Method and system for noise control in semiconductor spectroscopy system
View Patent ↗An optical power control system for a semiconductor source spectroscopy system controls power fluctuations in the tunable signal from the spectroscopy system and thus improves the noise performance of the system. This general solution has advantages relative to other systems that simply detect reference power levels during the scan and then correct the detected signal after interaction with the sample by reducing the requirements for coordinating the operation of the sample detectors and power or reference detectors. The spectroscopy system comprises a semiconductor source and a tunable filter. The combination of the semiconductor source and tunable signal illuminate a sample with a tunable signal, being tunable over a scan band. The power control system comprises an amplitude detector system for detecting the power of the tunable optical signal and power control system for regulating the amplitude of the tunable optical signal in response to its detected power.
1. An optical power control system for a semiconductor source spectroscopy system in which the spectroscopy system comprises a semiconductor source and tunable filter for illuminating a sample with a tunable optical signal, which is tunable over a scan band, and a detector for detecting a sample signal generated by interaction of the tunable optical signal with the sample, the optical power control system comprising:
an amplitude detector system for detecting an amplitude of the tunable optical signal;
a power control system for regulating the amplitude of the tunable optical signal in response to the detected amplitude; and
a frequency reference system for detecting a frequency of the tunable optical signal, wherein the frequency reference system comprises a frequency reference detector for detecting the tunable optical signal; a tap for directing a portion of the tunable optical signal to the frequency reference detector; and an optical reference for filtering the tunable optical signal prior to being detected by the frequency reference detector.
2. An optical power control system as claimed in claim 1 , wherein the semiconductor source comprises a light emitting diode generating a broadband signal, which is converted to the tunable optical signal by the tunable filter.
3. An optical power control system as claimed in claim 1 , wherein the semiconductor source comprises a superluminescent light emitting diode generating a broadband optical signal, which is converted to the tunable optical signal by the tunable filter.
4. An optical power control system as claimed in claim 1 , wherein the semiconductor source spectroscopy system further comprises a gain fiber, which is optically pumped by at least one diode laser.
5. An optical power control system as claimed in claim 1 , wherein the semiconductor source spectroscopy system further comprises a gain fiber, which is optically pumped by at least one semiconductor diode laser.
6. An optical power control system as claimed in claim 1 , wherein the semiconductor source spectroscopy system further comprises a laser cavity, and the semiconductor source is a semiconductor optical amplifier that is located within the laser cavity, and the tunable filter is located within the laser cavity.
7. An optical power control system as claimed in claim 6 , wherein the laser cavity is a linear cavity.
8. An optical power control system as claimed in claim 6 , wherein the laser cavity is a ring cavity.
9. An optical power control system as claimed in claim 1 , wherein the tunable filter is a microelectromechanical system filter.
10. An optical power control system as claimed in claim 1 , wherein the tunable filter is a microelectromechanical filter comprising thin film coating mirror structures.
11. An optical power control system as claimed in claim 1 , wherein the amplitude detector system comprises a detector; and a tap providing a portion of the tunable optical signal to the detector.
12. An optical power control system as claimed in claim 1 , wherein semiconductor source spectroscopy system comprises an optical bench, to which the semiconductor source and the tunable filter are attached.
13. An optical power control system as claimed in claim 12 , wherein the amplitude detector system comprises:
a detector, which is attached to the bench; and
a tap, which is attached to the bench, providing a portion of the tunable optical signal to the detector.
14. An optical power control system as claimed in claim 1 , wherein the power control system regulates the amplitude of the tunable optical signal by controlling power to the semiconductor source.
15. An optical power control system as claimed in claim 1 , wherein the power control system stabilizes the amplitude of the tunable optical signal by controlling power to the semiconductor source.
16. An optical power control system as claimed in claim 1 , wherein the power control system comprises an optical signal power regulator for regulating the amplitude of the tunable optical signal.
17. An optical power control system as claimed in claim 1 , wherein the power control system comprises an optical signal attenuator for regulating the amplitude of the tunable optical signal by attenuating the tunable optical signal in response to the amplitude detector system.