IP Library Granted Patent US 7,339,813
Granted Patent B2
US 7,339,813 · App. 10/957,298 · Granted Mar 4, 2008

Complementary output resistive memory cell

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,339,813
App. No.
10/957,298
Granted
Mar 4, 2008
Kind
B2
Abstract

A complementary resistive memory structure is provided comprising a common source electrode and a first electrode separated from the common source electrode by resistive memory material; and a second electrode adjacent to the first electrode and separated from the common source electrode by resistive memory material, along with accompanying circuitry and methods of programming and reading the complementary resistive memory structure.

Claims (15)

1. A memory structure comprising:

a first memory resistor connected between a first voltage source and a first active transistor at a first active transistor source; a first load transistor connected between a drain voltage and the first active transistor at a first active transistor drain; and a first output connected at the first active transistor drain;

a second memory resistor connected between a second voltage source and a second active transistor at a second active transistor source; a second load transistor connected between the drain voltage and the second active transistor at a second active transistor drain; and a second output connected at the second active transistor drain; and

a word line connected to a gate of the first active transistor and to a gate of the second active transistor

wherein, with one of the first memory resistor and second memory resistor set to a high resistance and the other of the first memory resistor and second memory resistor set to a low resistance, the output connected to one of the memory resistors is high and the output connected to the other of the memory resistors is low.

2. The memory structure of claim 1 , wherein the first memory resistor comprises a colossal magnetoresistance (CMR) material.

3. The memory structure of claim 1 , wherein the first memory resistor comprises Pr 1-x Ca x MnO 3 (PCMO).

4. The memory structure of claim 1 , wherein the first memory resistor comprises Gd 1-x Ca x BaCo 2 O 5+5 .

5. A method of programming a complementary resistive memory structure having a common electrode separated from a first electrode in a first active transistor and a second electrode in a second active transistor by a resistive memory material comprising:

grounding the first electrode in the first active transistor;

allowing the common electrode to float; and

applying a programming pulse to the second electrode in the second active transistor.

6. The method of claim 5 , wherein the programming pulse is a positive pulse.

7. The method of claim 5 , wherein the programming pulse is a negative pulse.

8. The method of claim 5 , wherein the programming pulse is applied through the second active transistor connected to the second electrode, wherein the second active transistor has a gate and wherein the programming pulse is applied to the gate of the second active transistor.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 16, 2013
From: INTELLECTUAL PROPERTIES I KFT.
To: XENOGENIC DEVELOPMENT LIMITED LIABILITY COMPANY
Reel/Frame 029638/0239 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 8, 2013
From: SHARP KABUSHIKI KAISHA
To: INTELLECTUAL PROPERTIES I KFT.
Reel/Frame 029586/0108 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 27, 2008
From: SHARP LABORATORIES OF AMERICA INC.
To: SHARP KABUSHIKI KAISHA
Reel/Frame 020995/0459 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 30, 2004
From: HSU, SHENG TENG
To: SHARP LABORATORIES OF AMERICA, INC.
Reel/Frame 015868/0987 →