Near-infrared visible light photon counter
View Patent ↗Electromagnetic energy is detected with high efficiency in the spectral range having wavelengths of about 1–2 microns by coupling an absorber layer having high quantum efficiency in the spectral range having wavelengths of about 1–2 microns to an intrinsic semiconducting blocking region of an impurity band semiconducting device included in a solid state photon detector.
1. A solid state photon counting detector comprising:
an absorber layer having high quantum efficiency in a spectral range having wavelengths between about 1 micron and about 2 microns;
an intrinsic semiconducting blocking layer coupled to the absorber layer and to an extrinsic impurity band semiconducting region, wherein the blocking layer is provided with first and second conductivity type impurity concentrations which are low enough that substantially no charge transport occurs by an impurity conduction mechanism, wherein the impudty band region has a first conductivity type impurity concentration which is high enough to create an impurity gain band region, wherein the impurity band region further includes a drift region; and
a contact layer coupling the drift region to a substrate.
2. The detector of claim 1 , wherein the absorber layer includes at least one of PtSi, GaAs, InAs, InSb and SiGe alloys.
3. The detector of claim 1 , wherein the absorber layer is made of metal materials.
4. The detector of claim 1 , wherein the absorber layer includes suicide materials.
5. The detector of claim 1 , wherein the impurity band region further includes a spacer region, wherein the spacer region is interposed between the contact layer and the drift region.