IP Library Granted Patent US 7,172,340
Granted Patent B2
US 7,172,340 · App. 10/958,391 · Granted Feb 6, 2007

X-ray imaging apparatus and method for moving X-ray detector

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,172,340
App. No.
10/958,391
Granted
Feb 6, 2007
Kind
B2
Abstract

An X-ray imaging apparatus includes an X-ray irradiating unit configured to irradiate an X-ray to an object, an X-ray detecting unit configured to detect the irradiated X-ray, an image creating unit configured to create X-ray image data based on data detected by the X-ray detecting unit, a moving mechanism configured to move the X-ray detecting unit to the object, a capacitance sensing unit, including an electrode which is positioned so as to cover at least part of a detection plane of the X-ray detecting unit, configured to obtain a capacitance value of the X-ray detecting unit by the electrode and a distance measurement unit configured to measure a distance between the object and the X-ray detecting unit based on the capacitance value.

Claims (90)

1. An X-ray imaging apparatus, comprising:

an X-ray irradiating unit configured to irradiate an X-ray to an object;

an X-ray detecting unit configured to detect the irradiated X-ray;

an image creating unit configured to create X-ray image data based on data detected by the X-ray detecting unit;

a moving mechanism configured to move the X-ray detecting unit to the object;

a capacitance sensing unit, including an electrode which is positioned so as to cover at least part of a detection plane of the X-ray detecting unit, configured to obtain a capacitance value of the X-ray detecting unit by the electrode;

an adjustment unit configured to correct the capacitance value based on a selection of a correction coefficient from a plurality of correction coefficients related to object information; and

a distance measurement unit configured to measure a distance between the object and the X-ray detecting unit based on the corrected capacitance value.

2. The X-ray imaging apparatus according to claim 1 , wherein the electrode covers a whole area of the detection plane of the X-ray detecting unit.

3. The X-ray imaging apparatus according to claim 1 , wherein the electrode is a carbon sheet.

4. The X-ray imaging apparatus according to claim 3 , wherein the X-ray detecting unit including a flat panel detector where a plurality of X-ray detection elements are arranged two dimensionally.

5. The X-ray imaging apparatus according to claim 4 , wherein the electrode is divided into quadrants aligned with an X-ray detection plane of the X-ray detection elements.

6. The X-ray imaging apparatus according to claim 1 , wherein the electrode is divided to a plurality of electrodes, and the capacitance sensing unit obtains capacitance values of the plurality of electrodes.

7. The X-ray imaging apparatus according to claim 6 , wherein the electrode is divided to four electrodes.

8. The X-ray imaging apparatus according to claim 1 ,

wherein the corrected capacitance is additionally based on environmental data regarding a temperature and a humidity around the object.

9. The X-ray imaging apparatus according to claim 1 , wherein the moving mechanism stops the X-ray detecting unit based on the measured distance before the X-ray detecting unit contacts the object.

10. The X-ray imaging apparatus according to claim 1 , wherein the moving mechanism changes a moving speed of the X-ray detecting unit based on the measured distance.

11. An X-ray imaging apparatus, comprising:

an X-ray irradiating unit configured to irradiate an X-ray to an object;

an X-ray detecting unit configured to detect the irradiated X-ray;

an image creating unit configured to create X-ray image data based on data detected by the X-ray detecting unit;

a moving mechanism configured to move the X-ray detecting unit to the object;

a capacitance sensing unit including an electrode and configured to obtain a capacitance value of the X-ray detecting unit by the electrode;

an environment sensing unit configured to obtain environment information around the object;

a capacitance correction unit configured to correct the capacitance value based on the environment information and based on a selection of a correction coefficient from a plurality of correction coefficients related to object information; and

a distance measurement unit configured to measure a distance between the object and the X-ray detecting unit based on the corrected capacitance value.

12. An X-ray imaging apparatus, comprising:

an X-ray irradiating unit configured to irradiate an X-ray to an object;

an X-ray detecting unit configured to detect the irradiated X-ray;

an image creating unit configured to create X-ray image data based on data detected by the X-ray detecting unit;

a moving mechanism configured to move the X-ray detecting unit to the object;

a capacitance sensing unit including an electrode and configured to obtain a capacitance value of the X-ray detecting unit by the electrode;

an input device configured to input information of the object;

a capacitance correction unit configured to correct the capacitance value based on the object information and based on a selection of a correction coefficient from a plurality of correction coefficients related to object information; and

a distance measurement unit configured to measure a distance between the object and the X-ray detecting unit based on the corrected capacitance value.

13. An X-ray imaging apparatus, comprising:

an X-ray irradiating unit configured to irradiate an X-ray to an object;

an X-ray detecting unit configured to detect the irradiated X-ray;

an image creating unit configured to create X-ray image data based on data detected by the X-ray detecting unit;

a moving mechanism configured to move the X-ray detecting unit to the object;

a capacitance sensing unit including an electrode and configured to obtain a capacitance value of the X-ray detecting unit by the electrode;

an input device configured to input information of the object;

a capacitance correction unit configured to correct the capacitance value based on the object information; and

a distance measurement unit configured to measure a distance between the object and the X-ray detecting unit based on the corrected capacitance value

wherein the object information includes at least one of shape, age, sex and degree of obesity of the object.

14. An X-ray imaging apparatus, comprising:

an X-ray irradiating unit configured to irradiate an X-ray to an object;

an X-ray detecting unit configured to detect the irradiated X-ray;

an image creating unit configured to create X-ray image data based on data detected by the X-ray detecting unit;

a moving mechanism configured to move the X-ray detecting unit to the object;

a capacitance sensing unit including an electrode and configured to measure a capacitance value between the electrode and the object;

an input device configured to input information of the object;

a capacitance correction unit configured to correct the measured capacitance value based on the object information; and

a distance measurement unit configured to measure a distance between the object and the X-ray detecting unit based on the corrected capacitance value.

15. A method for moving an X-ray detector, comprising:

irradiating an X-ray to an object by an X-ray irradiating unit;

detecting the irradiated X-ray by an X-ray detecting unit;

creating X-ray image data based on data detected in the detecting;

moving the X-ray detecting unit to the object;

obtaining a capacitance value of the X-ray detecting unit by an electrode which is positioned so as to cover at least part of a detection plane of the X-ray detecting unit;

correcting the capacitance value based on a selection of a correction coefficient from a plurality of correction coefficients related to object information; and

measuring a distance between the object and the X-ray detecting unit based on the corrected capacitance value.

16. A method for moving an X-ray detector, comprising:

irradiating an X-ray to an object by an X-ray irradiating unit;

detecting the irradiated X-ray by an X-ray detecting unit;

creating X-ray image data based on data detected by the X-ray detecting unit;

moving the X-ray detecting unit to the object;

obtaining a capacitance value of the X-ray detecting unit;

obtaining environment information around the object;

correcting the capacitance value based on the environment information and based on a selection of a correction coefficient from a plurality of correction coefficients related to object information; and

measuring a distance between the object and the X-ray detecting unit based on the corrected capacitance value.

17. A method for moving an X-ray detector, comprising:

irradiating an X-ray to an object by an X-ray irradiating unit;

detecting the irradiated X-ray by an X-ray detecting unit;

creating X-ray image data based on data detected by the X-ray detecting unit;

moving the X-ray detecting unit to the object;

obtaining a capacitance value of the X-ray detecting unit;

inputting information of the object;

correcting the capacitance value based on the object information and based on a selection of a correction coefficient from a plurality of correction coefficients related to object information; and

measuring a distance between the object and the X-ray detecting unit based on the corrected capacitance value.

18. A method for moving an X-ray detector, comprising:

irradiating an X-ray to an object by an X-ray irradiating unit;

detecting the irradiated X-ray by an X-ray detecting unit;

creating X-ray image data based on data detected by the X-ray detecting unit;

moving the X-ray detecting unit to the object;

measuring a capacitance value between an electrode of the X-ray detecting unit and the object;

inputting information of the object;

correcting the capacitance value based on the object information; and

measuring a distance between the object and the X-ray detecting unit based on the corrected capacitance value.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 31, 2016
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 038891/0693 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 8, 2005
From: OOTA, SATOSHI
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 016250/0871 →