Control of delay line interferometer
View Patent ↗The delay setting of an optical delay line interferometer (DLI) used to decode differentially encoded phase shift keyed signals (DPSK or DQPSK) is controlled using a control signal representative of the ratio P err2 /P err1 of the rate of occurrence of double errors and the rate of occurrence of errors. The ratio P err2 /P err1 , as the delay setting of the DLI is varied, exhibits a characteristic W-shaped structure consisting of a local maximum at the optimum value and two minima adjacent to the maximum, one on each side of it. This structure is present over a wide range of signal to noise ratio and residual dispersion.
1. A method of controlling the delay setting of an optical delay line interferometer used to decode differentially encoded phase shift keyed signals, said method comprising:
determining the rate of occurrence of errors P err1 in the decoded signals;
determining the rate of occurrence of double errors P err2 in the decoded signals;
deriving a control signal representative of the ratio P err2 /P err1 of the determined rates; and
using said control signal to control said delay setting.
2. The method of claim 1 , wherein said differentially encoded phase shift keyed signals are DPSK signals, said errors are single bit errors and said double errors are errors in two consecutive bits.
3. The method of claim 2 , wherein said decoding of said DPSK signals provides optical duobinary signals for transmission.
4. The method of claim 1 , wherein said differentially encoded phase shift keyed signals are DQPSK signals, said errors are errors in symbols and said double errors are errors in two consecutive symbols.
5. The method of claim 1 , wherein said differentially encoded phase shift keyed signals carry data encoded with an error correcting code to enable error correction, wherein said determining the rates of occurrence of errors and of double errors includes detecting said errors in the course of said error correction.
6. The method of claim 1 , wherein said using said control signal includes scanning the delay of said delay line interferometer and locating a structure in said control signal consisting of a local maximum with two adjacent minima, one each side of said maximum.
7. Apparatus for controlling the delay setting of an optical delay line interferometer used to decode differentially encoded phase shift keyed signals, said apparatus comprising:
means for determining the rate of occurrence of errors P err1 in the decoded signals;
means for determining the rate of occurrence of double errors P err2 in the decoded signals;
means for deriving a control signal representative of the ratio P err2 /P err1 of the determined rates; and
means for using said control signal to control said delay setting.
8. The apparatus of claim 7 , wherein said differentially encoded phase shift keyed signals are DPSK signals, said errors are single bit errors and said double errors are errors in two consecutive bits.
9. The apparatus of claim 8 , wherein said decoding of said DPSK signals provides optical duobinary signals for transmission.
10. The apparatus of claim 7 , wherein said differentially encoded phase shift keyed signals are DQPSK signals, said errors are errors in symbols and said double errors are errors in two consecutive symbols.
11. The apparatus of claim 7 , wherein said differentially encoded phase shift keyed signals carry data encoded with an error correcting code to enable error correction, wherein said determining the rates of occurrence of errors and of double errors includes detecting said errors in the course of said error correction.
12. The apparatus of claim 7 , wherein said means for using said control signal comprises means for scanning the delay of said delay line interferometer and locating a structure in said control signal consisting of a local maximum with two adjacent minima, one each side of said maximum.