Defect detector and defect detection method
View Patent ↗A control part of a defect detector is provided with a magnification operation part, an inspected image display part and a master image display part. The magnification operation part operates a display magnification α 1 (display magnification data) for a defective area on the basis of defective information. An imaging part images inspected image data so that an imaging magnification β 1 reaches the display magnification α 1 , and the inspected image display part displays the inspected image data on a detection monitor. The master image data display part operates a display magnification α 2 for master image data to be substantially identical to the display magnification α 1 , and displays the master image data on the detection monitor at the display magnification α 2 . Thus, the efficiency in a defect detecting operation of an operator is improved.
1. A defect detector for detecting a defect on an inspected object, comprising:
an image display system;
a holding element holding said inspected object;
an image acquisition element imaging said inspected object held by said holding element for acquiring inspected image data obtained by imaging a defective area of said inspected object having a defect;
a first display control element configured to display said inspected image data acquired by said image acquisition element on said image display system at a first display magnification; and
a second display control element configured to display master image data to be compared with said defective area on said image display system at a second display magnification substantially the same as said first display magnification.
2. The defect detector according to claim 1 , further comprising:
a size acquisition element acquiring information indicating the size of said defective area as to said inspected object held by said holding element, and
a display magnification operational element operating said first display magnification according to a prescribed algorithm on the basis of said information indicating the size of said defective area acquired by said size acquisition element.
3. The defect detector according to claim 1 , further comprising an operation part accepting input information from an operator, wherein
said second display control element operates said second display magnification in response to set said first display magnification every time said first display magnification is set on the basis of said input information and displays said master image data on said image display system at said second display magnification.
4. The defect detector according to claim 1 , further comprising an imaging magnification decision element deciding an imaging magnification of said image acquisition element for imaging said inspected object according to a prescribed algorithm in response to said first display magnification.
5. The defect detector according to claim 1 , further comprising:
a position acquisition element acquiring information indicating the position of said defective area as to said inspected object held by said holding element, and
a positioning element deciding relative positions of said inspected object held by said holding element and said image acquisition element in response to said information indicating the position of said defective area acquired by said position acquisition element.
6. The defect detector according to claim 1 , wherein
said master image data expresses a digital bit-mapped image, and
said second display magnification is a magnification value for enlarging said digital bit-mapped image to integral times.
7. The defect detector according to claim 1 , wherein
a single display included in said image display system simultaneously displays said inspected image data and said master image data by said first display control element and said second display control element respectively.
8. The defect detector according to claim 1 , further comprising a switching element making said single display included in said image display system display said inspected image data and said master image data by said first display control element and said second display control element in a switching manner.
9. The defect detector according to claim 1 , wherein
said image display system comprises:
a first display displaying said inspected image data under control of said first display control element, and
a second display displaying said master image data under control of said second display control element.
10. A defect detecting method of defecting a defect on an inspected object, comprising:
a holding step of holding said inspected object;
an image acquisition step of imaging said inspected object held in said holding step and acquiring inspected image data obtained by imaging a defective area of said inspected object having a defect;
a first display step of displaying said inspected image data acquired in said image acquisition step on an image display system at a first display magnification; and
a second display step of displaying master image data to be compared with said defective area on the image display system at a second display magnification substantially the same as said first display magnification.
11. The defect detection method according to claim 10 , further comprising:
a size acquisition step of acquiring information indicating the size of said defective area as to said inspected object held in said holding step, and
a display magnification operation step of operating said first display magnification according to a prescribed algorithm on the basis of said information indicating the size of said defective area acquired in said size acquisition step.
12. The defect detection method according to claim 10 , further comprising an operation step of accepting input information from an operator,
for carrying out said second display step every time said first display magnification is set on the basis of said input information.
13. The defect detection method according to claim 10 , further comprising an imaging magnification decision step of deciding an imaging magnification for imaging said inspected object according to a prescribed algorithm in response to said first display magnification.
14. The defect detection method according to claim 10 , further comprising:
a position acquisition step of acquiring information indicating the position of said defective area as to said inspected object held in said holding step, and
a positioning step of deciding relative positions of said inspected object held in said holding step and an imaging element imaging said inspected object in response to said information indicating the position of said defective area acquired in said position acquisition step.
15. The defect detection method according to claim 10 , wherein
said master image data expresses a digital bit-mapped image, and
said second display magnification is operated as a magnification value for enlarging said digital bit-mapped image to integral times in said second display step.