Component formation via plating technology
Improved terminations, interconnection techniques, and inductive element features for multilayer electronic components are formed in accordance with disclosed plating techniques. Monolithic components are provided with plated terminations whereby the need for typical thick-film termination stripes is eliminated or greatly simplified. Such plated termination technology eliminates many typical termination problems and enables a higher number of terminations with finer pitch, which may be especially beneficial on smaller electronic components. The subject plated terminations are guided and anchored by exposed varying width internal electrode tabs and additional anchor tab portions. Such anchor tabs may be positioned internally or externally relative to a chip structure to nucleate additional metallized plating material. The combination of electrode tabs and anchor tabs may be exposed in respective arrangements to form generally discoidal portions of plated material. Such plated material may ultimately form generally round portions of ball limiting metallurgy (BLM) to which solder balls may be reflowed. The disclosed technology may be utilized with a plurality of monolithic multilayer components, including interdigitated capacitors, multilayer capacitor arrays, and integrated passive components. A variety of different plating techniques and materials may be employed in the formation of the subject self-determining plated terminations and inductive components.
1. A multi-layer electronic component, comprising:
a plurality of stacked dielectric layers;
a plurality of conductive tabs positioned at selected locations on said plurality of stacked dielectric layers, wherein selected of said plurality of conductive tabs are exposed on said multi-layer electronic component in respective groups, and wherein the distance between adjacent groups of exposed conductive tabs is at least twice as great as the distance between exposed conductive tabs in any given group; and
at least one portion of thin-film copper plating material connecting selected exposed portions of said plurality of conductive tabs within each respective group.
2. A multi-layer electronic component as in claim 1 , wherein said plurality of conductive tabs are positioned at selected edges of said plurality of dielectric layers.
3. A multi-layer electronic component as in claim 2 , wherein said plurality of conductive tabs are aligned in columns.
4. A multi-layer electronic component as in claim 2 , wherein the plurality of conductive tabs are varied in width among selected respective groups to form a predetermined geometric pattern.
5. A multi-layer electronic component as in claim 4 , wherein said predetermined geometric pattern is a pattern selected from the group consisting of a generally discoidal configuration and a generally triangular configuration.
6. A multi-layer electronic component as in claim 4 , wherein the geometric pattern is generally circular and said plating material connecting selected of the conductive tabs forms ball limiting metallurgy for the multi-layer component.
7. A multi-layer electronic component as in claim 2 , wherein said plurality of conductive tabs are positioned at selected angular positions around a cylindrical via piercing a central location of said plurality of dielectric layers.
8. A multi-layer electronic component as in claim 7 , wherein said plating material connecting selected of the conductive tabs forms a spiral inductor within said cylindrical via.
9. A multi-layer electronic component as in claim 1 , wherein said plurality of conductive tabs are positioned at selected central locations of said plurality of dielectric layers.
10. A multi-layer electronic component as in claim 1 , wherein said plurality of conductive tabs are provided in respective configurations to result in the formation of the at least one portion of thin-film copper plating material in a substantially rectangular configuration.
11. A multi-layer electronic component as in claim 1 , further comprising a plurality of electrodes provided at selected locations on said plurality of stacked dielectric layers, wherein selected of said plurality of electrodes are in direct contact with selected of said plurality of conductive tabs.
12. A multi-layer electronic component as in claim 1 , wherein said plurality of conductive tabs are aligned in columns, and wherein the distance between adjacent electrode tabs in a column of tabs is no greater than about ten microns.
13. A multi-layer electronic component as in claim 1 , wherein said at least one portion comprises electrochemical deposit comprising said thin-film copper plating material.
14. A multi-layer electronic component, comprising:
a plurality of stacked dielectric layers;
a plurality of conductive tabs positioned at selected locations on said plurality of stacked dielectric layers, wherein selected of said plurality of conductive tabs are exposed on said multi-layer electronic component in respective groups, wherein said plurality of conductive tabs are aligned in columns, and wherein the distance between adjacent electrode tabs in a column of tabs is no greater than about ten microns; and
at least one layer of termination material connecting selected exposed portions of said plurality of conductive tabs within each respective group.
15. A multi-layer electronic component as in claim 14 , wherein said plurality of conductive tabs are positioned at selected edges of said plurality of dielectric layers.
16. A multi-layer electronic component as in claim 15 , wherein said plurality of conductive tabs are varied in width among selected respective groups to form a predetermined geometric pattern.
17. A multi-layer electronic component as in claim 16 , wherein said predetermined geometric pattern is a pattern selected from the group consisting of a generally discoidal configuration and a generally triangular configuration.
18. A multi-layer electronic component as in claim 16 , wherein said geometric pattern is generally circular and said termination material connecting selected of the conductive tabs forms ball limiting metallurgy for the multi-layer component.
19. A multi-layer electronic component as in claim 15 , wherein said plurality of conductive tabs are positioned at selected angular positions around a cylindrical via piercing a central location of said plurality of dielectric layers.
20. A multi-layer electronic component as in claim 19 , wherein said termination material connecting selected of the conductive tabs comprises metallic material and forms a spiral inductor within said cylindrical via.
21. A multi-layer electronic component as in claim 14 , wherein said termination material comprises at least one portion of electrochemical deposit comprising thin-film copper plating material connecting selected exposed portions of said plurality of conductive tabs within each respective group.
22. A multi-layer electronic component as in claim 21 , wherein said plurality of conductive tabs are provided in respective configurations to result in the formation of the at least one portion of thin-film copper plating material in a substantially rectangular configuration.
23. A multi-layer electronic component as in claim 14 , wherein said plurality of conductive tabs are positioned at selected central locations of said plurality of dielectric layers.
24. A multi-layer electronic component as in claim 14 , wherein the distance between adjacent groups of exposed conductive tabs is at least twice as great as the distance between exposed conductive tabs in any given group.
25. A multi-layer electronic component as in claim 14 , further comprising a plurality of electrodes provided at selected locations on said plurality of stacked dielectric layers, wherein selected of said plurality of electrodes are in direct contact with selected of said plurality of conductive tabs.
26. A multi-layer electronic component, comprising:
a plurality of stacked dielectric layers;
a plurality of conductive tabs positioned at selected locations on said plurality of stacked dielectric layers, wherein selected of said plurality of conductive tabs are exposed on said multi-layer electronic component in respective groups; and
at least one portion of electrochemical deposit comprising thin-film copper plating material connecting selected exposed portions of said plurality of conductive tabs within each respective group.
27. A multi-layer electronic component as in claim 26 , wherein said plurality of conductive tabs are positioned at selected edges of said plurality of dielectric layers.
28. A multi-layer electronic component as in claim 27 , wherein said plurality of conductive tabs are aligned in columns.
29. A multi-layer electronic component as in claim 28 , wherein the distance between adjacent electrode tabs in a column of tabs is no greater than about ten microns.
30. A multi-layer electronic component as in claim 26 , wherein said plurality of conductive tabs are varied in width among selected respective groups to form a predetermined geometric pattern.
31. A multi-layer electronic component as in claim 30 , wherein said predetermined geometric pattern is a pattern selected from the group consisting of a generally discoidal configuration and a generally triangular configuration.
32. A multi-layer electronic component as in claim 30 , wherein said geometric pattern is generally circular and said plating material connecting selected of the conductive tabs forms ball limiting metallurgy for the multi-layer component.
33. A multi-layer electronic component as in claim 26 , wherein said plurality of conductive tabs are positioned at selected angular positions around a cylindrical via piercing a central location of said plurality of dielectric layers.
34. A multi-layer electronic component as in claim 33 , wherein said plating material connecting selected of the conductive tabs forms a spiral inductor within said cylindrical via.
35. A multi-layer electronic component as in claim 26 , wherein said plurality of conductive tabs are positioned at selected central locations of said plurality of dielectric layers.
36. A multi-layer electronic component as in claim 26 , wherein said plurality of conductive tabs are provided in respective configurations to result in the formation of the at least one portion of thin-film copper plating material in a substantially rectangular configuration.
37. A multi-layer electronic component as in claim 26 , further comprising a plurality of electrodes provided at selected locations on said plurality of stacked dielectric layers, wherein selected of said plurality of electrodes are in direct contact with selected of said plurality of conductive tabs.
38. A multi-layer electronic component as in claim 26 , wherein the distance between adjacent groups of exposed conductive tabs is at least twice as great as the distance between exposed conductive tabs in any given group.