Submersible pump controller
An apparatus for improving the service life of a submersible probe residing in a tank includes a liquid level detector adapted to detect when a liquid in the tank rises to a first level. The first level is above the probe. A controller is coupled to the liquid level detector. The controller is configured to increase at least one of a voltage and a current applied to the probe responsive to the liquid being detected at the first level. The controller is configured to reduce an electrical potential field produced by the probe responsive to the liquid falling below a second level, thereby extending the service life of the probe by reducing the accumulation of foreign matter on the probe when the pump is not activated.
1. An apparatus for improving the service life of a submersible probe residing in a tank, comprising:
a liquid level detector adapted to detect when a liquid in the tank rises to a first level, said first level being above the probe; and
a controller coupled to said liquid level detector, said controller configured to increase at least one of a voltage and a current applied to the probe responsive to said liquid being detected at said first level, said controller configured to reduce an electrical potential field produced by the probe responsive to said liquid being below said second level.
2. The apparatus of claim 1 wherein said controller is configured to reduce said electrical potential field by decreasing at least one of said voltage and said current responsive to said liquid falling below the probe.
3. The apparatus of claim 1 wherein said liquid level detector is a float.
4. The apparatus of claim 1 wherein a pump is disposed in said tank and configured to pump said liquid from said tank responsive to the level of said liquid being detected at said first level.
5. The apparatus of claim 4 wherein said pump is in operative communication with said controller.
6. The apparatus of claim 5 wherein said liquid comprises at least one of a first liquid and a second liquid, said first liquid being removable from said tank and said second liquid required to remain in said tank, wherein said second liquid floats on said first liquid.
7. The apparatus of claim 6 wherein the probe is configured to detect the presence of said first liquid and the absence of said first liquid.
8. The apparatus of claim 1 wherein said controller is configured to reduce said electrical potential field by decreasing at least one of said voltage and said current responsive to said liquid falling below said second level.
9. The apparatus of claim 1 wherein said controller is configured to reduce metal ion exchange proximate the probe for reducing fouling of the probe.
10. The apparatus of claim 1 wherein said controller is configured to reduce accumulation of foreign matter on an outer surface of the probe resulting from said electrical potential field and subsequent metal ion exchange.
11. The apparatus of claim 1 wherein said controller is configured to reduce said electrical potential field subsequent a time delay and subsequent the liquid dropping below the probe.
12. The apparatus of claim 1 wherein said controller is configured to reduce one of said voltage and said current to the probe subsequent a time delay and subsequent the liquid dropping below a tip of the probe.
13. The apparatus of claim 12 wherein said delay is about one second.
14. A method for improving the service life of a submersible probe residing in a tank, comprising:
detecting a liquid in the tank rising to a first level, said first level being above the probe;
increasing at least one of a voltage and a current applied to the probe responsive to said liquid being detected at said first level; and
reducing an electrical potential field produced by the probe responsive to said liquid dropping below a second level.
15. The method of claim 14 wherein a liquid level detector is adapted to detect said first level.
16. The method of claim 15 wherein a controller is coupled to said liquid level detector, said controller configured to control voltage and current applied to the probe.
17. The method of claim 14 wherein:
said step of reduce said electrical potential field comprises reducing at least one of said voltage and said current applied to the probe responsive to said liquid dropping below the probe.
18. The method of claim 14 wherein:
said step of reducing said electrical potential field comprises decreasing at least one of said voltage and said current responsive to said liquid falling below said second level.
19. The method of claim 14 comprising:
reducing a metal ion exchange proximate the probe responsive to said liquid dropping below said second level.
20. The method of claim 14 comprising:
reducing an accumulation of foreign matter on an outer surface of the probe resulting from said electrical potential field and subsequent metal ion exchange.
21. The method of claim 14 comprising:
reducing said voltage applied to the probe responsive to said liquid dropping below a tip of the probe.
22. The method of claim 14 comprising:
delaying for a predetermined time interval said reducing of said electrical potential field responsive to said liquid falling below the second level.