Built-in self-test system and method for an integrated circuit
View Patent ↗An integrated circuit comprises random logic communicatively coupled to a non-scannable memory array. The integrated circuit also comprises a built-in self-test (BIST) controller adapted to apply test data to the random logic and propagate the test data through the random logic to test the memory array.
1. An integrated circuit, comprising:
random logic communicatively coupled to a non-scannable memory array; and
a logic built-in self-test (BIST) controller that applies test data to the random logic, the logic BIST controller to:
propagate test data through the random logic during subsequent clock cycles, the propagation of test data including read operations to a storage element of the non-scannable memory array, wherein in response to a read to an invalid storage element, an address of a valid storage element is aliased or a predetermined fixed value is provided to output as valid data, and
output of the test data from the random logic, wherein the outputted test data includes the valid data if the read to the invalid storage element is performed, and
the outputted test data is compared to an expected result to test the non-scannable memory array.
2. The integrated circuit of claim 1 , wherein the non-scalable memory array is initialized before testing the non-scalable memory array via the propagated test data.
3. The integrated circuit of claim 1 , wherein the random logic is used to initialize the non-scalable memory array.
4. The integrated circuit of claims 1 , wherein the logic BIST controller causes output of the test data from the random logic to a multiple-input signature register (MISR).
5. The integrated circuit of claim 1 , wherein responsive to a read address and a write address being the same for a particular clock cycle, the logic BIST controller is to provide data presented for the write address as output from the same address, provide a fixed value as output from the same address, or invert read or write address signals.
6. The integrated circuit of claim 1 , wherein responsive to an existence of two or more write ports in the non-scannable memory array during the propagation of test data, the logic BIST controller prioritizes each write port relative to other write ports.
7. An integrated circuit, comprising:
means for communicatively coupling a non-scannable memory array to a random logic; and
means for applying test data to the random logic and propagating the test data through the random logic during subsequent clock cycles, the propagation of test data including read and write operations to a storage element of the non-scannable memory array, wherein in response to a read to an invalid storage element, an address of a valid storage element is aliased or a predetermined fixed value is provided to output as valid data,
the means for applying and propagating the test data further outputting the test data from the random logic, wherein the outputted test data includes the valid data if the read to the invalid storage element is performed, and the outputted test data is compared to an expected value to test the means for communicatively coupling the non-scannable memory array to the random logic.
8. The integrated circuit of claim 7 , further comprising means for initializing the non-scalable memory array.
9. The integrated circuit of claim 7 , comprising means for providing data presented for the write address as output from the same address, providing a fixed value as output from the same address, or inverting read or write address signals responsive to a read address and write address being the same for a particular clock cycle, providing.
10. The integrated circuit of claim 7 , comprising means for prioritizing each write port relative to other write ports responsive to an existence of two or more write ports in the non-scannable memory array during the propagation of test data, providing.
11. A test method for an integrated circuit, comprising:
loading test data into random logic of the integrated circuit;
propagating, with a logic built-in test (BIST) controller, the test data through the random logic during subsequent clock cycles, the propagation of test data including read and write operations to a storage element of the non-scannable memory array, wherein in response to a read to an invalid storage element, an address of a valid storage element is aliased or a predetermined fixed value is provided to output as valid data;
outputting the test data from the random logic, wherein the outputted test data includes the valid data if the read to the invalid storage element is performed; and
comparing the outputted test data to an expected value to test the non-scannable memory array of the integrated circuit.
12. The method of claim 11 , further comprising initializing the non-scannable memory array.
13. The method of claim 11 , further comprising outputting the test data from the random logic to a multiple-input signature register (MISR).
14. The method of claim 11 , further comprising initializing the memory array using data from the random logic.
15. The test method of claim 11 , wherein responsive to a read address and write address being the same for a particular clock cycle, providing data presented for the write address as output from the same address, providing a fixed value as output from the same address, or inverting read or write address signals.
16. The test method of claim 11 , wherein responsive to an existence of two or more write ports in the non-scannable memory array during the propagation of test data, prioritizing each write port relative to other write ports.
17. An integrated circuit, comprising:
random logic communicatively coupled to a non-scannable memory array; and
a logic built-in self-test (BIST) controller to apply test data to the random logic to test the random logic, wherein the test data is written to the non-scannable memory array and read from the non-scannable memory array, and in response to a read to an invalid storage element, an address of a valid storage element is aliased or a predetermined fixed value is provided in the test data read from the non-scannable memory,
wherein the test data read from the non-scannable memory array is compared to an expected value to detect whether a defect is present in the non-scannable memory array.
18. The integrated circuit of claim 17 , wherein the logic BIST controller propagates the test data through the random logic causing the test data to be written to and read from the non-scannable memory array.
19. The integrated circuit of claim 17 , wherein the logic BIST controller causes output of the test data from the random logic to a multiple-input signature register (MISR).
20. The integrated circuit of claim 17 , wherein data from the random logic is used to initialize the non-scannable memory array.