Determination of partial fill in electrochemical strips
View Patent ↗Partial fill of an electrochemical test strip is determined by making a DC determination of double layer capacitance from charging or discharging charge on a test strip containing sample, for example a blood sample to be tested for glucose. The measured double layer capacitance is compared to a reference value. The double layer capacitance may be determined as an integral or differential capacitance. Double layer capacitance may also be used for quality control to monitor the quality of electrode formation, particularly in strips using screen printed electrodes.
1. A method for detection of partial fill in an electrochemical test strip having electrodes and a liquid sample disposed between the electrodes comprising the steps of:
(a) introducing sample to an electrochemical test strip;
(b) applying a potential difference, V app , between the electrodes of the test strip;
(c) switching off the applied potential at time t switch and optionally reapplying a second potential;
(d) observing current generated and determining from the observed current a double layer charging or discharging at the electrodes;
(e) observing a voltage change after the applied potential is switched off, and determining the double layer capacitance of test strip from the measured double layer charging or discharging and the observed voltage change; and
(f) comparing the determined double layer capacitance to a reference value, wherein a double layer capacitance less than the reference value is an indication that the liquid sample covers a portion of the electrodes and that the electrochemical test strip is only partially filled.
2. The method of claim 1 , wherein double layer capacitance determined is an integral capacitance determined in accordance with the formula:
C int = IΔt /ΔV,
wherein I is current, t is time and V is voltage.
3. The method of claim 2 , wherein Dt is determined by monitoring the decay in the potential difference between the electrodes to identify the time, t threshold required for the potential to decay to a threshold value, V threshold , and wherein Dt=t threshold−t switch .
4. The method of claim 3 , wherein the amount of double layer charge discharged is determined as
charge=I switch Δt
where I switch is the current just before time t switch .
5. The method of claim 3 , wherein the current is an estimated value of current at time t meas determined by extrapolation from the observed current prior to t switch .
6. The method of claim 3 , wherein ΔV is the difference between V app and V threshold .
7. The method of claim 3 , wherein an immediate drop in voltage, V drop , is observed following switching off of potential, and ΔV is given by (V app −V drop )−V threshold .
8. The method of claim 2 , wherein the observed current occurs after reapplication of a potential, and the double layer capacitance is determined from double layer charging.
9. The method of claim 1 , wherein a differential capacitance is determined according to the formula:
C dif = I / ( dV/dt ),
wherein I is current and (dV/dt) is the instantaneous change in voltage at time t meas .
10. The method of claim 9 , wherein the current I is the current just before time t switch .
11. The method of claim 9 , wherein the current is an estimated value of current at time t meas determined by extrapolation from the observed current prior to t switch .
12. The method of claim 7 , wherein t meas is determined dynamically.
13. The method of claim 12 , wherein t meas is the time at which the observed potential is lower than the applied potential by a predetermined amount.
14. The method of claim 8 , wherein an immediate drop in voltage, V drop , is observed following switching off of potential, and wherein t meas is the time at which the observed potential is lower than (V app −V drop ) by a predetermined amount.
15. The method of claim 14 , wherein the current I is the current just before time t switch .
16. The method of claim 14 , wherein the current is an estimated value of current at time t meas determined by extrapolation from the observed current prior to t switch .
17. The method of claim 1 , wherein the measured double layer capacitance is corrected by an additive correction term that is a function of temperature and oxygen carrying capacity prior to comparison with the reference value.