. The procedure for testing tires by a testing system according to claim 1 , wherein

the at least one probe ( 8 ) is positioned within an internal diameter of the tire ( 7 ) to scan at least one of an inner radial opening ( 5 ), internal radial diameter ( 4 ) and internal contour ( 6 ) of a sidewall of the tire ( 7 ), and

the geometric data ( 1 - 6 ) include external radial diameter ( 1 ), diameter ( 2 ) of the inner radial opening ( 5 ), width ( 3 ) between external sidewalls, the internal radial diameter ( 4 ) and the internal contour ( 6 ) of the tire ( 7 ) sidewall.

23. A procedure for testing the surface of tires for defects by a testing system according to claim 1 , comprising the additional step of

arranging two probes ( 8 ) for testing the tire ( 7 ) surface for defects.

24. A procedure for testing the surface of tires for defects by a testing system according to claim 1 , comprising the additional step of

positioning at least one probe within the internal diameter of the tire for testing the internal surface of the tire ( 7 ).

25. Device according to claim 15 , wherein

the at least one probe ( 8 ) is positioned within an internal diameter of the tire ( 7 ) to scan at least one of an inner radial opening ( 5 ), internal radial diameter ( 4 ) and internal contour ( 6 ) of a sidewall of the tire ( 7 ), and

the geometric data ( 1 - 6 ) stored within the memory include external radial diameter ( 1 ), diameter ( 2 ) of the inner radial opening ( 5 ), width ( 3 ) between external sidewalls, the internal radial diameter ( 4 ) and the internal contour ( 6 ) of the tire ( 7 ) sidewall.

26. A tire-testing device, comprising

a testing system having a memory structured and arranged for storing geometric data ( 1 - 6 ) of the tire ( 7 ) therein,

two probes ( 8 ) structured and arranged for testing the tire ( 7 ) surface; and

means for comparing information picked up by said at least one probe ( 8 ) with said

stored geometric data ( 1 , 2 , 3 , 4 , 5 , 6 ) for analyzing the tire ( 7 ) for defects, wherein

at least one probe ( 8 ) is positioned within an internal diameter of the tire ( 7 ) to scan at least one of an inner radial opening ( 5 ), internal radial diameter ( 4 ) and internal contour ( 6 ) of a sidewall of the tire ( 7 ), and

the geometric data ( 1 - 6 ) stored within the memory include external radial diameter ( 1 ), diameter ( 2 ) of the inner radial opening ( 5 ), width ( 3 ) between external sidewalls, the internal radial diameter ( 4 ) and the internal contour ( 6 ) of the tire ( 7 ) sidewall.

27. A tire-testing device according to claim 15 , additionally comprising

two probes ( 8 ) structured and arranged for testing the tire ( 7 ) surface for defects.

28. A tire-testing device, comprising

a testing system having a memory structured and arranged for storing geometric data ( 1 - 6 ) of the tire ( 7 ) therein, and

at least one probe ( 8 ) structured and arranged for testing the tire ( 7 ) surface,

wherein said at least one probe ( 8 ) is a camera arranged for testing the tire ( 7 ) surface by photogrammetry.

29. Procedure according to claim 8 , comprising the step of

immediately testing the tire ( 7 ) surface for defects after measuring the geometric data ( 1 - 6 ) of the tire ( 7 ) with the same sensor (H, V, 16 , 21 ).

30. Device according to claim 17 , wherein said same sensor is structured and arranged to immediately test the tire ( 7 ) surface for defects after measuring the geometric data ( 1 - 6 ) of the tire ( 7 ).

31. Procedure according to claim 1 , comprising the additional step of

placing the tire ( 7 ) upon a supporting surface ( 11 ) underneath the tire ( 7 ) with the tire ( 7 ) lying flat thereon ( 11 ) and an axis of the tire ( 7 ) oriented vertically (Z).

32. Procedure according to claim 31 , wherein the supporting surface ( 11 ) comprises a number of rollers ( 12 ) housed to turn on an axle ( 13 ), and comprising the additional step of

moving the tire ( 7 ) along the rollers ( 12 ) in a horizontal direction (X) by turning said axle ( 13 ).

33. Device according to claim 15 , additionally comprising

a supporting surface ( 11 ) structured and arranged underneath the tire ( 7 ) and to support the tire ( 7 ) lying flat thereon ( 11 ), with an axis of the tire ( 7 ) oriented vertically (Z).

34. Device according to claim 33 , wherein the supporting surface ( 11 ) comprises a number of rollers ( 12 ) housed to turn on an axle ( 13 ), such that the tire ( 7 ) moves along the rollers ( 12 ) in a horizontal direction (X) by turning the axle ( 13 ).

35. Procedure for testing the surface of tires for defects, comprising the steps of

storing geometric data ( 1 , 2 , 3 , 4 , 5 , 6 ) of the tire ( 7 ) in a memory of a testing system,

placing the tire ( 7 ) upon a supporting surface ( 11 ) underneath the tire ( 7 ) with the tire ( 7 ) lying flat thereon ( 11 ) and an axis of the tire ( 7 ) oriented vertically (Z),

positioning at least one probe ( 8 ) for testing the tire ( 7 ) surface for defects based upon the geometric data ( 1 - 6 ) of the tire ( 7 ) stored in the memory of the testing system, and

testing the tire ( 7 ) surface for defects.

36. Procedure according to claim 35 , wherein the supporting surface ( 11 ) comprises a number of rollers ( 12 ) housed to turn on an axle ( 13 ), and comprising the additional step of

moving the tire ( 7 ) along the rollers ( 12 ) in a horizontal direction (X) by turning said axle ( 13 ).

37. Tire-testing device, comprising

a testing system having a memory structured and arranged for storing geometric data ( 1 - 6 ) of the tire ( 7 ) therein,

a supporting surface ( 11 ) structured and arranged underneath the tire ( 7 ) and to support the tire ( 7 ) lying flat thereon ( 11 ), with an axis of the tire ( 7 ) oriented vertically (Z), and

at least one probe ( 8 ) structured and arranged to be positioned based upon the stored geometric data ( 1 - 6 ) and for testing the tire ( 7 ) surface for defects.

38. Device according to claim 37 , wherein the supporting surface ( 11 ) comprises a number of rollers ( 12 ) housed to turn on an axle ( 13 ), such that the tire ( 7 ) moves along the rollers ( 12 ) in a horizontal direction (X) by turning the axle ( 13 ).

Assignments (2)
CHANGE OF NAME Recorded Feb 21, 2018
From: STEINBICHLER OPTOTECHNIK GMBH
To: CARL ZEISS OPTOTECHNIK GMBH
Reel/Frame 045272/0954 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 18, 2005
From: STEINBICHLER, HANS; WILHELM, ROBERT; LEITNER, BERND; BERGER, ROMAN; RASENBERGER, VOLKER; HUBER, RAINER
To: STEINBICHLER OPTOTECHNIK GMBH
Reel/Frame 016159/0388 →
Priority Claims (1)
DE 103 33 802 · Jul 24, 2003 · national
Continuity (1)
Related Publication 20050109091A1 · May 26, 2005