IP Library Granted Patent US 7,126,686
Granted Patent B2
US 7,126,686 · App. 10/920,412 · Granted Oct 24, 2006

Spectral image measurement apparatus and method using the same

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Quick Facts
Patent No.
US 7,126,686
App. No.
10/920,412
Granted
Oct 24, 2006
Kind
B2
Abstract

A spectral image measurement apparatus comprises: a spectral element array; a spectral element drive section for driving the elements; an inlet-side optical system for guiding a light to the element array; a detection-side optical system for forming an image with a diffracted light output from the element array; and an array sensor for detecting the diffracted light through the detection-side optical system. The element array includes: a substrate; and a plurality of micro-electrically-driven mechanical spectral elements arranged two-dimensionally on the substrate, wherein each of the elements comprises a diffraction grating having a diffraction surface, the diffraction grating being pivotably supported on the substrate; wherein each of the elements generates spectra from a light entering the diffraction surface by applying an electric field to the diffraction grating to tilt the diffraction grating; and wherein each of tilt angles of the diffraction gratings is capable of being set individually.

Claims (34)

1. A spectral image measurement apparatus comprising:

a spectral element array which includes:

a substrate; and

a plurality of micro-electrically-driven mechanical spectral elements arranged two-dimensionally on the substrate,

wherein each of the spectral elements comprises a diffraction grating having a diffraction surface, the diffraction grating being pivotably supported on the substrate;

wherein each of the spectral elements generates spectra from a light entering the diffraction surface by applying an electric field to the diffraction grating to tilt the diffraction grating with respect to the substrate; and

wherein each of tilt angles of the diffraction gratings with respect to the substrate is capable of being set individually;

a spectral element drive section for driving the spectral elements;

an inlet-side optical system for guiding, to the spectral element array, a light emitted from an object to be detected;

a detection-side optical system for forming an image with a diffracted light output from the spectral element array; and

an array sensor for detecting the diffracted light through the detection-side optical system.

2. The spectral image measurement apparatus according to claim 1 ,

wherein each of the spectral elements comprises:

a movable electrode that drives the diffraction grating so as to tilt the diffraction grating with respect to the substrate;

at least one fixed electrode having a plurality of electrode layers, wherein said at least one fixed electrode is provided beside the diffraction grating, and each of the plurality of electrode layers is confronted with the movable electrode in accordance with each of the set tilt angles.

3. The spectral image measurement apparatus according to claim 1 , wherein the spectral element array further comprises:

an aperture member having at least one opening, wherein each of said at least one opening limits an angle at which an incident light enters the diffraction grating and an angle at which a diffracted light exits the diffraction grating, the aperture member being provided above the diffraction surface of the diffraction grating.

4. The spectral image measurement apparatus according to claim 1 , further comprising a diaphragm provided at a focal point of a light path of the detection-side optical system.

5. The spectral image measurement apparatus according to claim 1 , wherein the detection-side optical system includes a microlens array mounted ahead of an optical path of the spectral element array.

6. A spectral image measurement method using the spectral image measurement apparatus according to claim 1 , the method comprising:

setting the tilt angles of respective spectral elements of the spectral element array to different angles in accordance with a desired spectral range; and

detecting an intensity of the diffracted light output from the spectral element array with the array sensor in a single operation.

7. A spectral image measurement method using the spectral image measurement apparatus according to claim 1 , the method comprising:

setting the tilt angles of the diffraction gratings of the spectral element array to a first set of tilt angles that correspond to a first wavelength range, and detecting an intensity of a diffracted light output from the spectral element array, so as to obtain a first spectrum of the intensity of the diffracted light and detect a peak of the first spectrum;

setting the tilt angles of the diffraction gratings of the spectral element array to a second set of tilt angles that correspond to a second wavelength range, wherein the second wavelength range is narrower than the first wavelength range and is a neighborhood of a wavelength of the detected peak of the first spectrum; and

detecting an intensity of a diffracted light in only the second wavelength range.

8. A spectral image measurement method using the spectral image measurement apparatus according to claim 1 , the method comprising:

setting the tilt angles of the diffraction gratings of the spectral element array to a first set of tilt angles that corresponds to a first wavelength range;

detecting an intensity of a first diffracted light at one time based on the first set of tilt angles by the array sensor;

setting the tilt angles of the diffraction gratings of the spectral element array to a second set of tilt angles that corresponds to a second wavelength range, the second wavelength range being different from the first wavelength range; and

detecting an intensity of a second diffracted light at one time based on the second set of tilt angles by the array sensor.

9. A spectral image measurement method using the spectral image measurement apparatus according to claim 1 , the method comprising:

setting all of the tilt angles of the diffraction gratings of the spectral element array to a specific single tilt angle; and

detecting a spatial intensity distribution corresponding to a specific wavelength.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2007
From: FUJIFILM HOLDINGS CORPORATION (FORMERLY FUJI PHOTO FILM CO., LTD.)
To: FUJIFILM CORPORATION
Reel/Frame 018904/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 18, 2004
From: TSUJITA, KAZUHIRO
To: FUJI PHOTO FILM CO., LTD.
Reel/Frame 015706/0063 →