Effect-particle orientation and apparatus therefor
View Patent ↗A method and apparatus for determining the effect-particle orientation in a film or coating are disclosed. The method comprises using opposing directional reflectance measurements, preferably in continuous processes and allows for an on-line evaluation system to provide more specific control over particle orientation, thereby allowing for better color matching between and among various panels or articles.
1. An apparatus comprising a reflectance head, a plurality of apertures, light sources, and light detectors wherein
the reflectance head comprises a body and a plurality of apertures and the body defines a reflectance zone;
the light source comprises at least a first light source and a second light source wherein the first light source and the second light source are in opposing positions positioned at substantially the same illumination angle;
the light detector comprises at least a first light detector and a second light detector; and
the first light source and the second light detector are located in different planes.
2. The apparatus of claim 1 further comprising at least a first light detector and a second light detector inserted in the apertures.
3. The apparatus of claim 1 further comprising a means for interpreting received light, which is in communication with the first light detector and the second light detector, from the first light detector and the second light detector for calculating a light reflectance factor and the reflectance zone has a concave configuration.
4. The apparatus of claim 3 wherein the reflectance zone has a concave configuration.
5. An apparatus comprising
a reflectance head comprising a body that defines a reflectance zone and a plurality of apertures;
at least a first light source and a second light source in opposing positions and at least a first light detector and a second light detector inserted into the reflectance head apertures, wherein the light sources correspond to opposing light detectors; the first light source and the second light detector are in different planes; and
a means for interpreting received light, which is in communication with the light detectors, from the at least first and second light detectors for calculating a light reflectance factor.
6. The apparatus of claim 5 wherein the reflectance head comprises a tetrafluoroethylene fluorocarbon polymer.
7. The apparatus according to claim 6 , wherein the at least first and second light sources are positioned at different illumination angles relative to the surface of the effect-particle-containing material.
8. The apparatus of claim 7 wherein the reflectance zone has a concave configuration.
9. The apparatus according to claim 5 , wherein the at least first and second light sources are positioned at the same illumination angle relative to the surface of the effect-particle-containing material.
10. A process for measuring effect-particle orientation in a continuous process comprising
(a) illuminating a surface of an effect-particle-containing material using incident beams of light in opposing directions over substantially the same given area wherein the incident beams of light are emitted in both upstream direction and downstream direction of an apparatus which comprises a reflectance head, a plurality of apertures, a first light detector, and a second light detector;
(b) measuring incident light reflectance from the effect-particle-containing material in opposing directions;
(c) determining a first absolute value of a difference between the opposing reflectance measurements at corresponding angles to obtain a first absolute value;
(d) comparing the first absolute value to a second absolute value obtained from a known standard; and optionally
(e) manipulating the effect-particle orientation to minimize, maximize or otherwise adjust the difference between the first and second absolute values.
11. The process according to claim 10 comprising the manipulating step.
12. The process of claim 11 wherein the measuring is conducted continuously or intermittently.
13. The process of claim 11 wherein the measuring is conducted intermittently.
14. The process of claim 13 wherein the effect-particle comprising a surface which comprises a material illuminated with a non-visible light.
15. The process of claim 14 wherein the light is near-infrared radiation.
16. The process of claim 15 wherein the light has a wavelength of about 940 nm.
17. The process of claim 16 wherein illumination of the surface of the effect-particle-containing material using incident beams of light occurs in opposing machine directions.
18. The process of claim 17 wherein the effect-particle-containing material comprises paint, film, coating, coated article, or polymer.
19. The process of claim 10 wherein the measuring is conducted continuously or intermittently.
20. The process of claim 10 wherein the measuring is conducted continuously.
21. The process of claim 20 wherein the effect-particle comprises a surface which comprises a material illuminated with a non-visible light.
22. The process of claim 21 wherein the light is near-infrared radiation.
23. The process of claim 10 wherein illumination of the surface of the effect-particle-containing material using incident beams of light occurs in opposing machine directions.