Sub-millimeter wave frequency heterodyne detector system
View Patent ↗The present invention relates to sub-millimeter wave frequency heterodyne imaging systems. More specifically, the present invention relates to a sub-millimeter wave frequency heterodyne detector system for imaging the magnitude and phase of transmitted power through or reflected power off of mechanically scanned samples at sub-millimeter wave frequencies.
1. A method of evaluating the characteristics of a sample comprising the steps of:
generating a submillimeter wave frequency optical radiation signal beam;
generating a submillimeter wave frequency optical radiation reference beam, said reference beam having a frequency different from the signal beam;
splitting the signal beam into first and second portions and directing the first portion of the beam to interact with the sample;
splitting the reference beam into first and second portions;
mixing the first portion of the signal beam that has interacted with the sample with the first potion of the reference beam to create a measurement intermediate frequency signal;
mixing the second portion of the signal beam and the second portion of the reference beam to create a reference intermediate frequency signal; and
processing the measurement and reference intermediate frequency signals in order to evaluate the sample based on changes to the signal beam induced by the interaction with the sample.
2. A method as recited in claim 1 wherein said processing step includes determining the relative phase difference between the measurement and reference intermediate frequency signals.
3. A method as recited in claim 1 wherein said processing step includes deriving vector magnitude and phase data from the measurement and reference intermediate frequency signals.
4. A method as recited in claim 3 wherein said processing step includes feeding the measurement and reference intermediate frequency signals into a lock-in amplifier.
5. A method as recited in claim 4 wherein said processing step includes passing the reference intermediate frequency signal through a tracking filter prior to being fed into the lock-in amplifier.
6. A method as recited in claim 3 further including the step of laterally scanning the first portion of the signal beam with respect to the sample to generate two-dimensional image information.
7. A method as recited in claim 6 further including displaying the two dimensional image information.
8. A method as recited in claim 7 wherein the displayed image information is relative power as a function of scan position.
9. A method as recited in claim 3 wherein said signal and reference beams are generated by optically pumped far infrared lasers.
10. A method as recited in claim 3 wherein said signal and reference beams are generated by quantum cascade lasers.
11. A method as recited in claim 3 wherein the signal beam interacts with the sample through transmission.
12. A method as recited in claim 3 wherein said signal beam interacts with the sample by reflection.
13. A system for evaluating a sample comprising:
a first submillimeter wave frequency generator for generating a signal beam of optical radiation;
a second submillimeter wave frequency generator for generating a reference beam of optical radiation, said reference beam having a frequency different from the signal beam;
a first beam splitter for dividing the signal beam into first and second portions and directing the first portion of the beam to interact with the sample;
a second beam splitter for dividing the reference beam into first and second portions;
a first mixer for mixing the first portion of the signal beam after interaction with the sample with the first potion of the reference beam to create a measurement intermediate frequency signal;
a second mixer for mixing the second portion of the signal beam and the second portion of the reference beam to create a reference intermediate frequency signal; and
processing means using the measurement and reference intermediate frequency signals in order to evaluate the sample based on changes to the signal beam induced by the interaction with the sample.
14. A system as recited in claim 13 wherein said processing means functions to determine the relative phase difference between the measurement and reference intermediate frequency signals.
15. A system as recited in claim 13 wherein said processing means functions to derive vector magnitude and phase data from the measurement and reference intermediate frequency signals.
16. A system as recited in claim 15 wherein said processing means includes a lock-in amplifier.
17. A system as recited in claim 16 wherein said processing means includes a tracking filter for receiving the measurement and reference intermediate frequency signals and feeding those signals to the lock-in amplifier.
18. A system as recited in claim 15 further including a means for laterally scanning the first portion of the signal beam with respect to the sample to generate two-dimensional image information.
19. A system as recited in claim 18 further including display for displaying the two dimensional image information.
20. A system as recited in claim 19 wherein the displayed image information is relative power as a function of scan position.
21. A system as recited in claim 15 wherein said submillimeter wave frequency generators are optically pumped far infrared lasers.
22. A system as recited in claim 15 wherein said submillimeter wave frequency generators are quantum cascade lasers.