According to the present invention, a resist resin having in its structure a specific bridged-bond-containing aliphatic ring, and a resist composition comprising the same are provided. By using this resist composition, a resist pattern excellent in both transparency against short-wavelength light and dry-etching resistance can be formed by alkali development with high resolution.
1. A resin comprising a polymer compound produced by copolymerizing at least one monomer selected from monomers represented by the general formulas (I-1) and (I-2):
wherein R is acryloyl or methacryloyl group, R 11 and R 12 are hydrogen atom or a monovalent alkyl group, with proviso that at least one of R 11 and R 12 is monovalent alkyl group, and R 13 is OH group, ═O group, COOH group or COOR 14 group, wherein R 14 is a monovalent organic group, and at least one monomer selected from monomers represented by the general formulas (I-3), (I-4), (I-5), (I-6) and (I-7):
wherein R is an acryloyl or methacryloyl group, R 31 is hydrogen atom, or at least one group selected from the group consisting of OH group, OR 14 group, wherein R 14 is a monovalent organic group, and ═O group, R 32 is hydrogen atom or a monovalent organic group, and R 41 is vinyl, acryloyl or methacryloyl group.
2. A resin according to claim 1 , wherein the monovalent alkyl group is selected from the group consisting of methyl, ethyl, propyl, and iso-propyl groups.
3. A resin according to claim 1 , wherein both R 11 and R 12 are monovalent alkyl groups.
4. A resin according to claim 3 , wherein the monovalent alkyl group is selected from the group consisting of methyl, ethyl, propyl, and iso-propyl groups.