Method and system for spectral stitching of tunable semiconductor sources
View Patent ↗A multi semiconductor source tunable spectroscopy system has two or more semiconductor sources for generating tunable optical signals that are tunable over different spectral bands. The system enables the combination of these tunable signals to form an output signal that is tunable over a combined band including these individual spectral bands of the separate semiconductor sources. The system further compensates for spectral roll-off associated with the semiconductor sources. Specifically, near the limits of the semiconductor sources' spectral bands, the power in the tunable signal tends to degrade or decrease. The system compensates for this roll-off using drive current control, attenuators, or electronic compensation.
1. A multi semiconductor source tunable spectroscopy system, comprising:
at least two semiconductor sources for generating tunable optical signals being tunable over different spectral bands and being combined into an output signal that is tunable over a combined scan band produced from the different spectral bands of the at least two semiconductor sources; and
a control system that compensates for spectral roll-off of the at least two semiconductor sources over the combined scan band provided by a combination of the at least two semiconductor sources, wherein the control system increases drive currents to each of the at least two semiconductor sources when wavelengths of the tunable optical signals approach limits of the spectral bands of the at least two semiconductor sources.
2. A system as claimed in claim 1 , wherein the control system comprises at least one optical signal regulator for controlling an amplitude of the output signal over the combined scan band of the system.
3. A system as claimed in claim 1 , wherein the control system comprises at least one source drive current circuit for controlling an amplitude of the output signal over the combined scan band of the system by regulating drive currents to the at least two semiconductor sources.
4. A system as claimed in claim 1 , wherein the control system comprises:
an output signal detector for detecting the output signal before interaction with a sample; and
a controller that corrects a sample signal, which is produced by interaction of the output signal with the sample, in response to spectral roll-off detected by the output signal detector.
5. A system as claimed in claim 1 , wherein the semiconductor sources are light emitting diodes generating broadband signals, which are converted to the tunable optical signals by at least one tunable filter.
6. A system as claimed in claim 5 , wherein light emitting diodes and tunable filters are affixed to at least one optical bench.
7. A system as claimed in claim 5 , wherein the at least one tunable filter is a Fabry-Perot tunable filter.
8. A system as claimed in claim 1 , wherein the semiconductor sources include superluminescent light emitting diodes generating broadband optical signals, which are converted to the tunable optical signals by at least one tunable filter.
9. A system as claimed in claim 8 , wherein superluminescent light emitting diodes and tunable filters are affixed to at least one optical bench.
10. A system as claimed in claim 8 , wherein the at least one tunable filter is a Fabry-Perot tunable filter.
11. A system as claimed in claim 1 , wherein the semiconductor sources are lasers comprising:
laser cavities;
semiconductor optical amplifiers that are located within the laser cavities, and tunable filters that are located within the laser cavities.
12. A system as claimed in claim 11 , wherein semiconductor optical amplifiers and tunable filters are affixed to at least one optical bench.
13. A system as claimed in claim 12 , wherein the laser cavities are linear cavities.
14. A system as claimed in claim 12 , wherein the laser cavities are ring cavities.
15. A system as claimed in claim 12 , wherein the tunable filters are microelectromechanical Fabry-Perot tunable filters.
16. A system as claimed in claim 1 , wherein the control system controls a drive current to the at least two semiconductor sources as a function of a wavelength of the tunable optical signals.
17. A system as claimed in claim 1 , wherein the control system increases drive currents to each of the at least two semiconductor sources when wavelengths of the tunable optical signals approach limits the spectral bands of the at least two semiconductor sources to stabilize a power of the tunable optical signals over the combined scan band.